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M27C512-10F1

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Maximum rating M27C512
10/22
4 Maximum rating
Stressing the device outside the ratings listed in <Blue>Table 5. may cause permanent
damage to the device. These are stress ratings only, and operation of the device at these, or
any other conditions outside those indicated in the Operating sections of this specification, is
not implied. Exposure to Absolute Maximum Rating conditions for extended periods may
affect device reliability. Refer also to the STMicroelectronics SURE Program and other
relevant quality documents.
Table 5. Absolute maximum ratings
Symbol Parameter Value Unit
T
A
Ambient Operating Temperature
(1)
1. Depends on range.
–40 to 125 °C
T
BIAS
Temperature Under Bias –50 to 125 °C
T
STG
Storage Temperature –65 to 150 °C
T
LEAD
Lead Temperature during Soldering (note 1) °C
V
IO
(2)
2. Minimum DC voltage on Input or Output is –0.5V with possible undershoot to –2.0V for a period less than
20ns. Maximum DC voltage on Output is V
CC
+0.5V with possible overshoot to V
CC
+2V for a period less
than 20ns.
Input or Output Voltage (except A9) –2 to 7 V
V
CC
Supply Voltage –2 to 7 V
V
A9
(2)
A9 Voltage –2 to 13.5 V
V
PP
Program Supply Voltage –2 to 14 V
M27C512 DC and AC parameters
11/22
5 DC and AC parameters
This section summarizes the operating and measurement conditions, and the DC and AC
characteristics of the device. The parameters in the DC and AC Characteristic tables that
follow are derived from tests performed under the Measurement Conditions summarized in
the relevant tables. Designers should check that the operating conditions in their circuit
match the measurement conditions when relying on the quoted parameters.
Figure 5. Testing input/output waveform
Figure 6. AC Testing Load Circuit
Table 6. AC measurement conditions
High Speed Standard
Input Rise and Fall Times ≤ 10ns ≤ 20ns
Input Pulse Voltages 0 to 3V 0.4V to 2.4V
Input and Output Timing Ref. Voltages 1.5V 0.8V and 2V
AI01822
3V
High Speed
0V
1.5V
2.4V
Standard
0.4V
2.0V
0.8V
AI01823B
1.3V
OUT
C
L
C
L
= 30pF for High Speed
C
L
= 100pF for Standard
C
L
includes JIG capacitance
3.3kΩ
1N914
DEVICE
UNDER
TEST
DC and AC parameters M27C512
12/22
Table 7. Capacitance
Symbol Parameter Test Condition
(1)(2)
Min Max Unit
C
IN
Input Capacitance V
IN
= 0V 6 pF
C
OUT
Output Capacitance V
OUT
= 0V 12 pF
1. T
A
= 25°C, f = 1MHz
2. Sampled only, not 100% tested.
Table 8. Read mode DC characteristics
Symbol Parameter Test Condition
(1)
Min Max Unit
I
LI
Input Leakage Current 0V ≤
V
IN
≤ V
CC
±10 µA
I
LO
Output Leakage Current 0V ≤ V
OUT
≤ V
CC
±10 µA
I
CC
Supply Current
E
= V
IL
, G = V
IL
,
I
OUT
= 0mA, f = 5MHz
30 mA
I
CC1
Supply Current (Standby) TTL E = V
IH
1mA
I
CC2
Supply Current (Standby) CMOS E > V
CC
– 0.2V 100 µA
I
PP
Program Current V
PP
= V
CC
10 µA
V
IL
Input Low Voltage –0.3 0.8 V
V
IH
(2)
Input High Voltage 2 V
CC
+ 1 V
V
OL
Output Low Voltage I
OL
= 2.1mA 0.4 V
V
OH
Output High Voltage TTL I
OH
= –1mA 3.6 V
Output High Voltage CMOS I
OH
= –100µA V
CC
– 0.7V V
1. V
CC
must be applied simultaneously with or before V
PP
and removed simultaneously or after V
PP
.
2. Maximum DC voltage on Output is V
CC
+0.5V.
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M27C512-10F1

Mfr. #:
Buy M27C512-10F1
Manufacturer:
STMicroelectronics
Description:
EPROM 512K (64Kx8) 100ns
Lifecycle:
New from this manufacturer.
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