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5962-8680202VA

P1-P3P4-P6P7-P9P10-P12
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-86802
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
E
SHEET
4
DSCC FORM 2234
APR 97
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein .
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be
in accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of
supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-
PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of
product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.
3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime 's agent,
and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore
documentation shall be made available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 57 (see MIL-PRF-38535, appendix A).
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-86802
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
E
SHEET
5
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/ 2/ 3/
-55°C ≤ T
A
≤ +125°C
unless otherwise specified
Group A
subgroups
Device
type
Limits
Unit
Min
Max
Relative accuracy
R
A
Unipolar and bipolar major
transitions ±3 codes
1, 2, 3 01
±0.195
% of FS
1
02, 03
±0.195
2, 3, 12
02, 03
±0.098
Digital input high voltage
V
IH
BLK and
CONV
1, 2, 3 All 2.0 V
Digital input low voltage
V
IL
BLK and
CONV
1, 2, 3
All
0.8
V
Digital input high current
I
IH
BLK and
CONV
, V
IH
= 5 V
1, 2, 3 All
±100 µA
Digital input low current
I
IL
BLK and
CONV
, V
IL
= 0 V
1, 2, 3
All
±100 µA
Digital output low voltage
V
OL
DATA
READY
, bit 1 – 8,
I
OL
= +3.2 mA
1, 2, 3
01
0.4
V
DATA
READY
, bit 1 – 10,
I
OL
= +3.2 mA
02, 03 0.4
Digital output high voltage
V
OH
Bit 1 – 8, I
OH
= -0.5 mA 1, 2, 3 01 2.4 V
Bit 1 – 10, I
OH
= -0.5 mA 02, 03 2.4
Full scale error 4/
A
E
Unipolar
1
All
±40
mV
Bipolar
±20
Full scale temperature drift
TCA
E
2, 3
01
±0.781
% of FS
02, 03
±0.488
Offset error
V
OS
First transition
1
01, 02
±20
mV
12 02
±10
12
03
±20
Offset temperature drift
TCV
OS
2, 3
01
±0.391
% of FS
02, 03
±0.195
Bipolar zero error
B
PZE
Low side MSB, transition
bipolar
1
All
±20
mV
12
02, 03
±10
Bipolar zero temperature TCB
PZE
Bipolar 2, 3 01
±0.391
% of FS
02, 03
±0.195
Three-state leakage current
I
OLT
V
OH
= 5 V, V
OL
= 0 V,
bit 1 - 8
1, 2, 3
01
±40 µA
V
OH
= 5 V, V
OL
= 0 V,
bit 1 - 10
02, 03
±40
Power supply current I
CC
CONV
, T
A
= +25°C
1 All 10 mA
BLK, T
A
= +25°C
10
I
EE
T
A
= +25°C
-15
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-86802
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
E
SHEET
6
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics – Continued.
Test
Symbol
Conditions 1/ 2/ 3/
-55°C ≤ T
A
≤ +125°C
unless otherwise specified
Group A
subgroups
Device
type
Limits
Unit
Min
Max
Differential nonlinearity 5/ DNL All codes test unipolar and
bipolar
1, 2, 3 01 8 Bits
1 02 8
2, 3, 12
02, 03
10
Power supply rejection PSRR
-16.0 V ≤ V
EE
≤ -13.5 V,
V
CC
= +5 V
1 01, 02
±78.1
mV
12
02, 03
±19.5
+4.5 V ≤ V
CC
≤ +5.5 V,
V
EE
= -15 V
2, 3
All
±78.1
Input resistance R
IN
4, 5, 6 All 3 7
kΩ
Conversion time T
C
See figure 2, T
A
= +25°C
9 All 15 40
µs
1/ V
CC
= +5 V, V
EE
= -15 V, V
IH
= +2.0 V, V
IL
= +0.8 V, analog input through 15 Ω to pin 13, unipolar configuration. Also, in the
unipolar configuration pin 15 (bipolar offset control) is grounded.
2/ For device type 01 – One least significant bit (1 LSB) = 0.391% of Full Scale.
3/ For device types 02 and 03 – One least significant bit (1 LSB) = 0.098% of Full Scale.
4/ For device type 01 – Full scale error guaranteed trimmable with 200 Ω potentiometer. For device types 02 and 03 – Full
scale error guaranteed trimmable with 50 Ω potentiometer.
5/ Minimum resolution for which no missing codes are guaranteed.
4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in
accordance with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015.
(2) T
A
= +125°C, minimum.
b. Interim and final electrical test parameters shall be as specified in table IIA herein.
P1-P3P4-P6P7-P9P10-P12

5962-8680202VA

Mfr. #:
Buy 5962-8680202VA
Manufacturer:
Analog Devices Inc.
Description:
Analog to Digital Converters - ADC IC MONO 10-BIT
Lifecycle:
New from this manufacturer.
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