P5P2304AF-1H08SR

ASM5P2304A
http://onsemi.com
4
Table 4. OPERATING CONDITIONS
Parameter
Description
Min Max Unit
V
DD
Supply Voltage
3.0
3.6
V
T
A
Operating Temperature
(Ambient Temperature)
Commercial temperature 0 70
°C
Industrial temperature 40 85
C
L
Load Capacitance, below 100 MHz
30
pF
C
L
Load Capacitance, from 100 MHz to 133 MHz
15
pF
C
IN
Input Capacitance (Note 3)
7
pF
3. Applies to both Ref Clock and FBK.
Table 5. ELECTRICAL CHARACTERISTICS
Parameter
Description
Test
Conditions
Min
Max
Unit
V
IL
Input LOW Voltage
0.8
V
V
IH
Input HIGH Voltage
2.2
V
I
IL
Input LOW Current V
IN
= 0 V
50
!!
A
I
IH
Input HIGH Current
V
IN
= V
DD
100
!!
A
V
OL
Output LOW Voltage (Note 4)
I
OL
= 8 mA (1, 2)
I
OL
= 12 mA (1H, 2H)
0.4
V
V
OH
Output HIGH Voltage (Note 4) I
OH
= 8 mA (1, 2)
I
OH
= 12 mA (1H, 2H)
2.4
V
I
DD
Supply Current Unloaded outputs @ 100 MHz
Commercial temp.
35
mA
Industrial temp.
40
Unloaded outputs @ 66 MHz,
(1, 1H, 2, 2H)
Commercial temp.
25
Industrial temp.
30
Unloaded outputs @ 33 MHz,
(1, 1H, 2, 2H)
Commercial temp.
16
Industrial temp.
20
4. Parameter is guaranteed by design and characterization. Not 100% tested in production.
ASM5P2304A
http://onsemi.com
5
Table 6. SWITCHING CHARACTERISTICS (Notes 5, 6)
Parameter Test
Conditions
Min Typ Max Unit
Output Frequency
30 pF load
(1, 1H) devices
10
100
MHz
(2, 2H) devices 12
100
15 pF load
(1, 1H) devices 10
133
(2, 2H) devices
12
133
Duty Cycle (Note 7)
(1, 2, 1H, 2H)
Measured at 1.4 V,
F
OUT
< 66.66 MHz, 30 pF load
40 50 60 %
Duty Cycle (Note 7)
(1, 2,1H, 2H)
Measured at 1.4 V,
F
OUT
50 MHz, 15 pF load
45 50 55 %
Output Rise Time (Note 7)
(1, 2)
Measured between 0.8 V
and 2.0 V, 30 pF load
Commercial temp.
2.2
nS
Industrial temp.
2.5
Output Rise Time (Note 7)
(1H, 2H)
Measured between 0.8 V
and 2.0 V, 30 pF load
Commercial temp.,
Industrial temp.
1.5
2
nS
Output Rise Time (Note 7)
(1, 2)
Measured between 0.8 V
and 2.0 V, 15 pF load
1.5
nS
Output Fall Time (Note 7)
(1, 2)
Measured between 2.0 V
and 0.8 V, 30 pF load
Commercial temp.
2.2
nS
Industrial temp.
2.5
Output Fall Time (Note 7)
(1H, 2H)
Measured between 2.0 V
and 0.8 V, 30 pF load
Commercial temp.,
Industrial temp.
1.25 1.5 nS
Output Fall Time (Note 7)
(1, 2)
Measured between 2.0 V
and 0.8 V, 15 pF load
1.5 nS
Outputtooutput skew on same bank
(1, 1H, 2, 2H) (Note 7)
All outputs equally loaded
200
pS
Output bank A to output bank B
skew (1, 1H)
All outputs equally loaded
200
Output bank A to output Bank B
skew (2, 2H) (Note 7)
All outputs equally loaded
400
Delay, REF Rising Edge to FBK
Rising Edge (Note 7)
Measured at V
DD
/2
0 ±250 pS
DevicetoDevice Skew (Note 7)
Measured at V
DD
/2 on the FBK pins of the device
0 500 pS
CycletoCycle Jitter
(Note 7)
(1, 1H)
Measured at 66.67 MHz, loaded outputs, 15 pF load
180
pS
Measured at 66.67 MHz, loaded outputs, 30 pF load
200
Measured at 133 MHz, loaded outputs, 15 pF load
125
(2, 2H)
Measured at 66.67 MHz, loaded outputs, 15 pF load
380
Measured at 66.67 MHz, loaded outputs, 30 pF load
400
PLL Lock Time (Note 7) Stable power supply, valid clock presented on
REF and FBK pins
1.0 mS
5. For all measurements use Test Circuit #1.
6. All parameters are specified at Commercial and Industrial temperature unless stated otherwise.
7. Parameter is guaranteed by design and characterization. Not 100% tested in production.
ASM5P2304A
http://onsemi.com
6
Switching Waveforms
t
1
t
2
1.4 V 1.4 V 1.4 V
OUTPUT
Figure 3. Duty Cycle Timing
2
V
0.8
V
2 V
0.8 V
VDD
OUTPUT
0
V
t
3
t
4
Figure 4. All Outputs Rise/Fall
T
ime
1.4 V
OUTPUT
1.4
V
OUTPUT
t
5
Figure 5. OutputOutput Skew
V
DD
/2
INPUT
FBK
V
DD
/2
t
6
Figure 6. InputOutput Propagation Delay
V
DD
/2
FBK, Device1
FBK, Device2
V
DD
/2
t
7
Figure 7. DeviceDevice Skew
+3.3
V
TEST CIRCUIT #1
V
DD
FBK
22 Q
CLK A / CLK B
C
LOAD
0.1
!!
F
ASM5P2304A
GND
22 Q
CLK A / CLK B
C
LOAD
Figure 8. Test
Circuit

P5P2304AF-1H08SR

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
IC BUFFER ZERO DELAY 3.3V 8-SOIC
Lifecycle:
New from this manufacturer.
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