AOD2HC60

AOD2HC60
600V,2.5A N-Channel MOSFET
General Description Product Summary
V
DS
@ T
j,max
700
I
DM
14A
R
DS(ON),max
< 2
Q
g,typ
7.6nC
E
oss
@ 400V 1.6µC
100% UIS Tested!
100% R
g
Tested!
Symbol
V
DS
V
GS
I
DM
I
AR
E
AR
E
AS
MOSFET dv/dt ruggedness
Peak diode recovery dv/dt
T
J
, T
STG
T
L
Symbol
R
θ
JA
R
θCS
R
θJC
V/ns
20
mJ
A
mJ
45
Parameter Typical
W
W/
o
C
Maximum lead temperature for soldering
purpose, 1/8" from case for 5 seconds
300 °C
14Pulsed Drain Current
C
Continuous Drain
Current
B
Maximum Junction-to-Ambient
A,G
T
C
=25°C
55
Maximum
Thermal Characteristics
Units
°C/W
I
D
T
C
=25°C
2.5
2
600
Junction and Storage Temperature Range -50 to 150 °C
Power Dissipation
B
V±30Gate-Source Voltage
T
C
=100°C
A
dv/dt
100
The AOD2HC60 is fabricated using an advanced high
voltage MOSFET process that is designed to deliver high
levels of performance and robustness in popular AC-DC
applications. By providing low R
DS(on)
, C
iss
and C
rss
along
with guaranteed avalanche capability this part can be
adopted quickly into new and existing offline power supply
designs.
V
UnitsParameter
Absolute Maximum Ratings T
A
Maximum
Drain-Source Voltage
Avalanche Current
C
28Repetitive avalanche energy
C
Derate above 25
o
C
74
0.6
7.5
Single pulsed avalanche energy
H
132
P
D
Maximum Case-to-sink
A
Maximum Junction-to-Case
D,F
°C/W
°C/W
1.3
0.5
1.7
-
G
D
S
G
S
D
G
S
D
Top View
TO252
DPAK
Bottom View
AOD2HC60
Rev.1.0 April 2013 www.aosmd.com Page 1 of 6
AOD2HC60
Symbol Min Typ Max Units
600
700
BV
DSS
/TJ
0.59
V/
o
C
1
10
I
GSS
Gate-Body leakage current
±100
nΑ
V
GS(th)
Gate Threshold Voltage
3 4 5 V
R
DS(ON)
1.65 2
g
FS
2.3 S
V
SD
0.78 1 V
I
S
Maximum Body-Diode Continuous Current 2.5 A
I
SM
14 A
C
iss
466 pF
C
oss
23 pF
C
o(er)
19 pF
C
o(tr)
31 pF
C
rss
1.3 pF
R
g
6.3
Q
g
7.6 10 nC
Q
gs
3.1 nC
Q
gd
1.4 nC
t
D(on)
18 ns
t
r
14 ns
t
D(off)
27 ns
t
f
17 ns
t
rr
183 ns
Q
rr
2.1
µC
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
V
GS
=0V, V
DS
=0 to 480V, f=1MHz
Effective output capacitance, time
related
J
V
GS
=0V, V
DS
=100V, f=1MHz
Total Gate Charge
V
GS
=10V, V
DS
=480V, I
D
=2.5A
Gate Source Charge
Body Diode Reverse Recovery Charge
I
F
=2.5A,dI/dt=100A/µs,V
DS
=100V
Turn-On DelayTime
Body Diode Reverse Recovery Time
Forward Transconductance
DYNAMIC PARAMETERS
Diode Forward Voltage
Gate resistance
V
GS
=0V, V
DS
=0V, f=1MHz
Maximum Body-Diode Pulsed Current
Input Capacitance
Output Capacitance
V
GS
=0V, V
DS
=100V, f=1MHz
Effective output capacitance, energy
related
I
V
DS
=5V,
I
D
=250µA
V
DS
=480V, T
J
=125°C
I
S
=1A,V
GS
=0V
V
DS
=40V, I
D
=1.25A
V
DS
=0V, V
GS
30V
Drain-Source Breakdown Voltage
I
D
=250µA, V
GS
=0V, T
J
=25°C
I
D
=250µA, V
GS
=0V, T
J
=150°C
