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FN6814.0
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A back-to-back transformer scheme is used to improve
common-mode rejection, which keeps the common-mode
level of the input matched to V
CM
. The value of the shunt
resistor should be determined based on the desired load
impedance.
The sample and hold circuit design uses a switched
capacitor input stage, which creates current spikes when the
sampling capacitance is reconnected to the input voltage.
This creates a disturbance at the input which must settle
before the next sampling point. Lower source impedance will
result in faster settling and improved performance. Therefore
a 1:1 transformer and low shunt resistance are
recommended for optimal performance.
A differential amplifier can be used in applications that
require dc coupling. In this configuration the amplifier will
typically determine the achievable SNR and distortion. A
typical differential amplifier circuit is shown in Figure 25.
Clock Input
The sample clock input circuit is a differential pair (see
Figure 29). Driving these inputs with a high level (up to
1.8V
P-P
on each input) sine or square wave will provide the
lowest jitter performance.
The recommended drive circuit is shown in Figure 26. The
clock can be driven single-ended, but this will reduce the
edge rate and may impact SNR performance.
Use of the clock divider is optional. The KAD2710C's ADC
requires a clock with 50% duty cycle for optimum
performance. If such a clock is not available, one option is to
generate twice the desired sampling rate and use the
KAD2710C's divide-by-2 setting. This frequency divider uses
the rising edge of the clock, so 50% clock duty cycle is
assured. Table 2 describes the CLKDIV connection.
CLKDIV is internally pulled low, so a pull-up resistor or logic
driver must be connected for undivided clock.
Jitter
In a sampled data system, clock jitter directly impacts the
achievable SNR performance. The theoretical relationship
between clock jitter (t
J
) and SNR is shown in Equation 1 and
is illustrated in Figure 27.
Where t
J
is the RMS uncertainty in the sampling instant.
FIGURE 23. TRANSFORMER INPUT FOR GENERAL
APPLICATIONS
ADT1-1WT
0.1µF
KAD2710
VCM
50O
0.01µF
Analog
In
ADT1-1WT
ADTL1-12
0.1µF
KAD2710
VCM
ADTL1-12
1nF
1nF
Analog
Input
FIGURE 24. TRANSMISSION-LINE TRANSFORMER INPUT
FOR HIGH IF APPLICATIONS
KAD2710
VCM
0.1µF
0.22µF
69.8O
49.9O
100O
100O
69.8O
348O
348O
CM
217O
25O
25O
Analog
Input
FIGURE 25. DIFFERENTIAL AMPLIFIER INPUT
TABLE 2. CLKDIV PIN SETTINGS
CLKDIV PIN DIVIDE RATIO
AVSS 2
AVDD 1
TC4-1W
1nF
AVDD2
200O
CLKP
CLKN
1kO 1kO
1nF
Clock
Input
FIGURE 26. RECOMMENDED CLOCK DRIVE
SNR 20 log
10
1
2f
IN
t
J
--------------------


