2003 Oct 22 7
Philips Semiconductors Product specification
High speed CAN transceiver TJA1050
Notes
1. All parameters are guaranteed over the virtual junction temperature range by design, but only 100 % tested at 125 °C
ambient temperature for dies on wafer level and in addition to this 100 % tested at 25 °C ambient temperature for
cased products, unless specified otherwise.
2. For bare die, all parameters are only guaranteed if the backside of the bare die is connected to ground.
I
o(sc)(CANH)
short-circuit output current at
pin CANH
V
CANH
=0V;V
TXD
=0V 45 70 95 mA
I
o(sc)(CANL)
short-circuit output current at
pin CANL
V
CANL
=36V;
V
TXD
=0V
45 70 100 mA
V
i(dif)(th)
differential receiverthreshold
voltage
12V<V
CANL
< +12 V;
12V<V
CANH
< +12 V;
see Fig.5
0.5 0.7 0.9 V
V
i(dif)(hys)
differential receiver input
voltage hysteresis
12V<V
CANL
< +12 V;
12V<V
CANH
< +12 V;
see Fig.5
50 70 100 mV
R
i(cm)(CANH)
common mode input
resistance at pin CANH
15 25 35 k
R
i(cm)(CANL)
common mode input
resistance at pin CANL
15 25 35 k
R
i(cm)(m)
matching between
pin CANH and pin CANL
common mode input
resistance
V
CANH
=V
CANL
3 0 +3 %
R
i(dif)
differential input resistance 25 50 75 k
C
i(CANH)
input capacitance at
pin CANH
V
TXD
=V
CC
; not tested 7.5 20 pF
C
i(CANL)
input capacitance at
pin CANL
V
TXD
=V
CC
; not tested 7.5 20 pF
C
i(dif)
differential input capacitance V
TXD
=V
CC
; not tested 3.75 10 pF
I
LI(CANH)
input leakage current at
pin CANH
V
CC
=0V; V
CANH
= 5 V 100 170 250 µA
I
LI(CANL)
input leakage current at
pin CANL
V
CC
=0V; V
CANL
= 5 V 100 170 250 µA
Thermal shutdown
T
j(sd)
shutdown junction
temperature
155 165 180 °C
Timing characteristics (see Figs.6 and 7)
t
d(TXD-BUSon)
delay TXD to bus active V
S
= 0 V 25 55 110 ns
t
d(TXD-BUSoff)
delay TXD to bus inactive V
S
= 0 V 25 60 95 ns
t
d(BUSon-RXD)
delay bus active to RXD V
S
= 0 V 20 50 110 ns
t
d(BUSoff-RXD)
delay bus inactive to RXD V
S
= 0 V 45 95 155 ns
t
dom(TXD)
TXD dominant time for
time-out
V
TXD
= 0 V 250 450 750 µs
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
2003 Oct 22 8
Philips Semiconductors Product specification
High speed CAN transceiver TJA1050
APPLICATION AND TEST INFORMATION
handbook, full pagewidth
MGS380
V
CC
V
ref
RXD
TJA1050
60
60
60
60
CANH
CAN
BUS LINE
CANL
SJA1000
CAN
CONTROLLER
MICRO-
CONTROLLER
7
6
82
GND S
4
5
TXD
RX0
TX0
1
3
100
nF
47 nF
47 nF
+
5 V
Fig.3 Application information.
handbook, full pagewidth
MGS379
V
CC
V
ref
RXD
TJA1050
1 nF
TRANSIENT
GENERATOR
1 nF
CANH
CANL
7
6
82
GND S
15 pF
4
5
TXD
1
3
100
nF
+
5 V
Fig.4 Test circuit for automotive transients.
The waveforms of the applied transients shall be in accordance with
“ISO 7637 part 1”
, test pulses 1, 2, 3a and 3b.
2003 Oct 22 9
Philips Semiconductors Product specification
High speed CAN transceiver TJA1050
handbook, full pagewidth
MGS378
V
RXD
HIGH
LOW
hysteresis
0.5 0.9
V
i(dif)(bus)
(V)
Fig.5 Hysteresis of the receiver.
handbook, halfpage
MGS376
V
CC
V
ref
RXD
TJA1050
R
L
60
C
L
100 pF
CANH
CANL
7
6
82
GND S
15 pF
4
5
TXD
1
3
100
nF
+
5 V
Fig.6 Test circuit for timing characteristics.

TJA1050T/N,118

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
IC TXRX CAN 8BIT 5.25V SOT96-1
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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