AS7C31026C-12JIN

9/20/06, v 2.0Alliance MemoryP. 4 of 10
®
Key to switching waveforms
Read waveform 1 (address controlled)
3,6,7,9
Read waveform 2 (OE, CE, UB, LB controlled)
3,6,8,9
Read cycle (over the operating range)
3,9
Parameter Symbol
AS7C31026C-12
Unit NotesMin Max
Read cycle time t
RC
12 ns
Address access time t
AA
12 ns 3
Chip enable (CE
) access time t
ACE
12 ns 3
Output enable (OE
) access time t
OE
6 ns
Output hold from address change t
OH
4 ns 5
CE
low to output in low Z t
CLZ
4 ns 4, 5
CE
high to output in high Z t
CHZ
6 ns 4, 5
OE
low to output in low Z t
OLZ
0 ns 4, 5
Byte select access time t
BA
5 ns
Byte select Low to low Z t
BLZ
0 ns 4, 5
Byte select High to high Z t
BHZ
6 ns 4, 5
OE
high to output in high Z t
OHZ
6 ns 4, 5
Power up time t
PU
0 ns 4, 5
Power down time t
PD
12 ns 4, 5
Undefined output/don’t careFalling inputRising input
t
OH
t
AA
t
RC
t
OH
Data
OUT
Address
Data validPrevious data valid
Data valid
t
RC
t
AA
t
BLZ
t
BA
t
OE
t
OLZ
t
OH
t
OHZ
t
HZ
t
BHZ
t
ACE
t
LZ
Address
OE
CE
LB, UB
Data
IN
AS7C31026C
9/20/06, v 2.0Alliance MemoryP. 5 of 10
®
Write waveform 1 (WE controlled)
10,11
Write cycle (over the operating range)
11
Parameter Symbol
AS7C31026C-12
Unit NotesMin Max
Write cycle time t
WC
12 ns
Chip enable (CE
) to write end t
CW
8 ns
Address setup to write end t
AW
8 ns
Address setup time t
AS
0 ns
Write pulse width t
WP
8 ns
Write recovery time t
WR
0 ns
Address hold from end of write t
AH
0 ns
Data valid to write end t
DW
6 ns
Data hold time t
DH
0 ns 5
Write enable to output in high Z t
WZ
6 ns 4, 5
Output active from write end t
OW
3 ns 4, 5
Byte select low to end of write t
BW
8 ns
Address
CE
LB, UB
WE
Data
IN
Data
OUT
t
WC
t
CW
t
BW
t
AW
t
AS
t
WP
t
DW
t
DH
t
OW
t
WZ
t
WR
Data undefined
high Z
Data valid
t
AH
AS7C31026C
9/20/06, v 2.0Alliance MemoryP. 6 of 10
®
Write waveform 2 (CE controlled)
10,11
AC test conditions
Notes
1 During V
CC
power-up, a pull-up resistor to V
CC
on CE is required to meet I
SB
specification.
2 This parameter is sampled, but not 100% tested.
3 For test
conditions, see AC Test Conditions, Figures A and B.
4 These
parameters are specified with C
L
= 5 pF, as in Figures B. Transition is measured ± 200 mV from steady-state voltage.
5 This parameter is guaranteed, but not tested.
6 WE
is high for read cycle.
7 CE
and OE are low for read cycle.
8 Address is valid prior to or coincident with CE
transition low.
9 All read cycle timings are referenced from the last valid address to the first transitioning address.
10 N/A
1
1 All write cycle timings are referenced from the last valid address to the first transitioning address.
12 Not
applicable.
13 C =
30 pF, except all high Z and low Z parameters where C = 5 pF.
Address
CE
LB, UB
WE
Data
IN
t
WC
t
CW
t
BW
t
WP
t
DW
t
DH
t
OW
t
WZ
t
WR
Data
OUT
Data undefined
high Z high
Z
t
AS
t
AW
Data valid
t
CLZ
t
AH
255
?
C
13
320
?
GND
+3.3 V
Figur
e B: 3.3 V Output load
168
?
Thevenin Equivalent:
D
OUT
+1.728 V
10%
90%
10%
90%
GND
+3.0 V
Figure A: Input pulse
3 ns
D
OUT
Output load: see Figure B.
Input pulse level: GND to 3.0 V. See Figure A.
Input
rise and fall times: 3 ns. See Figure A.
Input
and output timing reference levels: 1.5
AS7C31026C

AS7C31026C-12JIN

Mfr. #:
Manufacturer:
Alliance Memory
Description:
SRAM 1M, 3.3V, 12ns, FAST 64K x 16 Asynch SRAM
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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