Zero Gate Voltage Drain Current
V
DS
=600V, V
GS
=0V
BV
DSS
µA
V
Zero Gate Voltage Drain Current ID=250µA, VGS=0V
I
DSS
Electrical Characteristics (T
J
=25°C unless otherwise noted)
STATIC PARAMETERS
Parameter Conditions
Static Drain-Source On-Resistance
V
GS
=10V, I
D
=0.8A
Reverse Transfer Capacitance
I
F
=2.5A,dI/dt=100A/µs,V
DS
=100V
SWITCHING PARAMETERS
Turn-On Rise Time
Turn-Off DelayTime
V
GS
=10V, V
DS
=300V, I
D
=2.5A,
R
G
=25
Turn-Off Fall Time
Gate Drain Charge
A. The value of R
θJA
is measured with the device in a still air environment with T
A
=25°C.
B. The power dissipation P
D
is based on T
J(MAX)
=150°C in a TO252 package, using junction-to-case thermal resistance, and is more useful in setting
the upper dissipation limit for cases where additional heatsinking is used.
C. Repetitive rating, pulse width limited by junction temperature T
J(MAX)
=150°C.
D. The R
θJA
is the sum of the thermal impedance from junction to case R
θJC
and case to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-case thermal impedance which is measured with the device mounted to a large heatsink, assuming a
maximum junction temperature of T
J(MAX)
=150°C.
G.These tests are performed with the device mounted on 1 in
2
FR-4 board with 2oz. Copper, in a still air environment with T
A
=25°C.
H. L=60mH, I
AS
=2.1A, V
DD
=150V, R
G
=10, Starting T
J
=25°C
I. C
o(er)
is a fixed capacitance that gives the same stored energy as C
oss
while V
DS
is rising from 0 to 80% V
(BR)DSS.
J. C
o(tr)
is a fixed capacitance that gives the same charging time as C
oss
while V
DS
is rising from 0 to 80% V
(BR)DSS.
Rev.1.0 April 2013 www.aosmd.com Page 2 of 6
AOD2HC60
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
40
1E-04
1E-03
1E-02
1E-01
1E+00
1E+01
1E+02
0 0.2 0.4 0.6 0.8 1
V
SD
(Volts)
Figure 6: Body-Diode Characteristics
I
S
(A)
25°C
125°C
I
D
=30A
25°C
125°C
0
1.5
3
4.5
6
7.5
0 5 10 15 20 25 30
V
DS
(Volts)
Fig 1: On-Region Characteristics
I
D
(A)
V
GS
=5.5V
6.5V
10V
7V
6V
0.1
1
10
100
2 4 6 8 10
V
GS
(Volts)
Figure 2: Transfer Characteristics
I
D
(A)
-55°C
V
DS
=40V
25°C
125°C
1.0
1.5
2.0
2.5
3.0
3.5
0 1 2 3 4 5 6
I
D
(A)
Figure 3: On-Resistance vs. Drain Current and Gate
Voltage
R
DS(ON)
(
)
V
GS
=10V
0
0.5
1
1.5
2
2.5
3
-100 -50 0 50 100 150 200
Temperature C)
Figure 4: On-Resistance vs. Junction
Temperature
Normalized On-Resistance
V
GS
=10V
I
D
=0.8A
0.8
0.9
1
1.1
1.2
-100 -50 0 50 100 150 200
T
J
(
o
C)
Figure 5: Break Down vs. Junction Temperature
BV
DSS
(Normalized)
Rev.1.0 April 2013 www.aosmd.com Page 3 of 6

AOD2HC60

Mfr. #:
Manufacturer:
Description:
MOSFET N-CH 600V 2.5A TO252
Lifecycle:
New from this manufacturer.
Delivery:
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