OMO ElectronicOMO Electronic
Expand menu
Hello, Sign inMy Account
0 Cart

DLW5ATZ112MQ2L

P1-P3P4-P6P7-P9P10-P11
Spec. No. JEFL243C-9109D-01 P 1/11
MURATA MFG CO., LTD.
Wire Wound Chip Common Mode Choke Coil
DLW5ATZ□□□MQ2□
Murata Standard Reference Specification [AEC-Q200]
1. Scope
This reference specification applies to Wire Wound Chip Common Mode Choke Coil DLW5ATZ_MQ Series for
Automotive Electronics based on AEC-Q200 except for Power train and Safety.
2. Part Numbering
(ex.) DL W 5A T Z 111 M Q 2 L
(1) (2) (3) (4) (5) (6) (7) (8) (9) (10)
(1) Chip Common Mode Choke Coil
(2) Structure (W : Winding Type)
(3) Dimension (L×W)
(4) Type
(5) Category
3.Rating
Customer
Part Number
MURATA
Part Number
Impedance
at 10MHz,
Under Standard
Testing Conditions
(Ω)
Impedance
at 100MHz,
Under Standard
Testing Conditions
(ΩTyp.)
Rated
Voltage
V(DC)
Withstanding
Voltage
V(DC)
Rated
Current
(A)
DC
Resistance
(Rdc)
(Ω max.)
Insulation
Resistance
(MΩ min.)
ESD
Rank
2.2kV
DLW5ATZ500MQ2L
4.6min 50
50 125
4.0 0.013
10
2
DLW5ATZ500MQ2K
DLW5ATZ500MQ2B
DLW5ATZ151MQ2L
11min 150 3.0 0.020
DLW5ATZ151MQ2K
DLW5ATZ151MQ2B
DLW5ATZ331MQ2L
20min 330 2.5 0.027
DLW5ATZ331MQ2K
DLW5ATZ331MQ2B
DLW5ATZ501MQ2L
35min 500 2.0 0.034
DLW5ATZ501MQ2K
DLW5ATZ501MQ2B
DLW5ATZ112MQ2L
50min 1100 1.5 0.056
DLW5ATZ112MQ2K
DLW5ATZ112MQ2B
· Operating Temperature : - 40 °C to + 105 °C · Storage Temperature : - 40 °C to + 105 °C
4. Standard Testing Conditions
< Unless otherwise specified > < In case of doubt >
Temperature : Ordinary Temp. 15 ºC to 35 °C Temperature : 20 °C ± 2 °C
Humidity : Ordinary Humidity 25 %(RH) to 85 %(RH) Humidity : 60 %(RH) to 70 %(RH)
Atmospheric pressure : 86 kPa to 106 kPa
(6) Impedance (Typ. at 100MHz)
(7) Circuit
(8) Features
(9) Number of Line
(10) Packaging Code L : Taping (φ180mm/reel)
K : Taping (φ330mm/reel)
B : Bulk
Spec. No. JEFL243C-9109D-01 P 2/11
MURATA MFG CO., LTD.
(L)5.0±0.3
(W)3.6±0.3
±0.3
1.3
±0.3
0.9
±0.3
1.3
①②
1.7
±0.3
1.7
±0.3
1.3
±0.3
: Electrode
④
③
0.5
min.
(T)2.20±0.15
0.45
min.
(L)5.0±0.3
(W)3.6±0.3
±0.3
1.3
±0.3
0.9
±0.3
1.3
①②
1.7
±0.3
1.7
±0.3
1.3
±0.3
: Electrode
④
③
0.5
min.
(T)2.20±0.15
0.45
min.
(L)5.0±0.3
(W)3.6±0.3
±0.3
1.3
±0.3
0.9
±0.3
1.3
①②
1.7
±0.3
1.7
±0.3
1.3
±0.3
: Electrode
④
③
0.5
min.
(T)2.20±0.15
0.45
min.
0.45
min.
5. Style and Dimensions
（in: mm）
■ Unit Mass (Typical value)
0.140g
No polarity
6. Marking
No marking.
7. Electrical Performance
No. Item Specifications Test Method
7.1 Impedance
(|Z|) (at 10MHz)
Meet item 3. Measuring Equipment : KEYSIGHT 4191A or the
equivalents.
Measuring Frequency : 10MHz (ref. Item 9.)
7.2 Insulation
Resistance
(I.R.)
Measuring Equipment : R8340A or the equivalents.
Measuring voltage : Rated Voltage
