24LC16B
DS20002213B-page 2 2009-2016 Microchip Technology Inc.
1.0 ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings
(†)
VCC.............................................................................................................................................................................6.5V
All inputs and outputs w.r.t. V
SS ......................................................................................................... -0.3V to VCC +1.0V
Storage temperature ...............................................................................................................................-65°C to +150°C
Ambient temperature with power applied................................................................................................-55°C to +125°C
ESD protection on all pins 4kV
TABLE 1-1: DC CHARACTERISTICS
† NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at those or any other conditions above those
indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability.
DC CHARACTERISTICS
Extended (M): T
A = -55°C to +125°C, VCC = +2.5V to +5.5V
Param.
No.
Symbol Characteristic Min. Typ.
(2)
Max. Units Conditions
D1 V
IH High-Level Input Voltage 0.7 VCC ——V
D2 VIL Low-Level Input Voltage — — 0.3 VCC V
D3 V
HYS Hysteresis of Schmitt
Trigger Inputs
0.05 VCC ——VNote 1
D4 V
OL Low-Level Output Voltage — — 0.40 V IOL = 3.0 mA, VCC =2.5V
D5 I
LI Input Leakage Current — — ±1 µA VIN =VSS or VCC
D6 ILO Output Leakage Current — — ±1 µA VOUT = VSS or VCC
D7 CIN Pin Capacitance
(all inputs/outputs)
— — 10 pF VCC = 5.0V (Note 1)
T
A = 25°C, FCLK =1MHz
C
OUT
D8 ICCWRITE Operating current — — 3 mA VCC = 5.5V, SCL = 400 kHz
D9 ICCREAD —0.011mA
D10 I
CCS Standby Current — — 1 µA +85°C, SDA = SCL = VCC
WP = VSS
— — 5 µA +125°C, SDA = SCL = VCC
WP = VSS
Note 1: This parameter is periodically sampled and not 100% tested.
2: Typical measurements taken at room temperature.