MGA-30116
150MHz – 1GHz
½ Watt High Linearity Ampli er
Data Sheet
Description
Avago Technologies’ MGA-30116 is a high linearity ½ Watt
PA with good OIP3 performance and exceptionally good
PAE at p1dB gain compression point, achieved through
the use of Avago Technologies’ proprietary 0.25um GaAs
Enhancement-mode pHEMT process.
The adjustable temperature compensated internal bias
circuit allowed the device to be operated at either class A
or class AB operation
The MGA-30116 is housed inside a standard 16 pin QFN
3X3 package.
Applications
Class A driver ampli er for GSM/CDMA Base Stations.
General purpose gain block.
Component Image
16 pins QFN 3x3
Notes:
Package marking provides orientation and identi cation
“30116” = Device Part Number
“YYWW = Work Week and Year of manufacture
“XXXX = Last 4 digit of Lot number
Features
High linearity and P1dB
Built in adjustable temperature compensated internal
bias circuitry
GaAs E-pHEMT Technology
[1]
Standard QFN 3X3 package
5V supply
Excellent uniformity in product speci cations
Tape-and-Reel packaging option available
MSL-1 and Lead-free
High MTTF for base station application
Speci cations
900MHz; 5V, 202.8mA (typical)
17.0 dB Gain
44.1 dBm Output IP3
27.7 dBm Output Power at 1dB gain compression
47.0% PAE at P1dB
2.0 dB Noise Figure
Notes:
1. Enhancement mode technology employs positive gate voltage,
thereby eliminating the need of negative gate voltage associated
with conventional depletion mode devices.
1 Vm
2 Vbias
3 RF in
4 NC
RFgnd 16
Vg 15
GND 14
NC 13
NC 12
VDD/RFout 11
VDD/RFout 10
NC 9
5 NC
6 NC
7 GND
8 NC
30116
YYWW
XXXX
TOP VIEW
BOTTOM VIEW
nc = not connected
GND
Attention: Observe precautions for
handling electrostatic sensitive devices.
ESD Machine Model = 60 V
ESD Human Body Model = 300 V
Refer to Avago Application Note A004R:
Electrostatic Discharge, Damage and Control.
2
Notes:
1. Operation of this device in excess of any of these limits may cause permanent damage.
2. Thermal resistance measured using Infra-Red measurement technique.
3. This is limited by maximum Vdd and Ids. Derate 30.3mW/ C for Tc> 77.5 C.
Absolute Maximum Rating
[1]
T
A
=25C
Symbol Parameter Units Absolute Max.
V
dd,max
Device Voltage, RF output to ground V 5.5
I
ds,max
Device Drain Current mA 400
V
ctrl,max
Control Voltage V 5.5
P
in,max
CW RF Input Power dBm 22
P
diss
Total Power Dissipation
[3]
W 2.2
T
j, max
Junction Temperature
C
150
T
STG
Storage Temperature
C
-65 to 150
Thermal Resistance
[2]
jc
= 33 C/W (Vdd=5, Ids=200mA, Tc=85C)
Electrical Speci cations
[4]
T
A
= 25C, Vdd =5V, Vctrl =5V, RF performance at 900 MHz, measured on demo board (see Fig. 7) unless otherwise
speci ed.
Symbol Parameter and Test Condition Units Min. Typ. Max.
Ids Quiescent current mA 165 202.8 240
Ictrl Vctrl current mA - 7 -
Gain Gain dB 15.5 17.0 18.5
OIP3
[5]
Output Third Order Intercept Point dBm 41 44.1 -
OP1dB Output Power at 1dB Gain Compression dBm 26.2 27.7 -
PAE Power Added E ciency % - 47.0 -
NF Noise Figure dB - 2.0 -
S11 Input Return Loss, 50Ω source dB - -14 -
S22 Output Return Loss, 50Ω load dB - -14 -
S12 Reverse Isolation dB - -23.5 -
Notes:
4. Measurements at 900MHz obtained using demo board described in Figure 6 and 7.
5. 900 MHz OIP3 test condition: F
RF1
- F
RF2
= 10MHz with input power of -5dBm per tone measured at worse side band
6. Use proper biasing, heat sink and de-rating to ensure maximum channel temperature is not exceeded. See absolute maximum ratings and
application note (if applicable) for more details.
3
Figure 5. Gain at 900MHz; LSL=15.5dB, Nominal =17.0dB, USL=18.5dB,
CPK = 6.858
Stdev = 0.0729
Notes:
1. Distribution data sample size is 500 samples taken from 2 di erent wafer lots and 3 di erent wafers. Future wafers allocated to this product may
have nominal values anywhere between the upper and lower limits.
2. Measurements were made on a characterization test board, which represents a trade-o between optimal OIP3, gain, P1dB and PAE. Circuit trace
losses have not been de-embedded from measurements above.
Product Consistency Distribution Charts
[1,2]
Figure 3. P1dB at 900MHz; LSL, 26.2dBm, nominal=27.7dBm
Figure 1. Ids at 900MHz; LSL=165mA, nominal =202.8mA, USL=240mA
CPK = 2.209
Stdev = 5.612
CPK = 1.645
stdev = 0.628
CPK = 27.78
Stdev = 0.018
stdev =0.187
Figure 2. OIP3 at 900MHz; LSL=41dB, nominal=44.1dBm
Figure 4. PAE at P1dB 900MHz; nominal=47.0%

MGA-30116-TR2G

Mfr. #:
Manufacturer:
Broadcom / Avago
Description:
IC RF AMP CDMA 400MHZ-1GHZ 16QFN
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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