KAF−8300
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16
AC Operating Conditions
Table 11. CLOCK LEVELS
Description Symbol Level Min. Nom. Max. Unit
Effective
Capacitance
Notes
V1 Low Level V1
L
Low −9.5 −9.25 −9.0 V 76 nF 1
V1 High Level V1
H
High 2.4 2.6 2.85 V 1
V2 Low Level V2
L
Low −9.5 −9.25 −9.0 V 81 nF 1
V2 High Level V2
H
High 2.4 2.6 2.8 V 1
RG, H1, H2, Amplitude RG
AMP
H1
AMP
H2
AMP
Amplitude 5.5 6.0 6.5 V RG = 7 pF
H1 = 224 pF
H2 = 168 pF
1
H1L, Amplitude H1L
AMP
Amplitude 7.5 8.0 8.5 V 7 pF 1
H1 Low Level H1
LOW
Low −4.7 −4.5 −4.3 V 1
H1L Low Level H1L
LOW
Low −6.7 −6.5 −6.3 V
H2 Low Level H2
LOW
Low −5.2 −5.0 −4.8 V
RG Low Level RG
LOW
Low 1.8 2.0 2.2 V 1
1. All pins draw less than 10 mA DC current. Capacitance values relative to SUB (substrate).
Table 12. CLOCK VOLTAGE DETAIL CHARACTERISTICS
Description Symbol Min. Nom. Max. Unit Notes
V1 High-Level Variation V1
HH
− 0.50 1.0 V High-Level Coupling
V2 High-Level Variation V2
HL
− 0.28 1.0 V High-Level Coupling
V2 Low-Level Variation V2
LH
− 0.46 1.0 V Low-Level Coupling
V1 Low-Level Variation V1
LL
− 0.14 1.0 V Low-Level Coupling
V1−V2 Cross-Over V1
CR
−2.0 −0.5 1.0 V Referenced to Ground
H1 High-Level Variation H1
HH
− 0.30 1.0 V
H1 High-Level Variation H1
HL
− 0.07 1.0 V
H1 Low-Level Variation H1
LH
− 0.16 1.0 V
H1 Low-Level Variation H1
LL
− 0.25 1.0 V
H2 High-Level Variation H2
HH
− 0.40 1.0 V
H2 High-Level Variation H2
HL
− 0.06 1.0 V
H2 Low-Level Variation H2
LH
− 0.10 1.0 V
H2 Low-Level Variation H2
LL
− 0.27 1.0 V
H1−H2 Cross-Over H1
CR1
−3.0 −1.23 0 V Rising Side of H1
H1−H2 Cross-Over H1
CR2
−3.0 −0.59 0 V Falling Side of H1
H1L High-Lever Variation H1L
HH
− 0.64 1.0 V
H1L High-Lever Variation H1L
HL
− 0.32 1.0 V
H1L Low-Lever Variation H1L
LH
− 0.27 1.0 V
H1L Low-Lever Variation H1L
LL
− 0.23 1.0 V
H1L−H2 Cross-Over H1L
CR1
−1.0 − −3.0 V Rising Side of H1L
RG High-Level Variation RG
HH
− 0.19 1.0 V
RG High-Level Variation RG
HL
− 0.20 1.0 V
RG Low-Level Variation RG
LH
− 0.11 1.0 V
RG Low-Level Variation RG
LL
− 0.30 1.0 V
1. H1, H2 clock frequency: 28 MHz. The maximum and minimum values in this table are supplied for reference. The actual clock levels were
measured using the KAF−8300 Evaluation Board. Testing against the device performance specifications is performed using the nominal
values.