ADM488/ADM489
Rev. D | Page 10 of 16
10
0%
100
90
10dB/DI
V
500kHz/DIV05MHz
0
0079-016
Figure 21. Driver Output Waveform and FFT Plot Transmitting at 150 kHz
80
70
60
50
40
30
20
10
0
FREQUENCY (MHz)
dB (µV)
30 200
LIMIT
00079-017
Figure 22. Radiated Emissions
0.3 0.6 161030
80
0
70
40
30
20
10
60
50
LIMIT
log FREQUENCY (0.15–30) (MHz)
dB (µV)
3
00079-018
Figure 23. Conducted Emissions
ADM488/ADM489
Rev. D | Page 11 of 16
THEORY OF OPERATION
The ADM488/ADM489 are ruggedized RS-485 transceivers
that operate from a single 5 V supply. They contain protection
against radiated and conducted interference and are ideally
suited for operation in electrically harsh environments or where
cables can be plugged/unplugged. They are also immune to
high RF field strengths without special shielding precautions.
They are intended for balanced data transmission and comply
with both EIA RS-485 and RS-422 standards. They contain a
differential line driver and a differential line receiver, and are
suitable for full-duplex data transmission.
The input impedance on the ADM488/ADM489 is 12 kΩ,
allowing up to 32 transceivers on the differential bus. The
ADM488/ADM489 operate from a single 5 V ± 10% power
supply. A thermal shutdown circuit prevents excessive power
dissipation caused by bus contention or by output shorting.
This feature forces the driver output into a high impedance state
if, during fault conditions, a significant temperature increase is
detected in the internal driver circuitry.
The receiver contains a fail-safe feature that results in a logic
high output state if the inputs are unconnected (floating). A
high level of robustness is achieved using internal protection
circuitry, eliminating the need for external protection com-
ponents such as tranzorbs or surge suppressors. Furthermore,
low electromagnetic emissions are achieved using slew limited
drivers, minimizing interference both conducted and radiated.
The ADM488/ADM489 can transmit at data rates up to
250 kbps. A typical application for the ADM488/ADM489 is
illustrated in
Figure 24 showing a full-duplex link where data is
transferred at rates of up to 250 kbps. A terminating resistor is
shown at both ends of the link. This termination is not critical
because the slew rate is controlled by the ADM488/ADM489
and reflections are minimized.
ADM488
D
RO
DI
A
B
Z
Y
DE
5
V
0.1µF
RS-485/RS-422 LINK
R
R
ADM489
5
V
0.1µF
D
RO
DI
DE
GNDGND
V
CC
V
CC
A
B
Z
Y
RE
RE
00079-024
Figure 24. ADM488/ADM489 Full-Duplex Data Link
The communications network can be extended to include
multipoint connections, as shown in Figure 30. As many as
32 transceivers can be connected to the bus.
Table 6 and Table 7 show the truth tables for transmitting and
receiving.
Table 6. Transmitting Truth Table
Inputs Outputs
RE
DE DI Z Y
X
1
1 1 0 1
X
1
1 0 1 0
0 0 X
1
Hi-Z Hi-Z
1 0 X
1
Hi-Z Hi-Z
1
X = Don’t care.
Table 7. Receiving Truth Table
Inputs Output
RE
DE A to B RO
0 0 +0.2 V 1
0 0
0.2 V
0
0 0 Inputs O/C 1
1 0 X
1
Hi-Z
1
X = Don’t care.
EFT TRANSIENT PROTECTION SCHEME
The ADM488/ADM489 use protective clamping structures on
their inputs and outputs that clamp the voltage to a safe level
and dissipate the energy present in ESD (electrostatic) and EFT
(electrical fast transients) discharges.
FAST TRANSIENT BURST IMMUNITY (IEC1000-4-4)
IEC1000-4-4 (previously 801-4) covers electrical fast transient
burst (EFT) immunity. Electrical fast transients occur as a result
of arcing contacts in switches and relays. The tests simulate the
interference generated when, for example, a power relay disconnects
an inductive load. A spark is generated due to the well known
back EMF effect. In fact, the spark consists of a burst of sparks
as the relay contacts separate. The voltage appearing on the line,
therefore, consists of a burst of extremely fast transient impulses.
