NTMS4706NR2

© Semiconductor Components Industries, LLC, 2005
November, 2005 − Rev. 3
1 Publication Order Number:
NTMS4706N/D
NTMS4706N
Power MOSFET
30 V, 10.3 A, Single N−Channel, SO−8
Features
Low R
DS(on)
Low Gate Charge
Standard SO−8 Single Package
Pb−Free Package is Available
Applications
Notebooks, Graphics Cards
Synchronous Rectification
High Side Switch
DC−DC Converters
MAXIMUM RATINGS (T
J
= 25°C unless otherwise stated)
Parameter Symbol Value Unit
Drain−to−Source Voltage V
DSS
30 V
Gate−to−Source Voltage V
GS
±20 V
Continuous Drain
Current (Note 1)
Steady
State
T
A
= 25°C
I
D
8.6
A
T
A
= 85°C 6.2
t v 10 s T
A
= 25°C 10.3
Power Dissipation
(Note 1)
Steady
State
T
A
= 25°C P
D
1.5
W
t v 10 s 2.2
Continuous Drain
Current (Note 2)
Steady
State
T
A
= 25°C
I
D
6.4
A
T
A
= 85°C 4.6
Power Dissipation
(Note 2)
T
A
= 25°C P
D
0.83 W
Pulsed Drain Current
t
p
= 10 ms
I
DM
31 A
Operating Junction and Storage Temperature T
J
,
T
stg
−55 to
150
°C
Source Current (Body Diode) I
S
2.1 A
Single Pulse Drain−to−Source Avalanche Energy
(V
DD
= 25 V, V
GS
= 10 V, I
L
Peak = 7.5 A,
L = 10 mH, R
G
= 25 W)
E
AS
150 mJ
Lead Temperature for Soldering Purposes
(1/8 from case for 10 s)
T
L
260 °C
THERMAL RESISTANCE MAXIMUM RATINGS
Parameter Symbol Value Unit
Junction−to−Ambient – Steady State (Note 1)
R
q
JA
83.5
°C/W
Junction−to−Ambient – t v 10 s (Note 1)
R
q
JA
58
Junction−to−Ambient – Steady State (Note 2)
R
q
JA
150
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
1. Surfacemounted on FR4 board using 1 in sq pad size (Cu area = 1.127 in sq
[1 oz] including traces).
2. Surfacemounted on FR4 board using the minimum recommended pad size.
*For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting
Techniques Reference Manual, SOLDERRM/D.
http://onsemi.com
Device Package Shipping
ORDERING INFORMATION
NTMS4706NR2 SO−8 2500/Tape & Reel
V
(BR)DSS
R
DS(ON)
TYP I
D
MAX
(Note 1)
30 V
9.0 mW @ 10 V
10.3 A
N−Channel
D
S
G
For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
SO−8
CASE 751
STYLE 12
MARKING DIAGRAM/
PIN ASSIGNMENT
1
11.4 mW @ 4.5 V
NTMS4706NR2G SO−8
(Pb−Free)
2500/Tape & Reel
4706N
ALYWG
G
4706N = Device Code
A = Assembly Location
L = WaferLot
Y = Year
WW = Work Week
G = Pb−Free Package
18
Drain
Drain
Drain
Drain
Source
Source
Source
Gate
Top View
(Note: Microdot may be in either location)
NTMS4706N
http://onsemi.com
2
ELECTRICAL CHARACTERISTICS (T
J
= 25°C unless otherwise specified)
Parameter Symbol Test Condition Min Typ Max Unit
OFF CHARACTERISTICS
Drain−to−Source Breakdown Voltage V
(BR)DSS
V
GS
= 0 V, I
D
= 250 mA
30 V
Drain−to−Source Breakdown Voltage
Temperature Coefficient
V
(BR)DSS
/T
J
21 mV/°C
Zero Gate Voltage Drain Current I
DSS
V
GS
= 0 V, V
DS
= 24 V
T
J
= 25°C 1.0 mA
T
J
= 125°C 50
Gate−to−Source Leakage Current I
GSS
V
DS
= 0 V, V
GS
= ±20 V ±100 nA
