Spec No.JELF243A-0051T-01 P.10/10
MURATA MFG.CO.,LTD
Reference Only
12． ! Note
(1)Please make sure that your product has been evaluated in view of your specifications with our product being
mounted to your product.
(2)You are requested not to use our product deviating from the reference specifications.
(3)The contents of this reference specification are subject to change without advance notice.
Please approve our product specifications or transact the approval sheet for product specifications
before ordering.
(1) Residual elements and stray elements of test fixture can be described by F-parameter shown in following.
V
1
A B V
2
I
1
C D I
2
(2) The impedance of chip coil Zx and measured value Zm can be described by input/output current/voltage.
V
1
V
2
I
1
， I
2
(3) Thus,the relation between Zx and Zm is following;
Zm-β where, α= D / A =1
1-ZmΓ
β= B / D =Zsm-(1-Yom Zsm)Zss
Γ= C / A =Yom
Zsm:measured impedance of short chip
Zss:residual impedance of short chip (0.556nH)
Yom:measured admittance when opening the fixture
(4) Lx and Qx shall be calculated with the following equation.
Im(Zx) Im(Zx) Lx :Inductance of chip coil
2πf ， Re(Zx) Qx:Q of chip coil
f :Measuring frequency
Zm=
Zx=
Zx=α
Lx=
Qx=
A
B
C
D
Zm
Zx
V
1
2
1
2
ProductTest fixtureTest Head
I
I
V
<Electrical Performance:Measuring Method of Inductance/Q>
