NCV8460A
www.onsemi.com
11
TYPICAL CHARACTERISTICS CURVES
10
100
1000
10 100
L (mH)
Figure 29. Single−Pulse Maximum Switch−off
Current vs. Load Inductance
E
max
(mJ)
25°C
150°C
ISO 7637−2: 2004(E) PULSE TEST RESULTS
ISO 7637−2:2004(E) Test Levels Delays and
Test Pulse I II III IV Impedance
1 −25 V −50 V −75 V −100 V
2 ms, 10 W
2a +25 V +50 V +37 V +50 V
0.05 ms, 10 W
3a −25 V −50 V −112 V −150 V
0.1 ms, 50 W
3b +25 V +50 V +75 V +100 V
0.1 ms, 50 W
4 −4 V −5 V −6 V −7 V
5 s, .01 W
5 (Load Dump) +26.5 V +46.5 V +66.5 V +86.5 V
400 ms, 2 W
ISO 7637−2:2004(E) Test Results
Test Pulse I II III IV
1 C C C C
2a C C C C
3a C C C C
3b C C C C
4 C C C C
5 (Load Dump) C E E E
Class Functional Status
A All functions of a device perform as designed during and after exposure to disturbance.
B
All functions of a device perform as designed during exposure. However,one or more of
them can go beyond specified tolerance. All functions return automatically to within normal
limits after exposure is removed. Memory functions shall remain class A.
C
One or more functions of a device do not perform as designed during exposure but return
automatically to normal operation after exposure is removed.
D One or more functions of a device do not perform as designed during exposure and do not return to normal operation until
exposure is removed and the device is reset by simple
E One or more functions of a device do not perform as designed during and after exposure and cannot be returned to proper
operation without replacing the device.
