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ADM13307-33ARZ

P1-P3P4-P6P7-P9P10-P12P13-P13
ADM13307
Rev. 0 | Page 3 of 12
SPECIFICATIONS
V
DD
= 2.0 V to 5.5 V, −40°C ≤ T
A
≤ +85°C, unless otherwise noted.
Table 1. ADM13307-18, ADM13307-25, and ADM13307-33
Parameter Min Typ Max Unit Test Conditions/Comments
OPERATING VOLTAGE RANGE, V
DD
2.0 5.5 V
SUPPLY CURRENT, I
DD
40 μA
INPUT CAPACITANCE, C
I
10 pF V
I
= 0 V to V
DD
RESET, RESET Output
High Level Output Voltage, V
OH
V
DD
− 0.2 V I
OH
= −20 μA
V
DD
− 0.4 V I
OH
= −2 mA, V
DD
= 3.3 V
V
DD
− 0.4 V I
OH
= −3 mA, V
DD
= 5.5 V
Low Level Output Voltage, V
OL
0.2 V I
OL
= 20 μA
0.4 V I
OL
= 2 mA, V
DD
= 3.3 V
0.4 V I
OL
= 3 mA, V
DD
= 5.5 V
Power-Up Reset Voltage
1
0.4 V I
OL
= 20 μA, V
DD
≥ 1.1 V
SENSE INPUTS
Falling Input Threshold Voltage, V
IT−
1.22 1.25 1.28 V T
A
= 0°C to 85°C
1.64 1.68 1.72 V T
A
= 0°C to 85°C
2.20 2.25 2.30 V T
A
= 0°C to 85°C
2.86 2.93 3.00 V T
A
= 0°C to 85°C
4.46 4.55 4.64 V T
A
= 0°C to 85°C
1.22 1.25 1.29 V T
A
= −40°C to +85°C
1.64 1.68 1.73 V T
A
= −40°C to +85°C
2.20 2.25 2.32 V T
A
= −40°C to +85°C
2.86 2.93 3.02 V T
A
= −40°C to +85°C
4.46 4.55 4.67 V T
A
= −40°C to +85°C
Hysteresis at SENSEv Inputs, V
HYS
10 mV V
IT−
= 1.25 V
15 mV V
IT−
= 1.68 V
20 mV V
IT−
= 2.25 V
30 mV V
IT−
= 2.93 V
40 mV V
IT−
= 4.55 V
INPUT VOLTAGE AT
MR
High Level, V
IH
0.7 × V
DD
V
Low Level, V
IL
0.3 × V
DD
V
INPUT TRANSITION RISE AND FALL RATE AT MR
50 ns/V
HIGH LEVEL INPUT CURRENT, I
H
MR
−130 −180 μA
MR = 0.7 × V
DD
, V
DD
= 5.5 V
SENSE1 5 8 μA SENSE1 = V
DD
= 5.5 V
SENSE2 6 9 μA SENSE2 = V
DD
= 5.5 V
SENSE3 −25 +25 nA SENSE3 = V
DD
LOW LEVEL INPUT CURRENT, I
L
MR
−430 −600 μA
MR = 0 V, V
DD
= 5.5 V
SENSEv −25 +25 nA SENSE1, SENSE2, SENSE3 = 0 V
1
The lowest supply voltage at which
RESET
becomes active. t
r
, V
DD
≥ 15 μs/V.
ADM13307
Rev. 0 | Page 4 of 12
V
DD
= 2.0 V to 5.5 V, −40°C ≤ T
A
≤ +85°C, unless otherwise noted.
Table 2. ADM13307-4 and ADM13307-5
Parameter Min Typ Max Unit Test Conditions/Comments
OPERATING VOLTAGE RANGE, V
DD
2.0 5.5 V
SUPPLY CURRENT, I
DD
40 μA
INPUT CAPACITANCE, C
I
10 pF V
I
= 0 V to V
DD
RESET, RESET Output
High Level Output Voltage, V
OH
V
DD
− 0.2 V I
OH
= −20 μA
V
DD
− 0.4 V I
OH
= −2 mA, V
DD
= 3.3 V
V
DD
− 0.4 V I
OH
= −3 mA, V
DD
= 5.5 V
Low Level Output Voltage, V
OL
0.2 V I
OL
= 20 μA
0.4 V I
OL
= 2 mA, V
DD
= 3.3 V
0.4 V I
OL
= 3 mA, V
DD
= 5.5 V
Power-Up Reset Voltage
1
0.4 V I
OL
= 20 μA, V
DD
≥ 1.1 V
SENSE INPUTS
Falling Input Threshold Voltage, V
IT−
0.5946 0.6 0.6048 V T
A
= −40°C to +85°C
0.5952 0.6 0.6048 V T
A
= −40°C to +85°C, 2.35 V ≤ V
DD
≤ 5.5 V
2.23 2.25 2.29 V T
A
= −40°C to +85°C
2.90 2.93 2.98 V T
A
= −40°C to +85°C
Hysteresis at SENSEv Inputs, V
HYS
0 mV V
IT−
= 0.6 V
20 mV V
IT−
= 2.25 V
30 mV V
IT−
= 2.93 V
INPUT VOLTAGE AT
MR
High Level, V
IH
0.7 × V
DD
V
Low Level, V
IL
0.3 × V
DD
V
INPUT TRANSITION RISE AND FALL RATE AT MR
50 ns/V
HIGH LEVEL INPUT CURRENT, I
H
MR
−130 −180 μA
MR
= 0.7 × V
DD
, V
DD
