Table 11: DDR2 I
DD
Specifications and Conditions – 2GB (Die Revision H)
Values shown for MT47H256M4 DDR2 SDRAM only and are computed from values specified in the 1Gb (128 Meg x 4) com-
ponent data sheet
Parameter Symbol
-80E/
-800 -667 Units
Operating one bank active-precharge current:
t
CK =
t
CK (I
DD
),
t
RC =
t
RC
(I
DD
),
t
RAS =
t
RAS MIN (I
DD
); CKE is HIGH, S# is HIGH between valid commands;
Address bus inputs are switching; Data bus inputs are switching
I
DD0
1170 1080 mA
Operating one bank active-read-precharge current: I
OUT
= 0mA; BL = 4, CL
= CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN (I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus inputs
are switching; Data pattern is same as I
DD4W
I
DD1
1350 1260 mA
Precharge power-down current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is
LOW; Other control and address bus inputs are stable; Data bus inputs are floating
I
DD2P
126 126 mA
Precharge quiet standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is
HIGH, S# is HIGH; Other control and address bus inputs are stable; Data bus in-
puts are floating
I
DD2Q
432 432 mA
Precharge standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is HIGH,
S# is HIGH; Other control and address bus inputs are switching; Data bus inputs
are switching
I
DD2N
504 432 mA
Active power-down current: All device banks open;
t
CK =
t
CK (I
DD
); CKE is LOW; Other control and address bus inputs are
stable; Data bus inputs are floating
Fast PDN exit
MR[12] = 0
I
DD3P
360 270 mA
Slow PDN exit
MR[12] = 1
180 180
Active standby current: All device banks open;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS
MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands;
Other control and address bus inputs are switching; Data bus inputs are switching
I
DD3N
594 540 mA
Operating burst write current: All device banks open; Continuous burst
writes; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus inputs
are switching; Data bus inputs are switching
I
DD4W
2250 2070 mA
Operating burst read current: All device banks open; Continuous burst read,
I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus
inputs are switching; Data bus inputs are switching
I
DD4R
2160 1980 mA
Burst refresh current:
t
CK =
t
CK (I
DD
); REFRESH command at every
t
RFC (I
DD
)
interval; CKE is HIGH, S# is HIGH between valid commands; Other control and
address bus inputs are switching; Data bus inputs are switching
I
DD5
2610 2520 mA
Self refresh current: CK and CK# at 0V; CKE ≤ 0.2V; Other control and address
bus inputs are floating; Data bus inputs are floating
I
DD6
126 126 mA
Operating bank interleave read current: All device banks interleaving reads,
I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL =
t
RCD (I
DD
) - 1 ×
t
CK (I
DD
);
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RRD =
t
RRD (I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is HIGH, S# is HIGH be-
tween valid commands; Address bus inputs are stable during deselects; Data bus
inputs are switching
I
DD7
3780 3330 mA
1GB, 2GB, 4GB (x72, SR) 240-Pin DDR2 SDRAM VLP RDIMM
IDD Specifications
PDF: 09005aef83d74fdb
hvf18c128_256_512x72pz.pdf – Rev. C 11/10 EN
11
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2010 Micron Technology, Inc. All rights reserved.
