BGU7008 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2017. All rights reserved.
Product data sheet Rev. 4 — 18 January 2017 14 of 19
NXP Semiconductors
BGU7008
SiGe:C LNA MMIC for GPS, GLONASS, Galileo and Compass
9. Test information
9.1 Quality information
All qualification tests are performed according AEC-Q100 except for read point testing
(final test of qualification sample). Which is done only at room temperature.
As part of the zero defect program, the following is part of the industrial test flow:
• Part Average Testing
• Maverick Lot Handling at assembly factory
V
CC
= 1.8 V; P
i
= 45 dBm.
(1) T
amb
= 40 C
(2) T
amb
= +25 C
(3) T
amb
= +85 C
(4) T
amb
= +125 C
T
amb
= 25 C; P
i
= 45 dBm.
(1) V
CC
= 1.5 V
(2) V
CC
= 1.8 V
(3) V
CC
= 2.85 V
Fig 30. Rollett stability factor as a function of
frequency; typical values
Fig 31. Rollett stability factor as a function of
frequency; typical values
.
.
