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74ABT574
Extended AC Electrical Characteristics
(SOIC Package)
Note 8: This specification is guaranteed but not tested. The limits apply to propagation delays for all paths described switching in phase
(i.e., all LOW-to-HIGH, HIGH-to-LOW, etc.).
Note 9: This specification is guaranteed but not tested. The limits represent propagation delay with 250 pF load capacitors in place of the 50 pF load capac-
itors in the standard AC load. This specification pertains to single output switching only.
Note 10: This specification is guaranteed but not tested. The limits represent propagation delays for all paths described switching in phase
(i.e., all LOW-to-HIGH, HIGH-to-LOW, etc.) with 250 pF load capacitors in place of the 50 pF load capacitors in the standard AC load.
Note 11: The 3-STATE Delay Times are dominated by the RC network (500
, 250 pF) on the output and has been excluded from the datasheet.
Skew (Note 12)
(SOIC package)
Note 12: This specification is guaranteed but not tested. The limits apply to propagation delays for all paths described switching in phase
(i.e., all LOW-to-HIGH, HIGH-to-LOW, etc.).
Note 13: This specification is guaranteed but not tested. The limits represent propagation delays with 250 pF load capacitors in place of the 50 pF load
capacitors in the standard AC load.
Note 14: Skew is defined as the absolute value of the difference between the actual propagation delays for any two separate outputs of the same device.
The specification applies to any outputs switching HIGH-to-LOW (t
OSHL
), LOW-to-HIGH (t
OSLH
), or any combination switching LOW-to-HIGH and/or HIGH-
to-LOW (t
OST
). This specification is guaranteed but not tested.
Note 15: This describes the difference between the delay of the LOW-to-HIGH and the HIGH-to-LOW transition on the same pin. It is measured across all
the outputs (drivers) on the same chip, the worst (largest delta) number is the guaranteed specification. This specification is guaranteed but not tested.
Note 16: Propagation delay variation for a given set of conditions (i.e., temperature and V
CC
) from device to device. This specification is guaranteed but not
tested.
Capacitance
Note 17: C
OUT
is measured at frequency f 1 MHz, per MIL-STD-883, Method 3012.
Symbol Parameter
T
A
40 C to 85 CT
A
40 C to 85 C T
A
40 C to 85 C
Units
V
CC
4.5V to 5.5V V
CC
4.5V to 5.5V V
CC
4.5V to 5.5V
C
L
50 pF C
L
250 pF C
L
250 pF
8 Outputs Switching (Note 9) 8 Outputs Switching
(Note 8) (Note 10)
Min Max Min Max Min Max
t
PLH
Propagation Delay 1.5 5.7 2.0 7.8 2.0 10.0
ns
t
PHL
CP to O
n
1.5 5.7 2.0 7.8 2.0 10.0
t
PZH
Output Enable Time 1.5 6.2 2.0 8.0 2.0 10.5
ns
t
PZL
1.5 6.2 2.0 8.0 2.0 10.5
t
PHZ
Output Disable Time 1.0 5.5
(Note 11) (Note 11) ns
t
PLZ
1.0 5.5
Symbol Parameter
T
A
40 C to 85 C T
A
40 C to 85 C
Units
V
CC
4.5V–5.5V V
CC
4.5V–5.5V
C
L
50 pF C
L
250 pF
8 Outputs Switching 8 Outputs Switching
(Note 12) (Note 13)
Max Max
t
OSHL
Pin to Pin Skew
1.0 1.8 ns
(Note 14) HL Transitions
t
OSLH
Pin to Pin Skew
1.0 1.8 ns
(Note 14) LH Transitions
t
PS
Duty Cycle
1.8 4.3 ns
(Note 15) LH–HL Skew
t
OST
Pin to Pin Skew
2.0 4.3 ns
(Note 14) LH/HL Transitions
t
PV
Device to Device Skew
2.5 4.6 ns
(Note 16) LH/HL Transitions
Symbol Parameter Typ Units
Conditions
T
A
25 C
C
IN
Input Capacitance 5.0 pF V
CC
0V
C
OUT
(Note 17) Output Capacitance 9.0 pF V
CC
5.0V
