W158
..... Document #: 38-07164 Rev. *A Page Page 7 of 12 of 12
Absolute Maximum Ratings
[29]
Stresses greater than those listed in this table may cause
permanent damage to the device. These represent a stress
rating only. Operation of the device at these or any other condi-
tions above those specified in the operating sections of this
specification is not implied. Maximum conditions for extended
periods may affect reliability.
.
Parameter Description Rating Unit
V
DD
, V
IN
Voltage on any pin with respect to GND –0.5 to +7.0 V
T
STG
Storage Temperature –65 to +150 °C
T
A
Operating Temperature 0 to +70 °C
T
B
Ambient Temperature under Bias –55 to +125 °C
ESD
PROT
Input ESD Protection 2 (min.) kV
DC Electrical Characteristics: T
A
= 0°C to +70°C, V
DDQ3
= 3.3V±5%, V
DDQ2
= 2.5V±5%
Parameter Description Test Condition Min. Typ. Max. Unit
Supply Current
I
DD-3.3V
Combined 3.3V Supply Current CPU0:3 =133 MHz
[30]
160 mA
I
DD-2.5
Combined 2.5V Supply Current CPU0:3 =133 MHz
[30]
90 mA
Logic Inputs (All referenced to V
DDQ3
= 3.3V)
V
IL
Input Low Voltage GND
–0.3
0.8 V
V
IH
Input High Voltage 2.0 VDD+
0.3
V
I
IL
Input Low Current
[31]
–25 µA
I
IH
Input High Current
[31]
10 µA
I
IL
Input Low Current, SEL133/100#
[31]
–5 µA
I
IH
Input High Current, SEL133/100#
[31]
A
Clock Outputs
CPU, CPUdiv2, IOAPIC (Referenced to V
DDQ2
) Test Condition Min. Typ. Max. Unit
V
OL
Output Low Voltage I
OL
= 1 mA 50 mV
V
OH
Output High Voltage I
OH
= –1 mA 2.2 V
I
OL
Output Low Current V
OL
= 1.25V 45 65 100 mA
I
OH
Output High Current V
OH
= 1.25V 45 65 100 mA
48MHz, REF (Referenced to V
DDQ3
) Test Condition Min. Typ. Max. Unit
V
OL
Output Low Voltage I
OL
= 1 mA 50 mV
V
OH
Output High Voltage I
OH
= –1 mA 3.1 V
I
OL
Output Low Current V
OL
= 1.5V 45 65 100 mA
I
OH
Output High Current V
OH
= 1.5V 45 65 100 mA
PCI, 3V66 (Referenced to V
DDQ3
) Test Condition Min. Typ. Max. Unit
V
OL
Output Low Voltage I
OL
= 1 mA 50 mV
V
OH
Output High Voltage I
OH
= –1 mA 3.1 V
I
OL
Output Low Current V
OL
= 1.5V 70 100 145 mA
I
OH
Output High Current V
OH
= 1.5V 65 95 135 mA
Notes:
29.Multiple Supplies: The voltage on any input or I/O pin cannot exceed the power pin during power-up. Power supply sequencing is NOT required.
30.All clock outputs loaded with 6" 60
transmission lines with 20-pF capacitors.
31.W158 logic inputs have internal pull-up devices, except SEL133/100# (pull-ups not CMOS level).
W158
..... Document #: 38-07164 Rev. *A Page Page 8 of 12 of 12
3.3V AC Electrical Characteristics
T
A
= 0°C to +70°C, V
DDQ3
= 3.3V±5%, V
DDQ2
= 2.5V± 5%, f
XTL
= 14.31818 MHz
Spread Spectrum function turned off
AC clock parameters are tested and guaranteed over stated operating conditions using the stated lump capacitive load at the
clock output.
[35]
Notes:
32.X1 input threshold voltage (typical) is V
DD
/2.
33.The W158 contains an internal crystal load capacitor between pin X1 and ground and another between pin X2 and ground. Total load placed on crystal is 18 pF;
this includes typical stray capacitance of short PCB traces to crystal.
34.X1 input capacitance is applicable when driving X1 with an external clock source (X2 is left unconnected).
35.Period, jitter, offset, and skew measured on rising edge at 1.5V.
36.3V66 is CPU/2 for CPU =133 MHz and (2 x CPU)/3 for CPU = 100 MHz.
