CRCW040233R0JNEDIF

D/CRCW-IF e3
www.vishay.com
Vishay
Revision: 17-Mar-15
4
Document Number: 20024
For technical questions, contact: thickfilmchip@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
1
0.000001 0.00001 0.0001 0.001 0.01 0.1 1 10 100
Maximum pulse load, continuous pulses; applicable if PP (ϑ
amb
) and ÛÛ
max.
;
for permissible resistance change equivalent to 8000 h operation
Pulse Duration (s)
Pulse Power (W)
0.1
0.01
10
100
1000
100 000
2512
2010
1210
1206
0805
0603
0402
10 000
Maximum pulse dissipation as a function of the pulse duration,
continuous pulse loading
2000
200
0
10
- 6
10
- 5
10
- 4
10
- 3
10
- 2
10
- 1
110
Maximum pulse voltage, single and continuous pulses; applicable if
P P
max.
; for permissible resistance change equivalent to 8000 h operation
Pulse Duration
i
(s)
400
600
800
1000
1200
1400
1600
1800
Pulse Voltage
max.
(V)
2512
1206/1210
0805
0603
0402
t
Û
2010
D/CRCW-IF e3
www.vishay.com
Vishay
Revision: 17-Mar-15
5
Document Number: 20024
For technical questions, contact: thickfilmchip@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
1 10 100 1000 10 000 100 000
1
10
10 000
100
1000
2512
2010
1210
1206
0805
0603
0402
Resistance Value (Ω)
Peak Voltage (V)
Pulse load rating in accordance to EN 60115-1, 4.27; 1.2 μs/50 μs;
5 pulses at 12 s intervals; for permissible resistance change 1 %
Single-pulse high voltage overload test 1.2 µs/50 µs EN 140000 4.27
1 10 100 1000 10 000 100 000
Resistance Value (Ω)
Peak Voltage (V)
1
10
10 000
100
1000
Pulse load rating in accordance to EN 60115-1, 4.27; 10 μs/700 μs;
10 pulses at 1 min intervals; for permissible resistance change 1 %
Single-pulse high voltage overload test 10 µs/700 µs EN 140000 4.27
2512
2010
1210
1206
0805
0603
0402
D/CRCW-IF e3
www.vishay.com
Vishay
Revision: 17-Mar-15
6
Document Number: 20024
For technical questions, contact: thickfilmchip@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
TEST PROCEDURES AND REQUIREMENTS
EN
60115-1
CLAUSE
IEC
60082-2
TEST
METHOD
TEST
PROCEDURE
REQUIREMENTS PERMISSIBLE
CHANGE (R)
STABILITY CLASS 1 OR BETTER
Stability for product type:
1 to 100 k
D/CRCW-IF e3
4.5 - Resistance - ± 5 %; ± 10 %
4.7 - Voltage proof U = 1.4 x U
ins
; 60 s No flashover or breakdown
4.13 - Short time overload
U = 2.5 x 2 x U
max.;
duration acc. to style
± (0.25 % R + 0.05 )
4.17.2 58 (Td) Solderability
Solder bath method;
Sn60Pb40;
non-activated flux;
(235 ± 5) °C, (2 ± 0.2) s
Good tinning ( 95 % covered);
no visible damage
Solder bath method;
Sn96.5Ag3Cu0.5;
non-activated flux;
(245 ± 5) °C, (3 ± 0.3) s
Good tinning ( 95 % covered);
no visible damage
4.8.4.2 - Temperature coefficient
(20/- 55/20) °C and
(20/125/20) °C
± 200 ppm/K
4.19 14 (Na) Rapid change of temperature
30 min. at - 55 °C;
30 min. at 125°C
5 cycles
1000 cycles
± (0.25 % R + 0.05 )
± (1 % R + 0.05 )
- 50 0 50 100 150
Ambient Temperature
ϑ
amb
(°C)
Fraction of Rated Dissipation P
70
(%)
0
50
100
Derating
70
P
70
x R

CRCW040233R0JNEDIF

Mfr. #:
Manufacturer:
Vishay / Dale
Description:
RES THKFLM D10/0402-IF 33R OHM 5% 200 ET7 E3 SMD - Tape and Reel (Alt: CRCW040233R0JNEDIF)
Lifecycle:
New from this manufacturer.
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