74ABT821 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 5 — 7 November 2011 7 of 16
NXP Semiconductors
74ABT821
10-bit D-type flip-flop; positive-edge trigger; 3-state
10. Dynamic characteristics
11. Waveforms
Table 7. Dynamic characteristics
GND = 0 V; for test circuit, see Figure 8.
Symbol Parameter Conditions 25 C; V
CC
= 5.0 V 40 C to +70 C;
V
CC
= 5.0 V 0.5 V
Unit
Min Typ Max Min Max
t
PLH
LOW to HIGH
propagation delay
CP to Qn; see Figure 5 2.1 4.1 5.6 2.1 6.2 ns
t
PHL
HIGH to LOW
propagation delay
CP to Qn; see Figure 5 2.8 4.6 6.2 2.8 6.7 ns
t
PZH
OFF-state to HIGH
propagation delay
OEn to Qn; see Figure 6 1.0 3.0 4.5 1.0 5.3 ns
t
PZL
OFF-state to LOW
propagation delay
OEn to Qn; see Figure 6 2.2 4.1 5.6 2.2 6.3 ns
t
PHZ
HIGH to OFF-state
propagation delay
OEn to Qn; see Figure 6 2.7 4.7 6.2 2.7 6.7 ns
t
PLZ
LOW to OFF-state
propagation delay
OEn to Qn; see Figure 6 2.3 4.6 6.1 2.3 6.5 ns
t
su(H)
set-up time HIGH Dn to CP; see Figure 7 2.1 0.5 - 2.1 - ns
t
su(L)
set-up time LOW Dn to CP; see Figure 7 2.1 0.3 - 2.1 - ns
t
h(H)
hold time HIGH Dn to CP; see Figure 7 1.3 0 - 1.3 - ns
t
h(L)
hold time LOW Dn to CP; see Figure 7 1.3 0.3 - 1.3 - ns
t
WH
pulse width HIGH CP; see Figure 5 2.9 1.8 - 2.9 - ns
t
WL
pulse width LOW CP; see Figure 5 3.8 2.8 - 3.8 - ns
f
max
maximum
frequency
see Figure 5 125 185 - 125 - MHz
V
M
= 1.5 V
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 5. Propagation delay clock input (CP) to output (Qn), clock pulse (CP) width and
maximum clock (CP) frequency
001aac445
CP
input
Qn
output
t
PHL
t
PLH
t
WH
t
WL
1 / f
max
V
M
V
OH
V
I
GND
V
OL
V
M
74ABT821 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 5 — 7 November 2011 8 of 16
NXP Semiconductors
74ABT821
10-bit D-type flip-flop; positive-edge trigger; 3-state
V
M
= 1.5 V.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 6. 3-state output (Qn) enable and disable times
V
M
= 1.5 V
The shaded areas indicate when the input is permitted to change for
predictable output
performance.
Fig 7. Set-up and hold times data input (Dn) to clock (CP)
001aal299
t
PLZ
t
PHZ
outputs
disabled
outputs
enabled
V
OH
0.3 V
V
OL
+ 0.3 V
outputs
enabled
output
LOW-to-OFF
OFF-to-LOW
output
HIGH-to-OFF
OFF-to-HIGH
OE input
V
I
V
OL
V
OH
3.5 V
V
M
GND
GND
t
PZL
t
PZH
V
M
V
M
74ABT821 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 5 — 7 November 2011 9 of 16
NXP Semiconductors
74ABT821
10-bit D-type flip-flop; positive-edge trigger; 3-state
a. Input pulse definition b. Test circuit
Test data and V
EXT
levels are given in Table 8.
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
V
EXT
= Test voltage for switching times.
Fig 8. Test circuit for measuring switching times
001aai298
V
M
V
M
t
W
t
W
10 %
90 % 90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
90 %
10 % 10 %
t
f
t
r
t
r
t
f
V
EXT
V
CC
V
I
V
O
mna616
DUT
C
L
R
T
R
L
R
L
G
Table 8. Test data
Input Load V
EXT
V
I
f
I
t
W
t
r
, t
f
C
L
R
L
t
PHL
, t
PLH
t
PZH
, t
PHZ
t
PZL
, t
PLZ
3.0 V 1 MHz 500 ns 2.5 ns 50 pF 500 open open 7.0 V

74ABT821D,602

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
Flip Flops 10-BIT D-TYPE 3-S
Lifecycle:
New from this manufacturer.
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