CAT28C64B
3
Doc. No. MD-1011, Rev. I
© 2009 SCILLC. All rights reserved.
Characteristics subject to change without notice
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias ................. –55°C to +125°C
Storage Temperature....................... –65°C to +150°C
Voltage on Any Pin with
Respect to Ground
(2)
........... –2.0V to +V
CC
+ 2.0V
V
CC
with Respect to Ground ............... –2.0V to +7.0V
Package Power Dissipation
Capability (Ta = 25°C)................................... 1.0W
Lead Soldering Temperature (10 secs) ............ 300°C
Output Short Circuit Current
(3)
........................ 100 mA
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation
of the device at these or any other conditions outside of
those listed in the operational sections of this specifica-
tion is not implied. Exposure to any absolute maximum
rating for extended periods may affect device perfor-
mance and reliability.
RELIABILITY CHARACTERISTICS
Symbol Parameter Min. Max. Units Test Method
N
END
(1)
Endurance 10
5
Cycles/Byte MIL-STD-883, Test Method 1033
T
DR
(1)
Data Retention 100 Years MIL-STD-883, Test Method 1008
V
ZAP
(1)
ESD Susceptibility 2000 Volts MIL-STD-883, Test Method 3015
I
LTH
(1)(4)
Latch-Up 100 mA JEDEC Standard 17
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is V
CC
+0.5V, which may overshoot to V
CC
+2.0V for periods of less than 20 ns.
(3) Output shorted for no more than one second. No more than one output shorted at a time.
(4) Latch-up protection is provided for stresses up to 100mA on address and data pins from –1V to V
CC
+1V.
MODE SELECTION
Mode CE WE OE I/O Power
Read L H L D
OUT
ACTIVE
Byte Write (WE Controlled) L H D
IN
ACTIVE
Byte Write (CE Controlled) L H D
IN
ACTIVE
Standby, and Write Inhibit H X X High-Z STANDBY
Read and Write Inhibit X H H High-Z ACTIVE
CAPACITANCE T
A
= 25°C, f = 1.0 MHz, V
CC
= 5V
Symbol Test Max. Units Conditions
C
I/O
(1)
Input/Output Capacitance 10 pF V
I/O
= 0V
C
IN
(1)
Input Capacitance 6 pF V
IN
= 0V