Time : within 60 s (ref. Item 9.)
7.3 DC Resistance
(Rdc)
Measuring Current : 100 mA max. (ref. Item 9.)
(In case of doubt in the above mentioned standard
condition,measure by 4 terminal method.)
7.4 Withstanding
Voltage
Products shall not be damaged. Test Voltage : 2.5 times for Rated Voltage
Time : 1 to 5 seconds
Charge Current : 1 mA max. (ref. Item 9.)
①
④
②
③
■
Equivalent Circuites
Spec. No. JEFL243C-9109D-01 P 3/11
MURATA MFG CO., LTD.
8. Q200 Requirement
7-1. Performance (based on Table 13 for Ferrite EMI SUPPRESSORS/FILTERS)
AEC-Q200 Rev.D issued June 1. 2010
AEC-Q200
Murata Specification / Deviation
No. Stress Test Method
3 High
Temperature
Exposure
1000hours at 105 deg C
Set for 24hours at room temperature,
then measured.
Meet Table A after testing.
Table A
4 Temperature Cycling 1000cycles
-40 deg C to +105 deg C
Set for 24hours at room temperature,
then measured.
Meet Table A after testing.
5 Destructive
Physical Analysis
Per EIA469
No electrical tests
Not Applicable
7 Biased Humidity 1000hours at 85 deg C, 85%RH
Apply max rated voltage and current.
Meet Table A after testing.
Apply rated voltage.
(ref.item 9)
8 Operational Life Apply 105 deg C
1000hours
Set for 24hours at room temperature,
then measured
Meet Table A after testing.
Apply rated current.
(ref.item 9)
9 External Visual Visual inspection No abnormalities
10 Physical Dimension Meet ITEM 5
（Style and Dimensions）
No defects
12 Resistance to
Solvents
Per MIL-STD-202 Method 215 Not Applicable
13 Mechanical Shock
Per MIL-STD-202 Method 213
Conditon F:
1500g’s(14.7N)/0.5ms/
Half sine
Meet Table A after testing.
14 Vibration 5g's(0.049N) for 20 minutes, 12cycles
each of 3 oritentations
Test from 10-2000Hz.
12cycles each of 3 orientations
Meet Table A after testing.
15 Resistance
to Soldering Heat
No-heating
Solder temperature
260C+/-5 deg C
Immersion time 10s
Pre-heating：150C / 60s min.
Meet Table A after testing.
17 ESD
Per AEC-Q200-002 Meet Table A after testing.
ESD Rank: Refer to Item 3. Rating.
18 Solderbility
Per J-STD-002 Method b : Not Applicable
90% of the terminations is to be soldered.
(except partly-exposed wire)
Flux:Ethanol solution of rosin,25(wt)% includes activator
equivalent to 0.06 to 0.10(wt)% chlorine
19 Electrical
Characterization
Measured : Impedance No defects
Appearance No damaged.
Impedance
change
(at 10MHz)
within ± 20%
I.R. 10MΩ min.
Withstanding
Voltage
No damaged.
P1-P3P4-P6P7-P9P10-P11

DLW5ATZ112MQ2L

Mfr. #:
Buy DLW5ATZ112MQ2L
Manufacturer:
Murata Electronics
Description:
Common Mode Chokes / Filters 1.1Kohms@100MHz 1.5A 0.056ohms AEC-Q200
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

Products related to this Datasheet