=
(EQ. 1)
tj=100ps
tj = 1 0p s
tj = 1 p s
tj=0.1ps
10 B i ts
12 Bits
14 Bits
50
55
60
65
70
75
80
85
90
95
10 0
1 10 100 1000
Input Frequency - MHz
SNR - dB
FIGURE 27. SNR vs CLOCK JITTER
KAD2710C
14
FN6814.0
December 5, 2008
Intersil products are manufactured, assembled and tested utilizing ISO9001 quality systems as noted
in the quality certifications found at www.intersil.com/en/support/qualandreliability.html
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time
without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be
accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third
parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
For additional products, see www.intersil.com/en/products.html
This relationship shows the SNR that would be achieved if
clock jitter were the only non-ideal factor. In reality,
achievable SNR is limited by internal factors such as
linearity, aperture jitter and thermal noise. Internal aperture
jitter is the uncertainty in the sampling instant shown in
Figure 1. The internal aperture jitter combines with the input
clock jitter in a root-sum-square fashion, since they are not
statistically correlated, and this determines the total jitter in
the system. The total jitter, combined with other noise
sources, then determines the achievable SNR.
Digital Outputs
Data is output on a parallel bus with LVCMOS drivers.
The output format (Binary or Two’s Complement) is selected
via the 2SC pin as shown in Table 3.
TABLE 3. 2SC PIN SETTINGS
2SC PIN MODE
AVSS Two’s Complement
AVDD (or unconnected) Binary
Equivalent Circuits
FIGURE 28. ANALOG INPUTS FIGURE 29. CLOCK INPUTS
FIGURE 30. LVCMOS OUTPUTS
AVDD3
INP
INN
AVDD3
F1
F1
F2
Csamp
0.3pF
To
Charge
Pipeline
2pF
2pF
F2
Csamp
0.3pF
To
Charge
Pipeline
AVDD2
CLKP
CLKN
AVDD2
AVDD2
To Clock
Generation
D[9:0]
OVDD
OVDD
DATA
KAD2710C
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FN6814.0
December 5, 2008
Layout Considerations
Split Ground and Power Planes
Data converters operating at high sampling frequencies
require extra care in PC board layout. If analog and digital
ground planes are separate, analog supply and ground
planes should be laid out under signal and clock inputs and
digital planes under outputs and logic pins. Grounds should
be joined under the chip.
Clock Input Considerations
Use matched transmission lines to the inputs for the analog
input and clock signals. Locate transformers, drivers and
terminations as close to the chip as possible.
Bypass and Filtering
Bulk capacitors should have low equivalent series
resistance. Tantalum is recommended. Keep ceramic
bypass capacitors very close to device pins. Longer traces
will increase inductance, resulting in diminished dynamic
performance and accuracy. Make sure that connections to
ground are direct, and low impedance.
LVCMOS Outputs
Output traces and connections must be designed for 50
characteristic impedance. Keep trace lengths equal, and
minimize bends where possible. Avoid crossing ground and
power-plane breaks with signal traces.
Unused Inputs
The RST and 2SC inputs are internally pulled up, and can be
left open-circuit if not used.
CLKDIV is internally pulled low, which divides the input clock
by two.
VREFSEL must be held low for internal reference, but can
be left open for external reference.
Definitions
Analog Input Bandwidth is the analog input frequency at
which the spectral output power at the fundamental
frequency (as determined by FFT analysis) is reduced by
3dB from its full-scale low-frequency value. This is also
referred to as Full Power Bandwidth.
Aperture Delay or Sampling Delay is the time required
after the rise of the clock input for the sampling switch to
open, at which time the signal is held for conversion.
Aperture Jitter is the RMS variation in aperture delay for a
set of samples.
Clock Duty Cycle is the ratio of the time the clock wave is at
logic high to the total time of one clock period.
Differential Non-Linearity (DNL) is the deviation of any
code width from an ideal 1 LSB step.
Effective Number of Bits (ENOB) is an alternate method of
specifying Signal to Noise-and-Distortion Ratio (SINAD). In
dB, it is calculated as: ENOB = (SINAD - 1.76)/6.02
Gain Error is the ratio of the difference between the voltages
that cause the lowest and highest code transitions to the
full-scale voltage (less 2 LSB). It is typically expressed in
percent.
Integral Non-Linearity (INL) is the deviation of each
individual code from a line drawn from negative full-scale
(1/2 LSB below the first code transition) through positive
full-scale (1/2 LSB above the last code transition). The
deviation of any given code from this line is measured from
the center of that code.
Least Significant Bit (LSB) is the bit that has the smallest
value or weight in a digital word. Its value in terms of input
voltage is V
FS
/(2
N
- 1) where N is the resolution in bits.
Missing Codes are output codes that are skipped and will
never appear at the ADC output. These codes cannot be
reached with any input value.
Most Significant Bit (MSB) is the bit that has the largest
value or weight.
Pipeline Delay is the number of clock cycles between the
initiation of a conversion and the appearance at the output
pins of the data.
Power Supply Rejection Ratio (PSRR) is the ratio of a
change in input voltage necessary to correct a change in
output code that results from a change in power supply
voltage.
Signal to Noise-and-Distortion (SINAD) is the ratio of the
RMS signal amplitude to the RMS sum of all other spectral
components below one half the clock frequency, including
harmonics but excluding DC.
Signal-to-Noise Ratio (SNR) (without Harmonics) is the
ratio of the RMS signal amplitude to the RMS sum of all
other spectral components below one-half the sampling
frequency, excluding harmonics and DC.
SNR and SINAD are either given in units of dBc (dB to
carrier) when the power level of the fundamental is used as
the reference, or dBFS (dB to full scale) when the
converter’s full-scale input power is used as the reference.
Spurious-Free-Dynamic Range (SFDR) is the ratio of the
RMS signal amplitude to the RMS value of the peak spurious
spectral component. The peak spurious spectral component
may or may not be a harmonic.
Two-Tone SFDR is the ratio of the RMS value of the lowest
power input tone to the RMS value of the peak spurious
component, which may or may not be an IMD product.
KAD2710C

KAD2710C-17Q68

Mfr. #:
Manufacturer:
Renesas / Intersil
Description:
Analog to Digital Converters - ADC 10-BIT 170MSPS SINGL DC LVCMOS OUTPUTS
Lifecycle:
New from this manufacturer.
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