6.42
IDT709379/69L
High-Speed 32/16K x 18 Synchronous Pipelined Dual-Port Static RAM Industrial and Commercial Temperature Ranges
4
Recommended Operating
Temperature and Supply Voltage
Recommended DC Operating
Conditions
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in the
operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
2. V
TERM must not exceed VCC + 10% for more than 25% of the cycle time or 10ns
maximum, and is limited to
< 20mA for the period of VTERM > VCC + 10%.
3. Ambient Temperature Under Bias. No AC Conditions. Chip Deselected.
Absolute Maximum Ratings
(1)
NOTES:
1. These parameters are determined by device characterization, but are not
production tested.
2. 3dV references the interpolated capacitance when the input and output switch from
0V to 3V or from 3V to 0V.
3. C
OUT also references CI/O.
Capacitance
(1)
(TA = +25°C, f = 1.0MHz)
NOTES:
1. This is the parameter T
A. This is the "instant on" case temperature.
NOTES:
1. V
TERM must not exceed VCC + 10%.
2. V
IL > -1.5V for pulse width less than 10ns.
Grade Ambient
Temperature
(2)
GND V
CC
Commercial 0
O
C to +70
O
C0V 5.0V
+
10%
Industrial -40
O
C to +85
O
C0V 5.0V
+
10%
4845 tbl 04
Symbol Parameter Min. Typ. Max. Unit
V
CC
Supply Voltage 4.5 5.0 5.5 V
GND Ground 0 0 0 V
V
IH
Input High Voltage 2.2
____
6.0
(1)
V
V
IL
Input Low Voltage -0.5
(2)
____
0.8 V
4845 tbl 05
Symbol Parameter Conditions
(2)
Max. Unit
C
IN
Input Capacitance V
IN
= 3dV 9 pF
C
OUT
(3 )
Output Capacitance V
OUT
= 3dV 10 pF
4845 tbl 07
Symbol Rating Commercial
& Industrial
Unit
V
TERM
(2)
Terminal Voltage
with Respect
to GND
-0.5 to +7.0 V
T
BIAS
Temperature Under Bias -55 to +125
o
C
T
STG
Storage Temperature -65 to +150
o
C
T
JN
Junction Temperature +150
o
C
I
OUT
DC Output Current 50 mA
4845 tbl 06
NOTES:
1. "H" = V
IH, "L" = VIL, "X" = Don't Care.
2. CE
0, LB, UB, and OE = VIL; CE1 and R/W = VIH.
3. Outputs configured in Flow-Through Output mode: if outputs are in Pipelined mode the data out will be delayed by one cycle.
4. ADS is independent of all other signals including CE
0, CE1, UB and LB.
5. The address counter advances if CNTEN = V
IL on the rising edge of CLK, regardless of all other signals including CE0, CE1, UB and LB.
6. While an external address is being loaded (ADS = V
IL), R/W = VIH is recommended to ensure data is not written arbitrarily.
Truth Table II—Address Counter Control
(1,2,6)
External
Address
Previous
Internal
Address
Internal
Address
Used CLK
ADS CNTEN CNTRST
I/O
(3)
MODE
An X An
L
(4)
XHD
I/O
(n) External Address Used
XAnAn + 1
H L
(5)
HD
I/O
(n+1) Counter Enabled—Internal Address generation
X An + 1 An + 1
HH HD
I/O
(n+1) External Address Blocked—Counter disabled (An + 1 reused)
XXA
0
XX L
(4)
D
I/O
(0) Counter Reset to Address 0
4845 tbl 03
6.42
IDT709379/69L
High-Speed 32/16K x 18 Synchronous Pipelined Dual-Port Static RAM Industrial and Commercial Temperature Ranges
5
NOTES:
1. At f = f
MAX, address and control lines (except Output Enable) are cycling at the maximum frequency clock cycle of 1/tCYC, using "AC TEST CONDITIONS" at input levels of
GND to 3V.
2. f = 0 means no address, clock, or control lines change. Applies only to input at CMOS level standby.
3. Port "A" may be either left or right port. Port "B" is the opposite from port "A".
4. V
CC = 5V, TA = 25°C for Typ, and are not production tested. ICC DC(f=0) = 150mA (Typ).