A similar effect occurs when switching on fluorescent lights.
The fast transient burst test, defined in IEC1000-4-4, simulates
this arcing, and its waveform is illustrated in
Figure 25. It
consists of a burst of 2.5 kHz to 5 kHz transients repeating at
300 ms intervals. It is specified for both power and data lines.
Four severity levels are defined in terms of an open-circuit voltage
as a function of installation environment. The installation
environments are defined as
Well protected
Protected
Typical industrial
Severe industrial
ADM488/ADM489
Rev. D | Page 12 of 16
300ms
16ms
V
t
V
0.2/0.4ms
t
5ns
50ns
00079-025
Figure 25. IEC1000-4-4 Fast Transient Waveform
Table 8 shows the peak voltages for each of the environments.
Table 8. Peak Voltages
Level V
PEAK
(kV) PSU V
PEAK
(kV) I/O
1 0.5 0.25
2 1 0.5
3 2 1
4 4 2
A simplified circuit diagram of the actual EFT generator is
shown in
Figure 26.
These transients are coupled onto the signal lines using an EFT
coupling clamp. The clamp is 1 m long and completely sur-
rounds the cable, providing maximum coupling capacitance
(50 pF to 200 pF typical) between the clamp and the cable. High
energy transients are capacitively coupled onto the signal lines.
Fast rise times (5 ns), as specified by the standard, result in very
effective coupling. This test is very severe because high voltages
are coupled onto the signal lines. The repetitive transients often
cause problems, while single pulses do not. Destructive latch-up
can be induced due to the high energy content of the transients.
Note that this stress is applied while the interface products are
powered up and transmitting data. The EFT test applies hun-
dreds of pulses with higher energy than ESD. Worst-case
transient current on an I/O line can be as high as 40 A.
R
C
C
C
Z
S
L
R
M
C
D
HIGH
VOLTAGE
SOURCE
50
OUTPUT
00079-026
Figure 26. EFT Generator
Test results are classified according to the following:
Normal performance within specification limits.
Temporary degradation or loss of performance that is self-
recoverable.
Temporary degradation or loss of function or performance
that requires operator intervention or system reset.
Degradation or loss of function that is not recoverable due
to damage.
The ADM488/ADM489 have been tested under worst-case
conditions using unshielded cables, and meet Classification 2 at
Severity Level 4. Data transmission during the transient
condition is corrupted, but it can be resumed immediately
following the EFT event without user intervention.
RADIATED IMMUNITY (IEC1000-4-3)
IEC1000-4-3 (previously IEC801-3) describes the measurement
method and defines the levels of immunity to radiated electro-
magnetic fields. It was originally intended to simulate the
electromagnetic fields generated by portable radio transceivers
or any other device that generates continuous wave-radiated
electromagnetic energy. Its scope has been broadened to include
spurious EM energy, which can be radiated from fluorescent
lights, thyristor drives, inductive loads, and so on.
Testing for immunity involves irradiating the device with an
EM field. Test methods include the use of anechoic chamber,
stripline cell, TEM cell, and GTEM cell. These consist of two
parallel plates with an electric field developed between them.
The device under test is placed between the plates and exposed
to the electric field. The three severity levels have field strengths
ranging from 1 V/m to 10 V/m. Results are classified as follows:
Normal operation.
Temporary degradation or loss of function that is self-
recoverable when the interfering signal is removed.
Temporary degradation or loss of function that requires
operator intervention or system reset when the interfering
signal is removed.
Degradation or loss of function that is not recoverable due
to damage.

ADM489ARUZ-REEL7

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
RS-422/RS-485 Interface IC Full Duplex,RS-485 Transceiver I.C.
Lifecycle:
New from this manufacturer.
Delivery:
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