
CD214B-B320 ~ B360 Schottky Barrier Rectifier Chip Diode
Rating and Characteristic Curves
Forward Current Derating Curve
Maximum Non-Repetitive Surge Current
3.50
2.00
0.01
0.1
1.0
10
1.50
1.00
0.50
0.00
25 50 75 100 125
150 175
Average Forward Current (Amps)
Lead Temperature (°C)
Single Phase Half Wave 60 Hz
Resistive or Inductive Load
100
0.001
020
40 60 80 100 120 140
Instantaneous Reverse Current (mA)
Percent of Rated Peak Reverse Voltage (%)
10
1.0
0.1
.01
0 0.2
0.4 0.6 0.8 1.0
Instantaneous Forward Current (Amps)
Instantaneous Forward Voltage (Volts)
120
80
100
60
40
20
0
1
2510 20 50 100
Peak Forward Surge Current (Amps)
Number of Cycles at 60 Hz
Pulse Width 8.3 ms
Single Half Sine-Wave
(JEDEC Method)
1000
100
0
0.1
4.0 10.01.0 100
Capacitance (pF)
Reverse Voltage (Volts)
Ta = 25 °C
Pulsewidth: 300 µs
B350 to B360
B320 to B340
F = 1 MHz
Ta = 25 °C
Ta = 100 °C
Ta = 25 °C
Ta = 125 °C
3.50
2.00
0.01
0.1
1.0
10
1.50
1.00
0.50
0.00
25 50 75 100 125
150 175
Average Forward Current (Amps)
Lead Temperature (°C)
Single Phase Half Wave 60 Hz
Resistive or Inductive Load
100
0.001
020
40 60 80 100 120 140
Instantaneous Reverse Current (mA)
Percent of Rated Peak Reverse Voltage (%)
10
1.0
0.1
.01
0 0.2
0.4 0.6 0.8 1.0
Instantaneous Forward Current (Amps)
Instantaneous Forward Voltage (Volts)
120
80
100
60
40
20
0
1
2510 20 50 100
Peak Forward Surge Current (Amps)
Number of Cycles at 60 Hz
Pulse Width 8.3 ms
Single Half Sine-Wave
(JEDEC Method)
1000
100
0
0.1
4.0 10.01.0 100
Capacitance (pF)
Reverse Voltage (Volts)
Ta = 25 °C
Pulsewidth: 300 µs
B350 to B360
B320 to B340
F = 1 MHz
Ta = 25 °C
Ta = 100 °C
Ta = 25 °C
Ta = 125 °C
Typical Forward Characteristics
Typical Junction Capacitance
3.50
2.00
0.01
0.1
1.0
10
1.50
1.00
0.50
0.00
25 50 75 100 125
150 175
Average Forward Current (Amps)
Lead Temperature (°C)
Single Phase Half Wave 60 Hz
Resistive or Inductive Load
100
0.001
020
40 60 80 100 120 140
Instantaneous Reverse Current (mA)
Percent of Rated Peak Reverse Voltage (%)
10
1.0
0.1
.01
0 0.2
0.4 0.6 0.8 1.0
Instantaneous Forward Current (Amps)
Instantaneous Forward Voltage (Volts)
120
80
100
60
40
20
0
1
2510 20 50 100
Peak Forward Surge Current (Amps)
Number of Cycles at 60 Hz
Pulse Width 8.3 ms
Single Half Sine-Wave
(JEDEC Method)
1000
100
0
0.1
4.0 10.01.0 100
Capacitance (pF)
Reverse Voltage (Volts)
Ta = 25 °C
Pulsewidth: 300 µs
B350 to B360
B320 to B340
F = 1 MHz
Ta = 25 °C
Ta = 100 °C
Ta = 25 °C
Ta = 125 °C
3.50
2.00
0.01
0.1
1.0
10
1.50
1.00
0.50
0.00
25 50 75 100 125
150 175
Average Forward Current (Amps)
Lead Temperature (°C)
Single Phase Half Wave 60 Hz
Resistive or Inductive Load
100
0.001
020
40 60 80 100 120 140
Instantaneous Reverse Current (mA)
Percent of Rated Peak Reverse Voltage (%)
10
1.0
0.1
.01
0 0.2
0.4 0.6 0.8 1.0
Instantaneous Forward Current (Amps)
Instantaneous Forward Voltage (Volts)
120
80
100
60
40
20
0
1
2510 20 50 100
Peak Forward Surge Current (Amps)
Number of Cycles at 60 Hz
Pulse Width 8.3 ms
Single Half Sine-Wave
(JEDEC Method)
1000
100
0
0.1
4.0 10.01.0 100
Capacitance (pF)
Reverse Voltage (Volts)
Ta = 25 °C
Pulsewidth: 300 µs
B350 to B360
B320 to B340
F = 1 MHz
Ta = 25 °C
Ta = 100 °C
Ta = 25 °C
Ta = 125 °C
Typical Reverse Characteristics
3.50
2.00
0.01
0.1
1.0
10
1.50
1.00
0.50
0.00
25 50 75 100 125
150 175
Average Forward Current (Amps)
Lead Temperature (°C)
Single Phase Half Wave 60 Hz
Resistive or Inductive Load
100
0.001
020
40 60 80 100 120 140
Instantaneous Reverse Current (mA)
Percent of Rated Peak Reverse Voltage (%)
10
1.0
0.1
.01
0 0.2
0.4 0.6 0.8 1.0
Instantaneous Forward Current (Amps)
Instantaneous Forward Voltage (Volts)
120
80
100
60
40
20
0
1
2510 20 50 100
Peak Forward Surge Current (Amps)
Number of Cycles at 60 Hz
Pulse Width 8.3 ms
Single Half Sine-Wave
(JEDEC Method)
1000
100
0
0.1
4.0 10.01.0 100
Capacitance (pF)
Reverse Voltage (Volts)
Ta = 25 °C
Pulsewidth: 300 µs
B350 to B360
B320 to B340
F = 1 MHz
Ta = 25 °C
Ta = 100 °C
Ta = 25 °C
Ta = 125 °C
Specifications are subject to change without notice.
The device characteristics and parameters in this data sheet can and do vary in different applications and actual device performance may vary over time.
Users should verify actual device performance in their specific applications.