3.2X2.8mm SMD LED WITH CERAMIC SUBSTRATE
SPEC NO: DSAI6844 REV NO: V.7 DATE: APR/13/2011 PAGE: 10 OF 10
APPROVED: WYNEC CHECKED: Allen Liu DRAWN: J.Yu ERP:1212000022
Reliability Test Items And Conditions
The reliability of products shall be satisfied with items listed below
Lot Tolerance Percent Defective (LTPD) : 10%
No. Test Item Standards Test Condition
Test Times /
Cycles
Number of
Damaged
1 Continuous operating test -
Ta =25°C +10/-5°C ,RH=55+/-20%RH
IF = maximum rated current*
1,000 h 0 / 22
2 High Temp. operating test -
Ta = 100°C(+/-10°C)
IF = maximum rated current*
1,000 h 0 / 22
3 Low Temp. operating test -
Ta = -40°C+3/-5°C
IF = maximum rated current*
1,000 h 0 / 22
4 High temp. storage test
JEITA ED-
4701/200 201
Ta = 100°C(+/-10°C)
Ta = maximum rated storage temperature
1,000 h 0 / 22
5 Low temp. storage test
JEITA ED-
4701/200 202
Ta = -40°C+3/-5°C 1,000 h 0 / 22
6 High temp. & humidity storage test
JEITA ED-
4701/100 103
Ta = 60°C+5/-3°C, RH = 90+5/-10%RH 1,000 h 0 / 22
7
High temp. & humidity operating
test
-
Ta = 60°C+5/-3°C, RH = 90%+5/-10%RH
IF = maximum rated current*
500h 0 / 22
8
Resistance to Soldering Heat
(Reflow Soldering)
JEITA ED-
4701/300 301
Tsld=260°C,10sec 2 times 0 / 22
9
Solderability
(Reflow Soldering)
JEITA ED-
4701/300 303
Tsld=245°C+/-5°C,5+/-1sec
1 time over
95%
0 / 22
11 Temperature Cycle
JEITA ED-
4701/100 105
-40°C(30min) ~25°C(5min)~-100°C
(30min) ~25°C(5min)
100cycles 0 / 22
12 Thermal shock test
MIL-STD-
202G
Ta = -40°C(15min) ~100°C(15min) 500 cycles 0 / 22
13 Electric Static Discharge (ESD)
JEITA ED-
4701/300 304
C = 100pF , R= 1.5KΩ V = 250V
3 times
Negative/
Positive
0 / 22
* : Refer to forward current vs. derating curve diagram
.
14 Vibration test
JEITA ED-
4701/400 403
100~2000~100HZ Sweep 4min.
200m/s²
3directions,4cycles
48min. 0 / 22
10 Temperature Cycle operating test -
-40°C(30min) ~25°C(5min)~-100°C
(30min) ~25°C(5min)
IF = derated current at 100°C
10cycles 0 / 22
Symbol Test Conditions
Criteria for Judgement
Min. Max.
Forward Voltage VF IF = 350mA - Initial Level x 1.1
Luminous Flux Φv IF = 350mA Initial Level x 0.7 -
Item
Criteria For Judging Damage
* : The test is performed after the board is cooled down to the room temperature.
