NX3P1108 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2018. All rights reserved.
Product data sheet Rev. 2 — 20 June 2018 10 of 16
NXP Semiconductors
NX3P1108
Logic controlled high-side power switch
Table 11. Measurement points
Supply voltage EN Input Output
V
I(VIN)
V
M
V
X
V
Y
0.9 V to 3.6 V 0.5 V
I
0.9 V
OH
0.1 V
OH
Test data is given in Table 12.
Definitions test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
V
EXT
= External voltage for measuring switching times.
Fig 16. Test circuit for measuring switching times
DDD
(1
9287 9,1
9
(;7
*
&
/
5
/
9
,
Table 12. Test data
Supply voltage EN Input Load
V
EXT
V
I
C
L
R
L
0.9 V to 3.6 V 3.3 V 0.1 F 500
V
I(VIN)
= 1.8 V; C
L
= 0.1 F; R
L
= 500 .V
I(VIN)
= 3.3 V; C
L
= 0.1 F; R
L
= 500 .
Fig 17. Waveform showing the enable time Fig 18. Waveform showing the enable time
29287
9
9
,(1
9
29287
9
9
,(1
9
