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74AHCT1G00GW,165

P1-P3P4-P6P7-P9P10-P12P13-P13
74AHC_AHCT1G00 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved.
Product data sheet Rev. 7 — 5 November 2014 6 of 12
NXP Semiconductors
74AHC1G00; 74AHCT1G00
2-input NAND gate
12. Waveforms
Measurement points are given in Table 9.
Fig 5. The inputs (A and B) to output (Y) propagation delays
Table 9. Measurement point
Type Input Output
V
I
V
M
V
M
74AHC1G00 GND to V
CC
0.5 V
CC
0.5 V
CC
74AHCT1G00 GND to 3.0 V 1.5 V 0.5 V
CC
Test data is given in Table 8. Definitions for test circuit:
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
Fig 6. Test circuit for measuring switching times
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74AHC_AHCT1G00 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved.
Product data sheet Rev. 7 — 5 November 2014 7 of 12
NXP Semiconductors
74AHC1G00; 74AHCT1G00
2-input NAND gate
13. Package outline
Fig 7. Package outline SOT353-1 (TSSOP5)
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74AHC_AHCT1G00 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved.
Product data sheet Rev. 7 — 5 November 2014 8 of 12
NXP Semiconductors
74AHC1G00; 74AHCT1G00
2-input NAND gate
Fig 8. Package outline SOT753 (SC-74A)
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P1-P3P4-P6P7-P9P10-P12P13-P13

74AHCT1G00GW,165

Mfr. #:
Buy 74AHCT1G00GW,165
Manufacturer:
Nexperia
Description:
IC GATE NAND 1CH 2-INP 5TSSOP
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
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