Data Sheet ADN2804
Rev. D | Page 21 of 24
APPLICATIONS INFORMATION
PCB DESIGN GUIDELINES
Proper RF PCB design techniques must be used for optimal
performance.
Power Supply Connections and Ground Planes
Use of one low impedance ground plane is recommended. The
VEE pins should be soldered directly to the ground plane to
reduce series inductance. If the ground plane is an internal
plane and connections to the ground plane are made through
vias, multiple vias can be used in parallel to reduce the series
inductance, especially on Pin 23, which is the ground return for
the output buffers. The exposed pad should be connected to the
GND plane using plugged vias so that solder does not leak
through the vias during reflow.
Use of a 22 μF electrolytic capacitor between VCC and VEE is
recommended at the location where the 3.3 V supply enters the
PCB. When using 0.1 μF and 1 nF ceramic chip capacitors, they
should be placed between ADN2804 supply pins VCC and VEE,
as close as possible to the ADN2804 VCC pins.
If connections to the supply and ground are made through
vias, the use of multiple vias in parallel helps to reduce series
inductance, especially on Pin 24, which supplies power to the
high speed CLKOUTP/CLKOUTN and DATAOUTP/
DATAOUTN output buffers. Refer to Figure 24 for the
recommended connections.
By placing the power supply and GND planes adjacent to each
other and using close spacing between the planes, excellent high
frequency decoupling can be realized. The capacitance is given
by
pF/0.88ε
r
dAC
PLANE
where:
r
is the dielectric constant of the PCB material.
A is the area of the overlap of power and GND planes (cm
2
).
d is the separation between planes (mm).
For FR-4,
r
= 4.4 and d = 0.25 mm; therefore,
C
PLANE
~ 15.5A (pF)
µC
I
2
C CONTROLLER
I
2
C CONTROLLER
LOS
SDA
SCK
SADDR5
50 TRANSMISSION LINES
DATAOUTP
DATAOUTN
CLKOUTP
CLKOUTN
0.1µF22µF 1nF
0.1µF
0.1µF
0.1µF
1.6µF
1.6µF
0.1µF
0.47µF ±20%
>300M INSULATION RESISTANCE
1nF
1nF
1nF
0.1µF1nF
+
V
C
C
50
50
TIA
R
TH
VCC
NC
µC
VCC
VCC
1
TEST1
2
VCC
3
VREF
4
NIN
5
PIN
6
SLICEP
7
SLICEN
8
VEE
24
VCC
23
VEE
22
21
20
19
18
VCC
17
VEE
9
THRADJ
10
REFCLKP
11
REFCLKN
12
VCC
13
VEE
14
CF2
15
C
F1
16
LOL
32
TEST2
31
VCC
30
VEE
29
DATAOU
TP
28
DATA
OUTN
27
S
QUELCH
26
CLKOUTP
25
CLKOUTN
EXPOSED PAD
TIED OFF TO
VEE PLANE
WITH VIAS
05801-031
Figure 24. Typical ADN2804 Applications Circuit
ADN2804 Data Sheet
Rev. D | Page 22 of 24
Transmission Lines
Minimizing reflections in the ADN2804 requires use of 50 Ω
transmission lines for all pins with high frequency input and
output signals, including PIN, NIN, CLKOUTP, CLKOUTN,
DATAOUTP, and DATAOUTN (also REFCLKP and REFCLKN,
if a high frequency reference clock is used, such as 155 MHz). It
is also necessary for the PIN/NIN input traces to be matched in
length and for the CLKOUTP/CLKOUTN and
DATAOUTP/DATAOUTN output traces to be matched in
length to avoid skew between the differential traces.
The high speed inputs, PIN and NIN, are internally terminated
with 50 Ω to an internal reference voltage (see Figure 25).
A 0.1 μF is recommended between VREF, Pin 3, and GND to
provide an ac ground for the inputs.
As with any high speed, mixed-signal design, take care to keep
all high speed digital traces away from sensitive analog nodes.
C
IN
C
IN
0.1µF
NIN
PIN
ADN2804
2.5V
VREF
TIA
V
CC
0
5801-026
50
50
3
Figure 25. ADN2804 AC-Coupled Input Configuration
Soldering Guidelines for Lead Frame Chip Scale Package
The lands on the 32-lead LFCSP are rectangular. The printed
circuit board (PCB) pad for these should be 0.1 mm longer than
the package land length and 0.05 mm wider than the package
land width. The land should be centered on the pad. This
ensures that the solder joint size is maximized. The bottom of
the chip scale package has a central exposed pad. The pad on
the PCB should be at least as large as this exposed pad. The user
must connect the exposed pad to VEE using plugged vias so
that solder does not leak through the vias during reflow. This
ensures a solid connection from the exposed pad to VEE.
Choosing AC Coupling Capacitors
AC coupling capacitors at the input (PIN, NIN) and output
(DATAOUTP, DATAOUTN) of the ADN2804 can be optimized
for the application. When choosing the capacitors, the time
constant formed with the two 50 Ω resistors in the signal path
must be considered. When a large number of consecutive
identical digits (CIDs) are applied, the capacitor voltage can
droop due to baseline wander (see Figure 26), causing pattern-
dependent jitter (PDJ).
