Test Mil AD10242BZ/TZ
Parameter Temp Level Subgroup Min Typ Max Unit
SPURIOUS-FREE DYNAMIC RANGE
9
Analog Input @ 1.2 MHz 25°CI 81 dBFS
@ 4.85 MHz 25°CI 47080 dBFS
Full II 5, 6 70 79 dBFS
@ 9.9 MHz 25°CI 46370 dBFS
Full II 5, 6 63 69 dBFS
@ 19.5 MHz 25°CI 46067 dBFS
Full II 5, 6 60 66 dBFS
TWO-TONE IMD REJECTION
10
F1, F2 @ –7 dBFS Full II 4, 5, 6 70 76 dBc
CHANNEL-TO-CHANNEL ISOLATION
11
25°CIV12 75 80 dB
TRANSIENT RESPONSE 25°CV 10 ns
LINEARITY
Differential Nonlinearity 25°CIV12 0.3 1.0 LSB
(Encode = 20 MHz) Full IV 12 0.5 1.25 LSB
Integral Nonlinearity 25°CV 0.3
LSB
(
Encode
= 20 MHz) Full V 0.5 LSB
OVERVOLTAGE RECOVERY TIME
12
V
IN
= 2.0 × FS Full IV 12 50 100 ns
V
IN
= 4.0 × FS
Full IV 12 75 200 ns
DIGITAL OUTPUTS
Logic Compatibility CMOS
Logic “1” Voltage
13
Full I 1, 2, 3 3.5 4.2 V
Logic “0” Voltage
14
Full I 1, 2, 3 0.45 0.65 V
Output Coding Twos Complement
POWER SUPPLY
AV
CC
Supply Voltage Full VI 5.0 V
I (AV
CC
) Current Full V 260 mA
AV
EE
Supply Voltage Full VI –5.0 V
I (AV
EE
) Current Full V 55 mA
DV
CC
Supply Voltage Full VI 5.0 V
I (DV
CC
) Current Full V 25 mA
I
CC
(Total) Supply Current Full I 1, 2, 3 350 400 mA
Power Dissipation (Total) Full I 1, 2, 3 1.75 2.0 W
Power Supply Rejection Ratio (PSRR) Full I 7, 8 0.01 0.02 % FSR/% V
S
Pass-Band Ripple to 10 MHz Full IV 12 0.2 dB
NOTES
1
Gain tests are performed on A
IN
3 over specified input voltage range.
2
Input capacitance specifications combine AD9632 die capacitance and ceramic package capacitance.
3
Full power bandwidth is the frequency at which the spectral power of the fundamental frequency (as determined by FFT analysis) is reduced by 3 dB.
4
ENCODE driven by single-ended source; ENCODE bypassed to ground through 0.01 µF capacitor.
5
ENCODE may also be driven differentially in conjunction with ENCODE; see Encoding the AD10242 section for details.
6
Minimum and maximum conversion rates allow for variation in Encode Duty Cycle of 50% ± 5%.
7
Analog Input signal power at –1 dBFS; signal-to-noise ratio (SNR) is the ratio of signal level to total noise (first five harmonics removed). Encode = 40.0 MSPS.
8
Analog Input signal power at –1 dBFS; signal-to-noise and distortion (SINAD) is the ratio of signal level to total noise + harmonics. Encode = 40.0 MSPS.
9
Analog Input signal equals –1 dBFS; SFDR is the ratio of converter full scale to worst spur.
10
Both input tones at –7 dBFS; two-tone intermodulation distortion (IMD) rejection is the ratio of either tone to the worst third order intermod product. f1 = 10.0 MHz
± 100 kHz, 50 kHz f1 – f2 300 kHz.
11
Channel-to-channel isolation tested with A channel grounded and a full-scale signal applied to B channel (A
IN
1).
12
Input driven to 2× and 4× A
IN
1 range for >4 clock cycles. Output recovers in band in specified time with Encode = 40 MSPS. No foldover guaranteed.
13
Outputs are sourcing 10 µA.
14
Outputs are sinking 10 µA.
All specifications guaranteed within 100 ms of initial power-up regardless of sequencing.
Specifications subject to change without notice.
AD10242
–3–
REV. D
AD10242
–4–
ABSOLUTE MAXIMUM RATINGS
1
Parameter Min Max Unit
ELECTRICAL
V
CC
Voltage 0 7 V
V
EE
Voltage –7 0 V
Analog Input Voltage V
EE
V
CC
V
Analog Input Current –10 +10 mA
Digital Input Voltage (ENCODE) 0 V
CC
V
ENCODE, ENCODE Differential Voltage 4 V
Digital Output Current –40 +40 mA
ENVIRONMENTAL
2
Operating Temperature (Case) –55 +125 °C
Maximum Junction Temperature 175 °C
Lead Temperature (Soldering, 10 sec) 300 °C
Storage Temperature Range (Ambient) –65 +150 °C
NOTES
1
Absolute maximum ratings are limiting values to be applied individually, and beyond
which the serviceability of the circuit may be impaired. Functional operability is not
necessarily implied. Exposure to absolute maximum rating conditions for an
extended period of time may affect device reliability.
