OMO ElectronicOMO Electronic
Expand menu
Hello, Sign inMy Account
0 Cart

IS62C5128BL-45TLI

P1-P3P4-P6P7-P9P10-P12P13-P14
IS62C5128BL, IS65C5128BL 
4 Integrated Silicon Solution, Inc. — www.issi.com
Rev.  B
06/28/2011
OPERATING RANGE
  Range  Ambient Temperature  VDD Speed (ns)
Commercial 0°C to +70°C 5V ± 10% 45
Industrial -40°C to +85°C 5V ± 10% 45
  Automotive -40°C to +125°C 5V ± 10% 45
POWER SUPPLY CHARACTERISTICS
(1)
 (Over Operating Range)
                         -45 ns                         
  Symbol Parameter  Test Conditions    Min.  Max.    Unit
iCC Average operating CE = Vil, Vdd = Max. Com. — 10 mA
Current i out= 0 mA, f= 0 Ind. — 10
Auto. — 10
iCC1 Vdd Dynamic Operating Vdd = Max., CE = Vil Com. — 15 mA
Supply Current iout = 0 mA, f = fmax Ind. — 20
Auto. — 25
typ.
(2)
10
isb1 TTL Standby Current Vdd = Max., Com. — 1 mA
(TTL Inputs) Vin = Vih or Vil, CE ≥ Vih, Ind. — 1.5
f = 0 Auto. — 2
isb2 CMOS Standby Vdd = Max., Com. — 10 mA
Current (CMOS Inputs) CE ≥ Vdd – 0.2V, Ind. — 15
Vin ≥ Vdd – 0.2V, Auto. — 35
or Vin ≤ Vss + 0.2V, f = 0 typ. 4
Note:
1. At f = f
max, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
2. Typical values are measured at V
dd = 5V, Ta = 25
o
C and not 100% tested.
Integrated Silicon Solution, Inc. — www.issi.com 5
Rev.  B
06/28/2011
IS62C5128BL, IS65C5128BL 
READ CYCLE SWITCHING CHARACTERISTICS
(1)
 (Over Operating Range)
  -45 
  Symbol  Parameter  Min.  Max.    Unit
trC Read Cycle Time 45 — ns
taa Address Access Time — 45 ns
toha Output Hold Time 3 — ns
taCe CE Access Time — 45 ns
tdoe OE Access Time — 20 ns
thzoe
(2)
OE to High-Z Output 0 15 ns
tlzoe
(2)
OE to Low-Z Output 5 — ns
thzCe
(2)
CE to High-Z Output 0 15 ns
tlzCe
(2)
CE to Low-Z Output 5 — ns
AC TEST CONDITIONS
  Parameter  Unit
  Input Pulse Level 0V to 3.0V
Input Rise and Fall Times 3 ns
Input and Output Timing 1.5V
and Reference Level
Output Load See Figures 1 and 2
1838 Ω
30 pF
Including
jig and
scope
994 Ω
OUTPUT
5V
1838 Ω
5 pF
Including
jig and
scope
994 Ω
OUTPUT
5V
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to
3.0V and output loading specified in Figure 1.
2. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
3. Not 100% tested.
Figure 1
Figure 2
AC TEST LOADS
IS62C5128BL, IS65C5128BL 
6 Integrated Silicon Solution, Inc. — www.issi.com
Rev.  B
06/28/2011
DATA VALID
READ1.eps
PREVIOUS DATA VALID
t
AA
t
OHA
t
OHA
t
RC
DOUT
ADDRESS
Notes:
1. WE is HIGH for a Read Cycle.
2. The device is continuously selected. OE, CE =
Vil.
3. Address is valid prior to or coincident with CE LOW transitions.
READ CYCLE NO. 2
(1,3)
AC WAVEFORMS
READ CYCLE NO. 1
(1,2)
P1-P3P4-P6P7-P9P10-P12P13-P14

IS62C5128BL-45TLI

Mfr. #:
Buy IS62C5128BL-45TLI
Manufacturer:
ISSI
Description:
SRAM 4Mb 45ns 5V 512K x 8 Async SRAM
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

Products related to this Datasheet