Document Number: MMA6331L
Rev 1, 08/2011
Freescale Semiconductor
Data Sheet: Technical Data
© Freescale Semiconductor, Inc., 2010, 2011. All rights reserved.
±4g, ±9g Two Axis Low-g
Micromachined Accelerometer
The MMA6331L is a low power, low profile capacitive micromachined
accelerometer featuring signal conditioning, a 1-pole low pass filter,
temperature compensation, and g-Select which allows for the selection
between two sensitivities. Zero-g offset and sensitivity are factory set and
require no external devices. The MMA6331L includes a Sleep Mode that
makes it ideal for handheld battery powered electronics.
Features
3mm x 5mm x 1.0mm LGA-14 Package
Low Current Consumption: 400 μA
Sleep Mode: 3 μA
Low Voltage Operation: 2.2 V – 3.6 V
Selectable Sensitivity (±4g, ±9g)
Fast Turn On Time (0.5 ms Enable Response Time)
Signal Conditioning with Low Pass Filter
Robust Design, High Shocks Survivability
RoHS Compliant
Environmentally Preferred Product
Low Cost
Typical Applications
3D Gaming: Tilt and Motion Sensing, Event Recorder
HDD MP3 Player
Laptop PC: Anti-Theft
Cell Phone: Image Stability, Text Scroll, Motion Dialing, eCompass
Pedometer: Motion Sensing
PDA: Text Scroll
Robotics: Motion Sensing
ORDERING INFORMATION
Part Number
Temperature
Range
Package
Drawing
Package Shipping
MMA6331LT
-40 to +85°C 1977-01 LGA-14 Tray
MMA6331LR1
-40 to +85°C 1977-01 LGA-14 7” Tape & Reel
MMA6331LR2
-40 to +85°C 1977-01 LGA-14 13” Tape & Reel
MMA6331L
MMA6331L: XY AXIS
ACCELEROMETER
±4g, ±9g
14 LEAD
LGA
CASE 1977-01
Bottom View
Figure 1. Pin Connections
Top View
123456
7
8 9 10 11 12 13
14
N/C
X
OUT
Y
OUT
V
SS
V
DD
Sleep
N/C
N/C
N/C
N/C
N/C
g-Select
N/C
GND
Sensors
2 Freescale Semiconductor
MMA6331L
Figure 2. Simplified Accelerometer Functional Block Diagram
ELECTRO STATIC DISCHARGE (ESD)
WARNING: This device is sensitive to electrostatic
discharge.
Although the Freescale accelerometer contains internal
2000 V ESD protection circuitry, extra precaution must be
taken by the user to protect the chip from ESD. A charge of
over 2000 volts can accumulate on the human body or
associated test equipment. A charge of this magnitude can
alter the performance or cause failure of the chip. When
handling the accelerometer, proper ESD precautions should
be followed to avoid exposing the device to discharges which
may be detrimental to its performance.
Table 1. Maximum Ratings
(Maximum ratings are the limits to which the device can be exposed without causing permanent damage.)
Rating Symbol Value Unit
Maximum Acceleration (all axis) g
max
±5000 g
Supply Voltage V
DD
–0.3 to +3.6 V
Drop Test
(1)
1. Dropped onto concrete surface from any axis.
D
drop
1.8 m
Storage Temperature Range T
stg
40 to +125 °C
C to V
CONVERTER
X
OUT
Y
OUT
OSCILLATOR
CLOCK
GEN
Sleep
X-TEMP
COMP
G-CELL
SENSOR
GAIN
+
FILTER
CONTROL LOGIC
NVM TRIM
CIRCUITS
Y-TEMP
COMP
V
DD
V
SS
Sensors
Freescale Semiconductor 3
MMA6331L
Table 2. Operating Characteristics
Unless otherwise noted: -40°C < T
A
< 85°C, 2.2 V < V
DD
< 3.6 V, Acceleration = 0g, Loaded output
(1)
Characteristic Symbol Min Typ Max Unit
Operating Range
(2)
Supply Voltage
(3)
Supply Current
(4)
Supply Current at Sleep Mode
(4)
Operating Temperature Range
Acceleration Range, X-Axis, Y-Axis
g-Select: 0
g-Select: 1
V
DD
I
DD
I
DD
T
A
g
FS
g
FS
2.2
-40
2.8
400
3
±4
±9
3.6
600
10
+85
V
μA
μA
°C
g
g
Output Signal
Zero g (T
A
= 25°C, V
DD
= 2.8 V)
(5), (6)
Zero g
(7)
Sensitivity (T
A
= 25°C, V
DD
= 2.8 V)
4g
9g
Sensitivity
(4)
Bandwidth Response
XY
Output Impedance
V
OFF
V
OFF
, T
A
S
4g
S
9g
S,T
A
f
-3dBXY
Z
O
1.316
-2.0
289.5
75.2
-0.0075
24
1.4
±0.5
308
83.6
±0.002
400
32
1.484
+2.0
326.5
91.9
+0.0075
40
V
mg/°C
mV/g
mV/g
%/°C
Hz
kΩ
Noise
Power Spectral Density RMS (0.1 Hz – 1 kHz)
(4)
n
PSD
350 μg/
Control Timing
Power-Up Response Time
(8)
Enable Response Time
(9)
Sensing Element Resonant Frequency
XY
Internal Sampling Frequency
t
RESPONSE
t
ENABLE
f
GCELLXY
f
CLK
1.0
0.5
6.0
11
2.0
2.0
ms
ms
kHz
kHz
Output Stage Performance
Full-Scale Output Range (I
OUT
= 3 µA) V
FSO
V
SS
+0.1 V
DD
–0.1 V
Nonlinearity, X
OUT
, Y
OUT
NL
OUT
-1.0 +1.0 %FSO
Cross-Axis Sensitivity
(10)
V
XY
-5.0 +5.0 %
1. For a loaded output, the measurements are observed after an RC filter consisting of an internal 32 kΩ resistor and an external 3.3 nF capacitor
(recommended as a minimum to filter clock noise) on the analog output for each axis and a 0.1 μF capacitor on V
DD
- GND. The output sensor
bandwidth is determined by the Capacitor added on the output. f = 1/2π * (32 x 10
3
) * C. C = 3.3 nF corresponds to BW = 1507HZ, which is
the minimum to filter out internal clock noise.
2. These limits define the range of operation for which the part will meet specification.
3. Within the supply range of 2.2 and 3.6 V, the device operates as a fully calibrated linear accelerometer. Beyond these supply limits the device
may operate as a linear device but is not guaranteed to be in calibration.
4. This value is measured with g-Select in 4g mode.
5. The device can measure both + and – acceleration. With no input acceleration the output is at midsupply. For positive acceleration the output
will increase above V
DD
/2. For negative acceleration, the output will decrease below V
DD
/2.
6. For optimal 0g offset performance, adhere to AN3484 and AN3447.
7.Product Performance will not exceed this minimum level, however, measurement over time will not be equal to time zero measurements for
this specific parameter.
8. The response time between 10% of full scale V
DD
input voltage and 90% of the final operating output voltage.
9. The response time between 10% of full scale Sleep Mode input voltage and 90% of the final operating output voltage.
10. A measure of the device’s ability to reject an acceleration applied 90° from the true axis of sensitivity
Hz

MMA6331LR2

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
ACCELEROMETER 4-9G ANALOG 14LGA
Lifecycle:
New from this manufacturer.
Delivery:
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