Crystal Oscillator
V
TH
X1 Input threshold Voltage
[32]
1.65 V
C
LOAD
Load Capacitance, Imposed on
External Crystal
[33]
18 pF
C
IN,X1
X1 Input Capacitance
[34]
Pin X2 unconnected 28 pF
Pin Capacitance/Inductance
C
IN
Input Pin Capacitance Except X1 and X2 5 pF
C
OUT
Output Pin Capacitance 6 pF
L
IN
Input Pin Inductance 7nH
DC Electrical Characteristics: T
A
= 0°C to +70°C, V
DDQ3
= 3.3V±5%, V
DDQ2
= 2.5V±5%
Parameter Description Test Condition Min. Typ. Max. Unit
3V66 Clock Outputs, 3V66_0:3 (Lump Capacitance Test Load = 30 pF)
Parameter Description Test Condition/Comments Min. Typ. Max. Unit
f Frequency Note 36 66.6 MHz
t
R
Output Rise Edge Rate Measured from 0.4V to 2.4V 1 4 V/ns
t
F
Output Fall Edge Rate Measured from 2.4V to 0.4V 1 4 V/ns
t
D
Duty Cycle Measured on rising and falling edge at 1.5V 45 55 %
f
ST
Frequency Stabilization
from Power-up (cold start)
Assumes full supply voltage reached within
1 ms from power-up. Short cycles exist prior
to frequency stabilization.
3ms
Z
o
AC Output Impedance Average value during switching transition.
Used for determining series termination
value.
15
W158
..... Document #: 38-07164 Rev. *A Page Page 9 of 12 of 12
Note:
37.PCI clock is CPU/4 for CPU = 133 MHz and CPU/3 for CPU = 100 MHz.
PCI Clock Outputs, PCI_F and PCI1:7 (Lump Capacitance Test Load = 30 pF)
Parameter Description Test Condition/Comments Min. Typ. Max. Unit
t
P
Period Measured on rising edge at 1.5V
[37]
30 ns
t
H
High Time Duration of clock cycle above 2.4V 12 ns
t
L
Low Time Duration of clock cycle below 0.4V 12 ns
t
R
Output Rise Edge Rate Measured from 0.4V to 2.4V 1 4 V/ns
t
F
Output Fall Edge Rate Measured from 2.4V to 0.4V 1 4 V/ns
t
D
Duty Cycle Measured on rising and falling edge at 1.5V 45 55 %
t
JC
Jitter, Cycle-to-Cycle Measured on rising edge at 1.5V. Maximum difference of
cycle time between two adjacent cycles.
500 ps
t
SK
Output Skew Measured on rising edge at 1.5V 500 ps
t
O
3V66 to PCI Clock
Skew
Covers all 3V66/PCI outputs. Measured on rising edge at
1.5V. 3V66 leads PCI output.
1.5 3 ns
t
q
CPU to PCI Clock Skew Covers all CPU/PCI outputs. Measured on rising edge at
1.5V. CPU leads PCI output.
1.5 4 ns
f
ST
Frequency Stabilization
from Power-up (cold
start)
Assumes full supply voltage reached within 1 ms from
power-up. Short cycles exist prior to frequency stabilization.
3ms
Z
o
AC Output Impedance Average value during switching transition. Used for deter-
mining series termination value.
15
REF Clock Outputs, REF0:1 (Lump Capacitance Test Load = 20 pF)
Parameter Description Test Condition/Comments Min. Typ. Max. Unit
f Frequency, Actual Frequency generated by crystal oscillator 14.318 MHz
t
R
Output Rise Edge Rate Measured from 0.4V to 2.4V 0.5 2 V/ns
t
F
Output Fall Edge Rate Measured from 2.4V to 0.4V 0.5 2 V/ns
t
D
Duty Cycle Measured on rising and falling edge at 1.5V 45 55 %
f
ST
Frequency Stabilization from
Power-up (cold start)
Assumes full supply voltage reached within
1 ms from power-up. Short cycles exist prior to
frequency stabilization.
3ms
Z
o
AC Output Impedance Average value during switching transition. Used
for determining series termination value.
25
48-MHZ Clock Output (Lump Capacitance Test Load = 20 pF)
Parameter Description Test Condition/Comments Min. Typ. Max. Unit
f Frequency, Actual Determined by PLL divider ratio (see m/n below) 48.008 MHz
f
D
Deviation from 48 MHz (48.008 – 48)/48 +167 ppm
m/n PLL Ratio (14.31818 MHz x 57/17 = 48.008 MHz) 57/17
t
R
Output Rise Edge Rate Measured from 0.4V to 2.4V 0.5 2 V/ns
t
F
Output Fall Edge Rate Measured from 2.4V to 0.4V 0.5 2 V/ns
t
D
Duty Cycle Measured on rising and falling edge at 1.5V 45 55 %
f
ST
Frequency Stabilization
from Power-up (cold start)
Assumes full supply voltage reached within 1 ms
from power-up. Short cycles exist prior to
frequency stabilization.
3ms
Z
o
AC Output Impedance Average value during switching transition. Used
for determining series termination value.
25

W158HT

Mfr. #:
Manufacturer:
Silicon Labs
Description:
Clock Synthesizer / Jitter Cleaner IntelR CK98 Spread Spectrum System Clock, Server
Lifecycle:
New from this manufacturer.
Delivery:
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