ADG411/ADG412/ADG413
Rev. D | Page 10 of 16
APPLICATIONS
Figure 13 illustrates a precise, fast, sample-and-hold circuit. An
AD845 is used as the input buffer while the output operational
amplifier is an AD711. During the track mode, SW1 is closed
and the output V
OUT
follows the input signal V
IN
. In the hold
mode, SW1 is opened and the signal is held by the hold
capacitor C
H
.
Due to switch and capacitor leakage, the voltage on the hold
capacitor decreases with time. The ADG411/ADG412/ADG413
minimizes this droop due to its low leakage specifications. The
droop rate is further minimized by the use of a polystyrene
hold capacitor. The droop rate for the circuit shown is typically
30 μV/μs.
A second switch, SW2, which operates in parallel with SW1, is
included in this circuit to reduce pedestal error. Since both
switches are at the same potential, they have a differential effect
on the op amp AD711, which minimizes charge injection
effects. Pedestal error is also reduced by the compensation
network R
C
and C
C
. This compensation network also reduces
the hold time glitch while optimizing the acquisition time.
Using the illustrated op amps and component values, the
pedestal error has a maximum value of 5 mV over the ±10 V
input range. Both the acquisition and settling times are 850 ns.
00024-013
+15V
–15V
2200pF
R
C
75
Ω
C
C
1000pF
C
H
2200pF
V
OUT
ADG411
ADG412
ADG413
SW2
SW1
S
S
D
D
+15V +5V
–15V
AD845
+15V
–15V
V
IN
AD711
Figure 13. Fast, Accurate Sample-and-Hold
ADG411/ADG412/ADG413
Rev. D | Page 11 of 16
TEST CIRCUITS
SD
V
S
R
ON
= V1/I
DS
I
DS
V1
00024-014
Figure 14. On Resistance
SD
V
S
V
D
I
S
(OFF) I
D
(OFF)
A A
00024-015
Figure 15. Off Leakage
SD
V
S
V
D
I
D
(ON)
A
00024-016
Figure 16. On Leakage
S
+15V +5V
0.1μF 0.1μF
V
DD
V
L
IN
V
S
GND
V
SS
R
L
300
Ω
C
L
35pF
V
OUT
0.1
μ
F
–15V
t
ON
t
OFF
3V
50% 50%
50% 50%
3V
90% 90%
V
IN
V
IN
V
OUT
ADG411
ADG412
00024-017
D
Figure 17. Switching Times
S1 D1
+15V +5V
0.1μF 0.1μF
V
DD
V
L
IN1, IN2
V
S1
GND
V
SS
R
L1
300Ω
C
L1
35pF
V
OUT1
0.1μF
–15V
V
S2
V
OUT2
R
L2
300Ω
C
L2
35pF
S2
V
IN
D2
t
D
t
D
3V
50% 50%
90%
V
IN
V
OUT1
V
OUT2
90%
90%
90%
0V
0V
0V
00024-018
Figure 18. Break-Before-Make Time Delay
+15V +5V
V
DD
V
L
IN
V
S
GND
V
SS
C
L
10nF
V
OUT
–15V
R
S
3V
V
IN
V
OUT
Δ
V
OUT
Q
INJ
= C
L
× ΔV
OUT
00024-019
SD
Figure 19. Charge Injection
ADG411/ADG412/ADG413
Rev. D | Page 12 of 16
+15V +5V
0.1μ
F 0.1
μ
F
V
DD
V
L
IN
V
S
GND
V
SS
R
L
50
Ω
V
OUT
0.1
μ
F
–15V
V
IN
00024-020
SD
Figure 20. Off Isolation
S
+15V +5V
0.1μF 0.1μF
V
DD
V
L
V
S
GND
V
SS
50Ω
NC
0.1μF
–15V
V
IN1
V
IN2
D
R
L
50Ω
V
OUT
CHANNEL-TO-CHANNEL
CROSSTALK = 20 × LOG V
S
/V
OUT
00024-021
D
S
Figure 21. Channel-to-Channel Crosstalk

ADG411BRZ-REEL

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Analog Switch ICs LC2MOS Precision IC Quad SPST
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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