AN80xx/AN80xxM Series
5
SFF00007AEB
■ Electrical Characteristics at T
a
= 25°C (continued)
•
AN8007, AN8007M (7V type)
•
AN8008, AN8008M (8V type)
•
AN8085, AN8085M (8.5V type)
V
O
V
REG
IN
mV
REG
L
mV
mV
V
DIF(min)
V
V
mAI
Bias
dBRR
µVV
no
mV/°C∆V
O
/T
a
7.287
T
j
= 25°C
V
I
= 7.5 to 13V, T
j
= 25°C
50
I
O
= 1 to 40mA, T
j
= 25°C
0.07
V
I
= 6.8V, I
O
= 20mA, T
j
= 25°C
V
I
= 6.8V, I
O
= 50mA, T
j
= 25°C
I
O
= 1 to 50mA, T
j
= 25°C
0.7
I
O
= 0mA, T
j
= 25°C
V
I
= 8 to 10V, f = 120Hz
0.35
f = 10Hz to 100kHz
T
j
= −30 to +125°C
60
70
0.2
0.3
1.3
6.72
50
0.13
6.5
14
31
120
62
Parameter Symbol Conditions Min Typ Max
Output voltage
Line regulation
Load regulation
Minimum input/output voltage difference
Note 1) The specified condition T
j
= 25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= 8V, I
O
= 20mA and C
O
= 10µF.
Bias current
Ripple rejection ratio
Output noise voltage
Output voltage temperature coefficient
Unit
V
O
V
REG
IN
mV
REG
L
mV
mV
V
DIF(min)
V
V
mAI
Bias
dBRR
µVV
no
mV/°C∆V
O
/T
a
8.328
T
j
= 25°C
V
I
= 8.5 to 14V, T
j
= 25°C
55
I
O
= 1 to 40mA, T
j
= 25°C
0.07
V
I
= 7.8V, I
O
= 20mA, T
j
= 25°C
V
I
= 7.8V, I
O
= 50mA, T
j
= 25°C
I
O
= 1 to 50mA, T
j
= 25°C
0.7
I
O
= 0mA, T
j
= 25°C
V
I
= 9 to 11V, f = 120Hz
0.4
f = 10Hz to 100kHz
T
j
= −30 to +125°C
65
80
0.2
0.3
1.3
7.68
49
0.14
7.5
15
34
135
61
Parameter Symbol Conditions Min Typ Max
Output voltage
Line regulation
Load regulation
Minimum input/output voltage difference
Note 1) The specified condition T
j
= 25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= 9V, I
O
= 20mA and C
O
= 10µF.
Bias current
Ripple rejection ratio
Output noise voltage
Output voltage temperature coefficient
Unit
V
O
V
REG
IN
mV
REG
L
mV
mV
V
DIF(min)
V
V
mAI
Bias
dBRR
µVV
no
mV/°C∆V
O
/T
a
8.848.50
T
j
= 25°C
V
I
= 9 to 14.5V, T
j
= 25°C
60
I
O
= 1 to 40mA, T
j
= 25°C
0.07
V
I
= 8.3V, I
O
= 20mA, T
j
= 25°C
V
I
= 8.3V, I
O
= 50mA, T
j
= 25°C
I
O
= 1 to 50mA, T
j
= 25°C
0.8
I
O
= 0mA, T
j
= 25°C
V
I
= 9.5 to 11.5V, f = 120Hz
0.43
f = 10Hz to 100kHz
T
j
= −30 to +125°C
70
90
0.2
0.3
1.4
8.16
48
0.14
8.3
16
36
140
60
Parameter Symbol Conditions Min Typ Max
Output voltage
Line regulation
Load regulation
Minimum input/output voltage difference
Note 1) The specified condition T
j
= 25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= 9.5V, I
O
= 20mA and C
O
= 10µF.
Bias current
Ripple rejection ratio
Output noise voltage
Output voltage temperature coefficient
Unit