The user must determine how much droop is tolerable and
choose an ac coupling capacitor based on that amount of droop.
The amount of PDJ can then be approximated based on the
capacitor selection. The actual capacitor value selection can
require some trade-offs between droop and PDJ.
For example, assuming that 2% droop can be tolerated, the
maximum differential droop is 4%. Normalizing to V p-p:
Droop = ΔV = 0.04 V = 0.5 V p-p (1 − e
−t/τ
); therefore, τ = 12t
where:
τ is the RC time constant (C is the ac coupling capacitor, R =
100 Ω seen by C).
t is the total discharge time, which is equal to nT, where n is the
number of CIDs, and T is the bit period.
The capacitor value can then be calculated by combining the
equations for τ and t:
C = 12 nT/R
Once the capacitor value is selected, the PDJ can be
approximated as
PDJ
pspp
= 0.5 t
r
(1 − e
(−nT/RC)
)/0.6
where:
PDJ
pspp
is the amount of pattern-dependent jitter allowed
(<0.01 UI p-p typical).
t
r
is the rise time, which is equal to 0.22/BW,
where BW ~ 0.7 (bit rate).
Note that this expression for t
r
is accurate only for the inputs.
The output rise time for the ADN2804 is ~100 ps regardless of
the data rate.
Data Sheet ADN2804
Rev. D | Page 23 of 24
50
50
PIN
V
REF
NIN
C
IN
C
OUT
C
OUT
V1
C
IN
V1b
V2
V2b
LIMAMP
CDR
+
DATAOUTP
DATAOUTN
1
V1
V1b
V2
V2b
V
DIFF
234
VREF
VTH
ADN2804
V
DIFF
= V2–V2b
VTH = ADN2804 QUANTIZER THRESHOLD
NOTES:
1. DURING DATA PATTERNS WITH HIGH TRANSITION DENSITY, DIFFERENTIAL DC VOLTAGE AT V1 AND V2 IS ZERO.
2. WHEN THE OUTPUT OF THE TIA GOES TO CID, V1 AND V1b ARE DRIVEN TO DIFFERENT DC LEVELS. V2 AND V2b DISCHARGE TO THE
VREF LEVEL, WHICH EFFECTIVELY INTRODUCES A DIFFERENTIAL DC OFFSET ACROSS THE AC COUPLING CAPACITORS.
3. WHEN THE BURST OF DATA STARTS AGAIN, THE DIFFERENTIAL DC OFFSET ACROSS THE AC COUPLING CAPACITORS IS APPLIED TO
THE INPUT LEVELS CAUSING A DC SHIFT IN THE DIFFERENTIAL INPUT. THIS SHIFT IS LARGE ENOUGH SUCH THAT ONE OF THE STATES,
EITHER HIGH OR LOW DEPENDING ON THE LEVELS OF V1AND V1b WHEN THE TIA WENT TO CID, IS CANCELED OUT. THE QUANTIZER
DOES NOT RECOGNIZE THIS AS A VALID STATE.
4. THE DC OFFSET SLOWLY DISCHARGES UNTIL THE DIFFERENTIAL INPUT VOLTAGE EXCEEDS THE SENSITIVITY OF THE ADN2804. THE
QUANTIZER CAN RECOGNIZE BOTH HIGH AND LOW STATES AT THIS POINT.
0
5801-027
TIA
V
CC
Figure 26. Example of Baseline Wander
DC-COUPLED APPLICATION
The inputs to the ADN2804 can also be dc-coupled. This may
be necessary in burst mode applications, where there are long
periods of CIDs, and baseline wander cannot be tolerated. If the
inputs to the ADN2804 are dc-coupled, care must be taken not
to violate the input range and common-mode level require-
ments of the ADN2804 (see Figure 27 through Figure 29). If dc
coupling is required and the output levels of the TIA do not
adhere to the levels shown in Figure 28, level shifting must be
performed and/or an attenuator must be placed between the
TIA outputs and the ADN2804 inputs.
0.1µF
NIN
PIN
ADN2804
2.5V
VREF
TIA
V
CC
05801-028
50
50
50 50
3k
Figure 27. DC-Coupled Application
PIN
INPUT (V)
V p-p = PIN – NIN = 2
×
V
SE
= 10mV AT SENSITIVITY
V
SE
= 5mV MIN
V
CM
= 2.3V MIN
(DC-COUPLED)
NIN
0
5801-029
Figure 28. Minimum Allowed DC-Coupled Input Levels
PIN
INPUT (V)
V p-p = PIN – NIN = 2
×
V
SE
= 2.0V MAX
V
SE
= 1.0V MAX
V
CM
= 2.3V
(DC-COUPLED)
NIN
0
5801-030
Figure 29. Maximum Allowed DC-Coupled Input Levels

ADN2804ACPZ-500RL7

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Timers & Support Products Anyrate 10 Mbps to 2.7Gbps PA/CDR
Lifecycle:
New from this manufacturer.
Delivery:
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