2
Typical thermal impedances for ES-68-1 package: θ
JC
= 11° C/W; θ
JA
= 30° C/W.
Table I. Output Coding
MSB LSB Base 10 Input
0111111111111 2047 +FS
0000000000001 +1
0000000000000 0 0.0 V
1111111111111 –1, 4095
1000000000000 –2047, 2048 –FS
EXPLANATION OF TEST LEVELS
Test Level
I–100% Production Tested.
II 100% production tested at 25°C, and sample tested at
specified temperatures. AC testing done on sample basis.
III Sample Tested Only.
IV Parameter is guaranteed by design and characterization
testing.
V–Parameter is a typical value only.
VI All devices are 100% production tested at 25°C; sample
tested at temperature extremes.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the AD10242 features proprietary ESD protection circuitry, permanent damage may occur on
devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
REV. D
AD10242
–5–
10
11
12
13
14
15
16
17
18
19
20
22
23
24
25
26
21
27 4328 29 30 31 32 33 34 35 36 37 38 39 40 41 42
9618765 676665 64 63 62432168
PIN 1
IDENTIFIER
TOP VIEW
(Not to Scale)
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
NC = NO CONNECT
AD10242
GNDA
GNDA
UPOSA
AV
EE
AV
CC
NC
NC
(LSB) D0A
D1A
D2A
D3A
D4A
D5A
D6A
D7A
D8A
GNDA
GNDA
ENCODEA
ENCODEA
DV
CC
D9A
D10A
(MSB) D11A
NC
NC
(LSB) D0B
D1B
D2B
D3B
D4B
D5B
D6B
GNDB
GNDB
GNDB
GNDB
UPOSB
UNEGB
UCOMB
GNDB
GNDB
ENCODEB
ENCODEB
DV
CC
D11B (MSB)
D10B
D9B
D8B
D7B
GNDB
GNDA
A
IN
A3
A
IN
A2
A
IN
A1
GNDA
UCOMA
UNEGA
GNDA
SHIELD
GNDB
AV
EE
AV
CC
GNDB
A
IN
B3
A
IN
B2
A
IN
B1
GNDB
PIN CONFIGURATION
68-Lead Ceramic Leaded Chip Carrier
PIN FUNCTION DESCRIPTIONS
Pin No. Mnemonic Function
1 SHIELD Internal Ground Shield between Channels.
2, 5, 9–11, 26–27 GNDA A Channel Ground. A and B grounds should be connected as close to the device as possible.
3 UNEGA Unipolar Negative.
4 UCOMA Unipolar Common.
6A
IN
A1 Analog Input for A Side ADC (Nominally ± 0.5 V).
7A
IN
A2 Analog Input for A Side ADC (Nominally ± 1.0 V).
8A
IN
A3 Analog Input for A Side ADC (Nominally ± 2.0 V).
12 UPOSA Unipolar Positive.
13 AV
EE
Analog Negative Supply Voltage (Nominally –5.0 V or –5.2 V).
14 AV
CC
Analog Positive Supply Voltage (Nominally 5.0 V).
15, 16, 34, 35 NC No Connect.
17–25, 31–33 D0A–D11A Digital Outputs for ADC A. (D0 LSB.)
28 ENCODEA ENCODE is the complement of ENCODE.
29 ENCODEA Data conversion is initiated on the rising edge of the ENCODE input.
30, 50 DV
CC
Digital Positive Supply Voltage (Nominally 5.0 V).
36–42, 45–49 D0B–D11B Digital Outputs for ADC B. (D0 LSB.)
43–44, 53–54, GNDB B Channel Ground. A and B grounds should be connected as close to the device
58–61, 65, 68 as possible.
51 ENCODEB Data conversion is initiated on the rising edge of the ENCODE input.
52 ENCODEB ENCODE is the complement of ENCODE.
55 UCOMB Unipolar Common.
56 UNEGB Unipolar Negative.
57 UPOSB Unipolar Positive.
62 A
IN
B1 Analog Input for B Side ADC (Nominally ± 0.5 V).
63 A
IN
B2 Analog Input for B Side ADC (Nominally ± 1.0 V).
64 A
IN
B3 Analog Input for B Side ADC (Nominally ± 2.0 V).
66 AV
CC
Analog Positive Supply Voltage (Nominally 5.0 V).
67 AV
EE
Analog Negative Supply Voltage (Nominally –5.0 V or –5.2 V).
REV. D

AD10242TZ

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Analog to Digital Converters - ADC IC Dual 12-Bit 41MSPS MCM
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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