ON CHARACTERISTICS (Note 3)
Gate Threshold Voltage V
GS(TH)
V
GS
= V
DS
, I
D
= 250 mA
1.0 2.5 V
Negative Threshold Temperature
Coefficient
V
GS(TH)
/T
J
−4.8 mV/°C
Drain−to−Source On Resistance R
DS(on)
V
GS
= 10 V, I
D
= 10.3 A 9.0 12 mW
V
GS
= 4.5 V, I
D
= 10 A 11.4 15
Forward Transconductance g
FS
V
DS
= 15 V, I
D
= 10 A 19 S
CHARGES, CAPACITANCES AND GATE RESISTANCE
Input Capacitance C
iss
V
GS
= 0 V, f = 1.0 MHz, V
DS
= 24 V
950
pF
Output Capacitance C
oss
400
Reverse Transfer Capacitance C
rss
100
Total Gate Charge Q
G(TOT)
V
GS
= 4.5 V, V
DS
= 15 V, I
D
= 10 A
10 15
nC
Threshold Gate Charge Q
G(TH)
1.25
Gate−to−Source Charge Q
GS
2.4
Gate−to−Drain Charge Q
GD
4.5
Gate Resistance R
G
1.82
W
SWITCHING CHARACTERISTICS (Note 4)
Turn−On Delay Time t
d(on)
V
GS
= 10 V, V
DD
= 15 V, I
D
= 1.0 A,
R
G
= 3.0 W
7.5 12
ns
Rise Time t
r
4.0 8.0
Turn−Off Delay Time t
d(off)
24 40
Fall Time t
f
14 25
DRAIN−SOURCE DIODE CHARACTERISTICS
Forward Diode Voltage V
SD
V
GS
= 0 V, I
S
= 2.1 A
T
J
= 25°C 0.74 1.0
V
T
J
= 125°C 0.57
Reverse Recovery Time t
RR
V
GS
= 0 V, d
IS
/d
t
= 100 A/ms,
I
S
= 2.1 A
34
ns
Charge Time t
a
16
Discharge Time t
b
18
Reverse Recovery Charge Q
RR
29 nC
3. Pulse Test: pulse width = 300 ms, duty cycle v 2%.
4. Switching characteristics are independent of operating junction temperatures.
NTMS4706N
http://onsemi.com
3
TYPICAL PERFORMANCE CURVES
T
J
= 125°C
0
20
62
V
DS
, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
I
D,
DRAIN CURRENT (AMPS)
15
5
0
Figure 1. On−Region Characteristics
3
30
20
5
3.5
0
Figure 2. Transfer Characteristics
V
GS
, GATE−TO−SOURCE VOLTAGE (VOLTS)
0.01
0.02
0.005
Figure 3. On−Resistance vs. Gate−to−Source
Voltage
V
GS
, GATE−TO−SOURCE VOLTAGE (VOLTS)
R
DS(on),
DRAIN−TO−SOURCE RESISTANCE (
W
)
I
D,
DRAIN CURRENT (AMPS)
Figure 4. On−Resistance vs. Drain Current and
Gate Voltage
−50 0−25 25
1
0.8
0.6
50 150
Figure 5. On−Resistance Variation with
Temperature
T
J
, JUNCTION TEMPERATURE (°C)
T
J
= 25°C
2
T
J
= −55°C
75
T
J
= 25°C
I
D
= 10.3 A
V
GS
= 10 V
R
DS(on),
DRAIN−TO−SOURCE
RESISTANCE (NORMALIZED)
4
T
J
= 25°C
R
DS(on),
DRAIN−TO−SOURCE RESISTANCE (W)
1.2
V
GS
= 10 V
7
10
27
Figure 6. Drain−to−Source Leakage Current
vs. Voltage
V
DS
, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
18
V
GS
= 0 V
I
DSS
, LEAKAGE (nA)
T
J
= 150°C
T
J
= 100°C
V
GS
= 4.5 V
100
1000
10000
3 V
V
DS
10 V
0.03
24
2.6 V
10
2.4 V
10
5
3
0
30
25
25
0.025
125100 3
8
126
513 7
2
0.015
10
T
J
= 25°C
I
D
= 10 A
0.009
0.006
I
D,
DRAIN CURRENT (AMPS)
0.018
81242
0
0.015
16
0.012
18
1.8
10 V
5 V
3.2 V
41
1.4
1.6
109
15
3186496102
14
21159
2.2 V
2.8 V
35
2.51.5 4.
5

NTMS4706NR2

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
MOSFET N-CH 30V 6.4A 8-SOIC
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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