INDUSTRIAL TEMPERATURE RANGE
IDT74FCT377AT/CT/DT
FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE
3
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial : TA = –40°C to +85°C, VCC = 5.0V ± 5%
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
V
IH Input HIGH Level Guaranteed Logic HIGH Level 2 — — V
V
IL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V
I
IH Input HIGH Current
(4)
VCC = Max. VI = 2.7V — — ±1 µ A
I
IL Input LOW Current
(4)
VCC = Max. VI = 0.5V — — ±1 µ A
I
I Input HIGH Current
(4)
VCC = Max., VI = VCC (Max.) — — ±1 µA
V
IK Clamp Diode Voltage VCC = Min., IN = –18mA — –0.7 –1.2 V
IOS Short Circuit Current VCC = Max.
(3)
, VO = GND –60 –120 –225 mA
V
OH Output HIGH Voltage VCC = Min. IOH = –8mA 2.4 3.3 — V
VIN = VIH or VIL IOH = –12mA 2 3 —
VOL Output LOW Voltage VCC = Min. IOL = 48mA — 0.3 0.5 V
V
IN = VIH or VIL
IOFF Input/Output Power Off VCC = 0V, VIN or VO - 4.5V — — ±1 µA
Leakage
(5)
VH Input Hysteresis — — 200 — mV
I
CC Quiescent Power VCC = Max. — 0.01 1 mA
Supply Current VIN = GND or VCC
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. The test limit for this parameter is ±5µA at TA = -55°C.
5. This parameter is guaranted but not tested.