Philips Semiconductors Product specification
74LVT003.3V Quad 2-input NAND gate
1996 Aug 15
3
LOGIC DIAGRAM
A0
B0
A1
B1
A2
Y
0
B2
A3
B3
Y
1
Y2
Y
3
V
CC
= Pin 14
GND = Pin 7
3
6
8
11
1
2
4
5
9
10
12
13
SA00360
FUNCTION TABLE
INPUTS OUTPUT
Dna Dnb Qn
L L H
L H H
H L H
H H L
NOTES:
H = High voltage level
L = Low voltage level
ABSOLUTE MAXIMUM RATINGS
1,
2
SYMBOL
PARAMETER CONDITIONS RATING UNIT
V
CC
DC supply voltage –0.5 to +4.6 V
I
IK
DC input diode current V
I
< 0 –50 mA
V
I
DC input voltage
3
–0.5 to +7.0 V
I
OK
DC output diode current V
O
< 0 –50 mA
V
OUT
DC output voltage
3
Output in Off or High state –0.5 to +7.0 V
p
Output in High state –32
OUT
u
u
u
Output in Low state 64
T
stg
Storage temperature range –65 to 150 °C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.
RECOMMENDED OPERATING CONDITIONS
LIMITS
MIN MAX
V
CC
DC supply voltage 2.7 3.6 V
V
I
Input voltage 0 5.5 V
V
IH
High-level input voltage 2.0 V
V
IL
Low-level Input voltage 0.8 V
I
OH
High-level output current –20 mA
I
OL
Low-level output current 32 mA
∆t/∆v Input transition rise or fall rate; Outputs enabled 10 ns/V
T
amb
Operating free-air temperature range –40 +85 °C