5. CE
X = VIL means CE0X = VIL and CE1X = VIH
CEX = VIH means CE0X = VIH or CE1X = VIL
CEX < 0.2V means CE0X < 0.2V and CE1X > VCC - 0.2V
CE
X > VCC - 0.2V means CE0X > VCC - 0.2V or CE1X < 0.2V
"X" represents "L" for left port or "R" for right port.
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range
(3)
(VCC = 5V ± 10%)
709379/69L7
Com'l Only
709379/69L9
Com'l
& Ind
709379/69L12
Com'l Only
Symbol Parameter Test Condition Version
Typ.
(4)
Max.
Typ.
(4)
Max.
Typ.
(4)
Max. Unit
I
CC Dynamic Operating
Current
(Both Ports Active)
CE
L and CER= VIL
Outputs Disabled
f = f
MAX
(1)
COM'L L 250 440 250 400 230 355
mA
IND L
____ ____
300 430
____ ____
ISB1 Standby Current
(Both Ports - TTL
Level Inputs)
CE
L = CER = VIH
f = fMAX
(1)
COM'L L 65 145 80 135 70 110
mA
IND L
____ ____
95 160
____ ____
ISB2 Standby Current
(One Port - TTL
Level Inputs)
CE
"A" = VIL and
CE
"B" = VIH
(3)
Active Port Outputs
Disabled, f=f
MAX
(1)
COM'L L 160 295 175 275 150 240
mA
IND L
____ ____
175 295
____ ____
ISB3 Full Standby Current
(Both Ports -
CMOS Level Inputs)
Both Ports CER and
CE
L > V
CC
- 0.2V
V
IN > V
CC
- 0.2V or
V
IN < 0.2V, f = 0
(2)
COM'L L 0.2 5.0 0.5 3.0 0.5 3.0
mA
IND L
____ ____
0.5 6.0
____ ____
ISB4 Full Standby Current
(One Port -
CMOS Level Inputs)
CE
"A" < 0.2V and
CE
"B" > V
CC
- 0.2V
(5)
VIN > V
CC
- 0.2V or
V
IN < 0.2V, Active Port
Outputs Disabled, f = f
MAX
(1)
COM'L L 150 290 170 270 140 225
mA
IND L
____ ____
190 290
____ ____
4845 tbl 09
DC Electrical Characteristics Over the Operating
Temperature Supply Voltage Range
(VCC = 5.0V ± 10%)
NOTE:
1. At Vcc
< 2.0V input leakages are undefined.
Symbol Parameter Test Conditions
709379/69L
UnitMin. Max.
|I
LI| Input Leakage Current
(1)
VCC = 5.5V, VIN = 0V to VCC
___
A
|I
LO| Output Leakage Current
CE
0 = VIH or CE1 = VIL, VOUT = 0V to VCC
___
A
V
OL Output Low Voltage IOL = +4mA
___
0.4 V
V
OH Output High Voltage IOH = -4mA 2.4
___
V
4845 tbl 08
6.42
IDT709379/69L
High-Speed 32/16K x 18 Synchronous Pipelined Dual-Port Static RAM Industrial and Commercial Temperature Ranges
6
AC Test Conditions
Figure 1. AC Output Test load. Figure 2. Output Test Load
(For t
CKLZ, tCKHZ, tOLZ, and tOHZ).
*Including scope and jig.
Figure 3. Typical Output Derating (Lumped Capacitive Load).
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
Output Load
GND to 3.0V
3ns Max.
1.5V
1.5V
Figures 1,2 and 3
4845 tbl 10
4845 drw 0
5
893
30pF
347
5V
DATA
OUT
893
5pF*
347
5V
DATA
OUT
4845 drw 04
1
2
3
4
5
6
7
8
20 40 10060 80 120 140 160 180 200
tCD
1
,
tCD
2
(Typical, ns)
Capacitance (pF)
4845 drw 06
-1
0
10pF is the I/O capacitance
of this device, and 30pF is the
AC Test Load Capacitance

709369L9PF

Mfr. #:
Manufacturer:
IDT
Description:
SRAM 16K X 18K
Lifecycle:
New from this manufacturer.
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