= 5.5 V
SENSE1 5 8 μA SENSE1 = V
DD
= 5.5 V
SENSE2 −50 +50 nA SENSE2 = V
DD
= 5.5 V
SENSE3 −25 +25 nA SENSE3 = V
DD
LOW LEVEL INPUT CURRENT, I
L
MR
−430 −600 μA
MR
= 0 V, V
DD
= 5.5 V
SENSEv −25 +25 nA SENSE1, SENSE2, SENSE3 = 0 V
1
The lowest supply voltage at which
RESET
becomes active. t
r
, V
DD
≥ 15 μs/V.
ADM13307
Rev. 0 | Page 5 of 12
TIMING REQUIREMENTS
V
DD
= 2.0 V to 5.5 V, R
L
= 1 MΩ, C
L
= 50 pF, T
A
= 25°C.
Table 3. ADM13307-18, ADM13307-25 and ADM13307-33
Parameter Min Typ Max Unit Test Conditions/Comments
Pulse Width (t
w
)
SENSEv 6 μs V
SENSEvL
= V
IT−
− 0.3 V, V
SENSEvH
= V
IT+
+ 0.3 V
MR
100 ns V
IH
= 0.7 × V
DD
, V
IL
= 0.3 × V
DD
Table 4. ADM13307-4 and ADM13307-5
Parameter Min Typ Max Unit Test Conditions/Comments
Pulse Width (t
w
)
SENSEv 30 μs V
SENSEvL
= V
IT−
− 0.3 V, V
SENSEvH
= V
IT+
+ 0.3 V
MR
100 ns V
IH
= 0.7 × V
DD
, V
IL
= 0.3 × V
DD
SWITCHING CHARACTERISTICS
V
DD
= 2.0 V to 5.5 V, R
L
= 1 MΩ, C
L
= 50 pF, T
A
= 25°C
Table 5. ADM13307-18, ADM13307-25 and ADM13307-33
Parameter Min Typ Max Unit Test Conditions/Comments
Delay Time (t
d
) 140 200 280 ms
V
I(SENSEv)
≥ V
IT+
+ 0.2 V, MR ≥ 0.7 × V
DD
Propagation Delay, High-to-Low, MR to RESET
1
/RESET (t
PHL
)
200 500 ns V
I(SENSEv)
≥ V
IT+
+ 0.2 V, V
IH
≥ 0.7 × V
DD
, V
IL
≥ 0.3 × V
DD
Propagation Delay, Low-to-High, MR to RESET/RESET
1
(t
PLH
)
200 500 ns V
I(SENSEv)
≥ V
IT+
+ 0.2 V, V
IH
≥ 0.7 × V
DD
, V
IL
≥ 0.3 × V
DD
Propagation Delay, High-to-Low, SENSEv to RESET
1
/RESET (t
PHL
)
1 5 μs
V
IH
= V
IT+
+ 0.3 V, V
IL
= V
IT−
− 0.3 V, MR ≥ 0.7 × V
DD
Propagation Delay, Low-to-High, SENSEv to RESET/RESET
1
(t
PLH
)
1 5 μs
V
IH
= V
IT+
+ 0.3 V, V
IL
= V
IT−
− 0.3 V, MR ≥ 0.7 × V
DD
1
The reset timeout delay of 200 ms masks the propagation delay
Table 6. ADM13307-4 and ADM13307-5
Parameter Min Typ Max Unit Test Conditions/Comments
Delay Time (t
d
) 140 200 280 ms
V
I(SENSEv)
≥ V
IT+
+ 0.2 V, MR ≥ 0.7 × V
DD
Propagation Delay, High-to-Low, MR to RESET
1
/RESET (t
PHL
)
200 500 ns V
I(SENSEv)
≥ V
IT+
+ 0.2 V, V
IH
≥ 0.7 × V
DD
, V
IL
≥ 0.3 × V
DD
Propagation Delay, Low-to-High, MR to RESET/RESET
1
(t
PLH
)
200 500 ns V
I(SENSEv)
≥ V
IT+
+ 0.2 V, V
IH
≥ 0.7 × V
DD
, V
IL
≥ 0.3 × V
DD
Propagation Delay, High-to-Low, SENSEv to RESET
1
/RESET (t
PHL
)
30 μs
V
IH
= V
IT+
+ 0.3 V, V
IL
= V
IT−
− 0.3 V, MR ≥ 0.7 × V
DD
Propagation Delay, Low-to-High, SENSEv to RESET/RESET
1
(t
PLH
)
30 μs
V
IH
= V
IT+
+ 0.3 V, V
IL
= V
IT−
− 0.3 V, MR ≥ 0.7 × V
DD
1
The reset timeout delay of 200 ms masks the propagation delay.
FUNCTIONAL TRUTH TABLE
Table 7.
MR
SENSE1 > V
IT1
SENSE2 > V
IT2
SENSE3 > V
IT3
RESET
RESET
L X
1
X
1
X
1
L H
H 0 0 0 L H
H 0 0 1 L H
H 0 1 0 L H
H 0 1 1 L H
H 1 0 0 L H
H 1 0 1 L H
H 1 1 0 L H
H 1 1 1 H L
1
X = don’t care.
P1-P3P4-P6P7-P9P10-P12P13-P13

ADM13307-33ARZ

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Manufacturer:
Analog Devices Inc.
Description:
Supervisory Circuits Tiple Processor
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