IXA220I650NA
tentative
-di /dt = A/µs
T = °C
V
CES
V650
collector emitter voltage
collector emitter saturation voltage
T = 25°C
collector current
A
255
A
C
VJ
Symbol Definition
Ratings
typ. max.min.Conditions
Unit
156
V
V
CE(sat)
total power dissipation
625
W
collector emitter leakage current
5.5
V
turn-on delay time
30
ns
t
reverse bias safe operating area
A
V
GES
V±20
V
GEM
max. transient gate emitter voltage
T = °C
C
V
P
tot
gate emitter threshold voltage
RBSOA
400
±30
T = °C
T = °C
VJ
V
max. DC gate voltage
I
C25
I
C
T = 25°C
VJ
I = A; V = 15 V
CGE
T = 25°C
VJ
V
GE(th)
I
CES
I = mA; V = V
CGECE
V = V ; V = 0 V
CE CES GE
I
GES
T = 25°C
VJ
gate emitter leakage current
V = ±20 V
GE
1.8
1.9
4.84
mA
0.1
mA
0.1
500
G(on)
total gate charge
V = V; V = 15 V; I = A
CE
Q
GE C
280
nC
t
t
t
E
E
d(on)
r
d(off)
f
on
off
50
ns
100
ns
40
ns
2
mJ
7.6
mJ
current rise time
turn-off delay time
current fall time
turn-on energy per pulse
turn-off energy per pulse
inductive load
V = V; I = A
V = ±15 V; R = Ω
CE
C
GE G
V = ±15 V; R = Ω
GE G
V = V
CEmax
650
short circuit safe operating area
µs
SCSOA
10T = °C
VJ
V = V; V = ±15 V
CE GE
short circuit duration
t
short circuit current
I
SC
SC
R = Ω; non-repetitive
G
800
A
R
thJC
thermal resistance junction to case
0.2
K/W
V
RRM
V650
max. repetitive reverse voltage
T = 25°C
VJ
T = 25°C
forward current
A
tbd
A
C
tbdT = °C
C
I
F25
I
F
T = 25°C
forward voltage
V
tbd
V
VJ
tbdT = 125°C
VJ
V
F
I = A
F
T = 25°C
reverse current
mA
*
mA
VJ
*T = 125°C
VJ
I
R R RRM
T = 125°C
VJ
Q
I
t
rr
RM
rr
tbd
µC
tbd
A
tbd
ns
reverse recovery charge
max. reverse recovery current
reverse recovery time
V =
I = A; V = 0 V
F
FGE
E
rec
tbd
mJ
reverse recovery energy
R
R
thJC
thermal resistance junction to case
tbd
K/W
V = V
T = 25°C
C
T = 25°C
VJ
T = °C
VJ
VJ
200
3.2
200
200
3.9
3.9
3.9
300
360
300
I
CM
1.6
R
thCH
thermal resistance case to heatsink
K/W
R
thCH
thermal resistance case to heatsink
K/W
* not applicable, see Ices at IGBT
IGBT
Diode
300 V
V = V
CEmax
650
80
80
80
80
125
125
125
125
125
nA
0.10
IXYS reserves the right to change limits, conditions and dimensions.
20140708Data according to IEC 60747and per semiconductor unless otherwise specified
© 2014 IXYS all rights reserved