74LVC02A
www.onsemi.com
3
MAXIMUM RATINGS
Symbol Parameter Value Condition Unit
V
CC
DC Supply Voltage −0.5 to +6.5 V
V
I
DC Input Voltage −0.5 ≤ V
I
≤ +6.5 V
V
O
DC Output Voltage −0.5 ≤ V
O
≤ V
CC
+ 0.5 Output in HIGH or LOW State
(Note 1)
V
I
IK
DC Input Diode Current −50 V
I
< GND mA
I
OK
DC Output Diode Current
−50 V
O
< GND mA
+50 V
O
> V
CC
mA
I
O
DC Output Source/Sink Current ±50 mA
I
CC
DC Supply Current Per Supply Pin ±100 mA
I
GND
DC Ground Current Per Ground Pin ±100 mA
T
STG
Storage Temperature Range −65 to +150 °C
T
L
Lead Temperature, 1 mm from Case for
10 Seconds
T
L
= 260 °C
T
J
Junction Temperature Under Bias T
J
= 135 °C
q
JA
Thermal Resistance (Note 2) SOIC = 85
TSSOP = 100
°C/W
MSL Moisture Sensitivity Level 1
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. I
O
absolute maximum rating must be observed.
2. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2 ounce copper trace no air flow.
RECOMMENDED OPERATING CONDITIONS
Symbol Parameter Min Typ Max Units
V
CC
Supply Voltage
Operating
Functional
1.65
1.2
3.6
3.6
V
V
I
Input Voltage 0 5.5 V
V
O
Output Voltage
HIGH or LOW State
3−State
0
0
V
CC
5.5
V
I
OH
HIGH Level Output Current
V
CC
= 3.0 V − 3.6 V
V
CC
= 2.7 V − 3.0 V
−24
−12
mA
I
OL
LOW Level Output Current
V
CC
= 3.0 V − 3.6 V
V
CC
= 2.7 V − 3.0 V
24
12
mA
T
A
Operating Free−Air Temperature −40 +125 °C
Dt/DV
Input Transition Rise or Fall Rate
V
CC
= 1.65 V to 2.7 V
V
CC
= 2.7 V to 3.6 V
0
0
20
10
ns/V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
