AS7C31025B-20TJCN

March 2004
Copyright © Alliance Semiconductor. All rights reserved.
®
AS7C31025B
3.3V 128K X 8 CMOS SRAM (Center power and ground)
3/24/04, v. 1.3 Alliance Semiconductor P. 1 of 9
Features
Industrial and commercial temperatures
Organization: 131,072 x 8 bits
High speed
- 10/12/15/20 ns address access time
- 5, 6, 7, 8 ns output enable access time
Low power consumption: ACTIVE
- 252 mW / max @ 10 ns
Low power consumption: STANDBY
- 18 mW / max CMOS
6 T 0.18 u CMOS technology
Easy memory expansion with
CE
,
OE
inputs
Center power and ground
TTL/LVTTL-compatible, three-state I/O
JEDEC-standard packages
- 32-pin, 300 mil SOJ
- 32-pin, 400 mil SOJ
ESD protection 2000 volts
Latch-up current 200 mA
Logic block diagram
512 x 256 x 8
Array
(1,048,576)
Sense amp
Input buffer
A10
A11
A12
A13
A14
A15
A16
I/O0
I/O7
OE
CE
WE
Column decoder
Row decoder
Control
circuit
A9
A0
A1
A2
A3
A4
A5
A6
A7
V
CC
GND
A8
Pin arrangement
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
A16
A15
A14
A13
OE
I/O7
I/O6
GND
V
CC
I/O5
I/O4
A12
A11
A10
A9
A8
A0
A1
A2
A3
CE
I/O0
I/O1
V
CC
GND
I/O2
I/O3
WE
A4
A5
A6
A7
AS7C31025B
32-pin SOJ (300 mil)
32-pin SOJ (400 mil)
Selection guide
-10 -12 -15 -20 Unit
Maximum address access time 10 12 15 20 ns
Maximum output enable access time 5678ns
Maximum operating current 70 65 60 55 mA
Maximum CMOS standby current 5555mA
AS7C31025B
3/24/04, v. 1.3 Alliance Semiconductor P. 2 of 9
®
Functional description
The AS7C31025B is a high-performance CMOS 1,048,576-bit Static Random Access Memory (SRAM) device organized as 131,072 x 8
bits. It is designed for memory applications where fast data access, low power, and simple interfacing are desired.
Equal address access and cycle times (t
AA
, t
RC
, t
WC
) of 10/12/15/20 ns with output enable access times (t
OE
) of 5, 6, 7, 8 ns are ideal for
high-performance applications. The chip enable input CE permits easy memory and expansion with multiple-bank memory systems.
When
CE
is high the device enters standby mode. A write cycle is accomplished by asserting write enable (
WE
) and chip enable (
CE
). Data
on the input pins I/O0 through I/O7 is written on the rising edge of
WE
(write cycle 1) or
CE
(write cycle 2). To avoid bus contention,
external devices should drive I/O pins only after outputs have been disabled with output enable (
OE
) or write enable (
WE
).
A read cycle is accomplished by asserting output enable (
OE
) and chip enable (
CE
), with write enable (
WE
) high. The chip drives I/O pins
with the data word referenced by the input address. When either chip enable or output enable is inactive or write enable is active, output
drivers stay in high-impedance mode.
All chip inputs and outputs are TTL-compatible, and operation is from a single 3.3 V supply. The AS7C31025B is packaged in common
industry standard packages.
Absolute maximum ratings
NOTE: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and func-
tional operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure
to absolute maximum rating conditions for extended periods may affect reliability.
Truth table
Key: X = don’t care, L = low, H = high.
Parameter Symbol Min Max Unit
Voltage on V
CC
relative to GND V
t1
–0.50 +5.0 V
Voltage on any pin relative to GND V
t2
–0.50 V
CC
+ 0.5 V
Power dissipation P
D
–1.0W
Storage temperature (plastic) T
stg
–65 +150
o
C
Ambient temperature with V
CC
applied T
bias
–55 +125
o
C
DC current into outputs (low) I
OUT
–20mA
CE WE OE
Data Mode
H X X High Z Standby (I
SB
, I
SB1
)
L H H High Z Output disable (I
CC
)
LHL D
OUT
Read (I
CC
)
LLX D
IN
Write (I
CC
)
AS7C31025B
3/24/04, v. 1.3 Alliance Semiconductor P. 3 of 9
®
Recommended operating conditions
V
IL
= -1.0V for pulse width less than 5ns
V
IH =
V
CC
+ 1.5V for pulse width less than 5ns
DC operating characteristics (over the operating range)
1
Capacitance (f = 1 MHz, T
a
= 25
o
C, V
CC
= NOMINAL)
2
Parameter Symbol Min Nominal Max Unit
Supply voltage V
CC
3.0 3.3 3.6 V
Input voltage
V
IH
2.0 V
CC
+ 0.5 V
V
IL
–0.5 0.8 V
Ambient operating temperature
T
A
0–70
o
C
T
A
–40 85
o
C
Parameter Sym Test conditions
-10 -12 -15 -20
UnitMin Max Min Max Min Max Min Max
Input leakage
current
| I
LI
|
V
CC
= Max, V
IN
= GND to V
CC
–1–1–1–1µA
Output leakage
current
| I
LO
|
V
CC
= Max, CE = V
IH
,
V
out
= GND to V
CC
–1–1–1–1µA
Operating power
supply current
I
CC
V
CC
= Max
CE
V
IL
, f = f
Max
,
I
OUT
= 0 mA
–70–65–60–55
mA
Standby power
supply current
1
I
SB
V
CC
= Max
CE
V
IH
, f = f
Max
–30–25–20–20
mA
I
SB1
V
CC
= Max, CE V
CC
–0.2 V,
V
IN
0.2 V or V
IN
V
CC
–0.2 V,
f = 0
5 5 5 5
mA
Output voltage
V
OL
I
OL
= 8 mA, V
CC
= Min
–0.4–0.4–0.4–0.4V
V
OH
I
OH
= –4 mA, V
CC
= Min
2.4–2.4–2.4–2.4– V
Parameter Symbol Signals Test conditions Max Unit
Input capacitance C
IN
A,
CE
,
WE
,
OE
V
IN
= 0 V 5 pF
I/O capacitance C
I/O
I/O V
IN
= V
OUT
= 0 V 7 pF

AS7C31025B-20TJCN

Mfr. #:
Manufacturer:
Alliance Memory
Description:
SRAM 1M, 3.3V, 20ns, FAST 128K x 8 Asynch SRAM
Lifecycle:
New from this manufacturer.
Delivery:
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