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74LX1G132CTR

P1-P3P4-P6P7-P9P10-P11
74LX1G132
4/11
DC SPECIFICATIONS
Symbol Parameter
Test Condition Value
Unit
V
CC
(V)
-40 to 85 °C -55 to 125 °C
Min. Max. Min. Max.
V
T+
Positive Input
threshold
1.65 0.79 1.16 0.79 1.16
V
2.3 1.11 1.56 1.11 1.56
3 1.5 1.87 1.5 1.87
4.5 2.16 2.74 2.16 2.74
5.5 2.61 3.33 2.61 3.33
V
T-
Negative Input
threshold
1.65 0.39 0.62 0.39 0.62
V
2.3 0.58 0.87 0.58 0.87
3 0.84 1.14 0.84 1.14
4.5 1.41 1.79 1.41 1.79
5.5 1.87 2.29 1.87 2.29
V
H
Hysteresis Voltage 1.65 0.37 0.62 0.37 0.62
V
2.3 0.48 0.77 0.48 0.77
3 0.56 0.87 0.56 0.87
4.5 0.71 1.04 0.71 1.04
5.5 0.71 1.11 0.71 1.11
V
OH
High Level Output
Voltage
1.65 to 4.5
I
O
=-100 µAV
CC
-0.1 V
CC
-0.1
V
1.65
I
O
=-4 mA
1.2 1.2
2.3
I
O
=-8 mA
1.9 1.9
3.0
I
O
=-16 mA
2.4 2.4
I
O
=-24 mA
2.2 2.2
4.5
I
O
=-32 mA
3.8 3.8
V
OL
Low Level Output
Voltage
1.65 to 4.5
I
O
=100 µA
0.1 0.1
V
1.65
I
O
=4 mA
0.45 0.45
2.3
I
O
=8 mA
0.3 0.3
3.0
I
O
=16 mA
0.4 0.4
I
O
=24 mA
0.55 0.55
4.5
I
O
=32 mA
0.55 0.55
I
I
Input Leakage
Current
1.65 to 5.5
V
I
= 0 to 5.5V
± 10 ± 10 µA
I
off
Power Off Leakage
Current
0
V
I
or V
O
=5.5V
10 10 µA
I
CC
Quiescent Supply
Current
1.65 to 5.5
V
I
=V
CC
or GND
10 10 µA
74LX1G132
5/11
AC ELECTRICAL CHARACTERISTICS (Input t
r
=t
f
=3ns)
CAPACITIVE CHARACTERISTICS
1) C
PD
is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I
CC(opr)
=C
PD
xV
CC
xf
IN
+I
CC
Symbol Parameter
Test Condition Value
Unit
V
CC
(V)
C
L
(pF)
R
L
(Ω)
t
s
= t
r
(ns)
-40to85°C -55to125°C
Min. Max. Min. Max.
t
PLH
t
PHL
Propagation Delay
Time
1.65 to 1.95
15 1MΩ 3.0
2 12.0 2 12.0
ns
2.3 to 2.7 2 7.0 2 7.0
3.0 to 3.6 1 6.0 1 6.0
4.5 to 5.5 1 5.5 1 5.5
1.65 to 1.95 30 1000 2.0 2 11.0 2 11.0
2.3 to 2.7 30 500 2.0 2 6.5 2 6.5
2.7 50 500 2.5 1 6.5 1 6.5
3.0 to 3.6 50 500 2.5 1 5.5 1 5.5
4.5 to 5.5 50 500 2.5 1 5.0 1 5.0
Symbol Parameter
Test Condition Value
Unit
V
CC
(V)
T
A
=25°C
Min. Typ. Max.
C
IN
Input Capacitance
05pF
C
PD
Power Dissipation Capacitance
(note 1)
1.8 f
IN
=10MHz 20
pF2.5 21
3.3 22
74LX1G132
6/11
TEST CIRCUIT
R
T
=Z
OUT
of pulse generator (typically 50Ω)
TEST CIRCUIT AND WAVEFORM SYMBOL VALUE
WAVEFORM: PROPAGATION DELAY (f=1MHz; 50% duty cycle)
Symbol
V
CC
1.65 to 1.95V 2.3 to 2.7V 2.7 to 5.5V
C
L
15pF/30pF 15pF/30pF 15pF/50pF
R
L
1MΩ/1000Ω 1MΩ/500Ω 1MΩ/500Ω
V
IH
V
CC
V
CC
V
CC
V
M
V
CC
/2 V
CC
/2 V
CC
/2
t
r
=t
r
<2.0ns <2.0ns <2.5ns
P1-P3P4-P6P7-P9P10-P11

74LX1G132CTR

Mfr. #:
Buy 74LX1G132CTR
Manufacturer:
STMicroelectronics
Description:
Logic Gates Single 2-Input NAND
Lifecycle:
New from this manufacturer.
Delivery:
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