NXP Semiconductors
BUK9K52-60E
Dual N-channel 60 V, 55 mΩ logic level MOSFET
BUK9K52-60E All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved
Product data sheet 24 February 2015 6 / 13
Symbol Parameter Conditions Min Typ Max Unit
Dynamic characteristics FET1 and FET2
Q
G(tot)
total gate charge - 5.6 - nC
Q
GS
gate-source charge - 1.1 - nC
Q
GD
gate-drain charge
I
D
= 5 A; V
DS
= 48 V; V
GS
= 5 V;
T
j
= 25 °C; Fig. 14; Fig. 15
- 2.3 - nC
C
iss
input capacitance - 544 725 pF
C
oss
output capacitance - 74 89 pF
C
rss
reverse transfer
capacitance
V
GS
= 0 V; V
DS
= 25 V; f = 1 MHz;
T
j
= 25 °C; Fig. 16
- 40 55 pF
t
d(on)
turn-on delay time - 6.2 - ns
t
r
rise time - 10.1 - ns
t
d(off)
turn-off delay time - 10.7 - ns
t
f
fall time
V
DS
= 48 V; R
L
= 10 Ω; V
GS
= 5 V;
R
G(ext)
= 5 Ω; T
j
= 25 °C; I
D
= 5 A
- 9 - ns
Source-drain diode FET1 and FET2
V
SD
source-drain voltage I
S
= 5 A; V
GS
= 0 V; T
j
= 25 °C; Fig. 17 - 0.78 1.2 V
t
rr
reverse recovery time - 17.7 - ns
Q
r
recovered charge
I
S
= 5 A; dI
S
/dt = -100 A/µs; V
GS
= 0 V;
V
DS
= 30 V; T
j
= 25 °C
- 11.6 - nC
003aaj548
0
10
20
30
0 4 8 12 16 20
I
D
(A)
g
fs
(S)
Fig. 6. Forward transconductance as a function of
drain current; typical values
003aaj549
0
20
40
60
80
0 2 4 6 8
V
GS
(V)
I
D
(A)
T
j
= 25
°
CT
j
= 175
°
C
Fig. 7. Transfer characteristics: drain current as a
function of gate-source voltage; typical values