EVERLIGHT ELECTRONICS CO.,LTD.
Everlight Electronics Co., Ltd. http:\\www.everlight.com
Rev 1 Page: 9 of 10
Device No SZDMO-036-077 Prepared date 2-Mar-2007 Prepared by Zhang Meijuan
Ambient Temperature Ta (°C)
Transmission Distance Lc (m)
IRM-36xxT SERIES
Typical Electro-Optical Characteristics Curves
Fig.-9 Arrival Distance vs. Ambient Temperature
Reliability Test Item And Condition
The reliability of products shall be satisfied with items listed below.
Confidence level：90%
LTPD：10%
Test Items Test Conditions
Failure Judgement
Criteria
Samples(n)
Defective(c)
Temperature cycle
1 cycle -40℃ +100℃
(15min)(5min)(15min)
300 cycle test
n=22,c=0
High temperature test
Temp: +100℃
Vcc:6V
n=22,c=0
Low temperature
storage
Temp: -40℃
1000hrs
n=22,c=0
High temperature
High humidity
Ta: 85℃,RH:85%
1000hrs
n=22,c=0
Solder heat
Temp: 260±5℃ 10sec
4mm From the bottom of the package.
L
0
≦ L×0.8
L
45
≦ L×0.8
L: Lower
specification limit
n=22,c=0
