ADC1415S_SER 5 © IDT 2012. All rights reserved.
Product data sheet Rev. 05 — 2 July 2012 34 of 40
Integrated Device Technology
ADC1415S series
Single 14-bit ADC; input buffer; CMOS or LVDS DDR digital outputs
1 to 0 DATA_FORMAT[1:0] R/W output data format
00 offset binary
01 two’s complement
10 gray code
11 offset binary
Table 23. Output data standard control register (address 0011h) bit description
…continued
Default values are highlighted.
Bit Symbol Access Value Description
Table 24. Output clock register (address 0012h) bit description
Default values are highlighted.
Bit Symbol Access Value Description
7 to 4 - 0000 not used
3 DAVINV R/W output clock data valid (DAV) polarity
0normal
1inverted
2 to 0 DAVPHASE[2:0] R/W DAV phase select
000 output clock shifted (ahead) by 3 ns
001 output clock shifted (ahead) by 2.5 ns
010 output clock shifted (ahead) by 2 ns
011 output clock shifted (ahead) by 1.5 ns
100 output clock shifted (ahead) by 1 ns
101 output clock shifted (ahead) by 0.5 ns
110 default value as defined in timing section
111 output clock shifted (delayed) by 0.5 ns
Table 25. Offset register (address 0013h) bit description
Default values are highlighted.
Bit Symbol Access Value Description
7 to 6 - 00 not used
5 to 0 DIG_OFFSET[5:0] R/W digital offset adjustment
011111 +31 LSB
... ...
000000 0
... ...
100000 32 LSB
Table 26. Test pattern register 1 (address 0014h) bit description
Default values are highlighted.
Bit Symbol Access Value Description
7 to 3 - 00000 not used
ADC1415S_SER 5 © IDT 2012. All rights reserved.
Product data sheet Rev. 05 — 2 July 2012 35 of 40
Integrated Device Technology
ADC1415S series
Single 14-bit ADC; input buffer; CMOS or LVDS DDR digital outputs
2 to 0 TESTPAT_SEL[2:0] R/W digital test pattern select
000 off
001 mid scale
010 FS
011 +FS
100 toggle ‘1111..1111’/’0000..0000’
101 custom test pattern
110 ‘1010..1010.’
111 ‘010..1010’
Table 26. Test pattern register 1 (address 0014h) bit description
…continued
Default values are highlighted.
Bit Symbol Access Value Description
Table 27. Test pattern register 2 (address 0015h) bit description
Default values are highlighted.
Bit Symbol Access Value Description
7 to 0 TESTPAT_USER[13:6] R/W 00000000 custom digital test pattern (bits 13 to 6)
Table 28. Test pattern register 3 (address 0016h) bit description
Default values are highlighted.
Bit Symbol Access Value Description
7 to 2 TESTPAT_USER[5:0] R/W 000000 custom digital test pattern (bits 5 to 0)
1 to 0 - 00 not used
Table 29. Fast OTR register (address 0017h) bit description
Default values are highlighted.
Bit Symbol Access Value Description
7 to 4 - 0000 not used
3 FASTOTR R/W fast Out-of-Range (OTR) detection
0 disabled
1 enabled
2 to 0 FASTOTR_DET[2:0] R/W set fast OTR detect level
000 20.56 dB
001 16.12 dB
010 11.02 dB
011 7.82 dB
100 5.49 dB
101 3.66 dB
110 2.14 dB
111 0.86 dB
ADC1415S_SER 5 © IDT 2012. All rights reserved.
Product data sheet Rev. 05 — 2 July 2012 36 of 40
Integrated Device Technology
ADC1415S series
Single 14-bit ADC; input buffer; CMOS or LVDS DDR digital outputs
Table 30. CMOS output register (address 0020h) bit description
Default values are highlighted.
Bit Symbol Access Value Description
7 to 4 - 0000 not used
3 to 2 DAV_DRV[1:0] R/W drive strength for DAV CMOS output buffer
00 low
01 medium
10 high
11 very high
1 to 0 DATA_DRV[1:0] R/W drive strength for DATA CMOS output buffer
00 low
01 medium
10 high
11 very high
Table 31. LVDS DDR output register 1 (address 0021h) bit description
Default values are highlighted.
Bit Symbol Access Value Description
7 to 6 - 00 not used
5 DAVI_x2_EN R/W double LVDS current for DAV LVDS buffer
0 disabled
1 enabled
4 to 3 DAVI[1:0] R/W LVDS current for DAV LVDS buffer
00 3.5 mA
01 4.5 mA
10 1.25 mA
11 2.5 mA
2 DATAI_x2_EN R/W double LVDS current for DATA LVDS buffer
0 disabled
1 enabled
1 to 0 DATAI[1:0] R/W LVDS current for DATA LVDS buffer
00 3.5 mA
01 4.5 mA
10 1.25 mA
11 2.5 mA

ADC1415S125HN-C1

Mfr. #:
Manufacturer:
IDT
Description:
Analog to Digital Converters - ADC SINGLE 14 BITS ADC 125MSPS
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