MLP1N06CL

Semiconductor Components Industries, LLC, 2000
November, 2000 – Rev. 2
1 Publication Order Number:
MLP1N06CL/D
MLP1N06CL
Preferred Device
SMARTDISCRETES MOSFET
1 Amp, 62 Volts, Logic Level
N–Channel TO–220
These SMARTDISCRETES devices feature current limiting for
short circuit protection, an integral gate–to–source clamp for ESD
protection and gate–to–drain clamp for over–voltage protection. No
additional gate series resistance is required when interfacing to the
output of a MCU, but a 40 k gate pulldown resistor is recommended
to avoid a floating gate condition.
The internal gate–to–source and gate–to–drain clamps allow the
devices to be applied without use of external transient suppression
components. The gate–to–source clamp protects the MOSFET input
from electrostatic gate voltage stresses up to 2.0 kV. The gate–to–drain
clamp protects the MOSFET drain from drain avalanche stresses that
occur with inductive loads. This unique design provides voltage
clamping that is essentially independent of operating temperature.
Temperature Compensated Gate–to–Drain Clamp Limits Voltage
Stress Applied to the Device and Protects the Load From
Overvoltage
Integrated ESD Diode Protection
Controlled Switching Minimizes RFI
Low Threshold Voltage Enables Interfacing Power Loads to
Microprocessors
MAXIMUM RATINGS (T
C
= 25°C unless otherwise noted)
Rating Symbol Value Unit
Drain–to–Source Voltage V
DSS
Clamped Vdc
Drain–to–Gate Voltage
(R
GS
= 1.0 M)
V
DGR
Clamped Vdc
Gate–to–Source Voltage – Continuous V
GS
±10 Vdc
Drain Current – Continuous
Drain Current – Single Pulse
I
D
I
DM
Self–limited
1.8
Adc
Total Power Dissipation P
D
40 Watts
Electrostatic Discharge Voltage
(Human Body Model)
ESD 2.0 kV
Operating and Storage Junction
Temperature Range
T
J
, T
stg
–50 to 150 °C
THERMAL CHARACTERISTICS
Thermal Resistance, Junction to Case
Thermal Resistance, Junction to
Ambient
R
θJC
R
θJA
3.12
62.5
°C/W
Maximum Lead Temperature for
Soldering Purposes, 1/8 from case
T
L
260 °C
L1N06CL
LLYWW
1
Gate
3
Source
4
Drain
2
Drain
1 AMPERE
62 VOLTS (Clamped)
R
DS(on)
= 750 m
D
G
S
R1
R2
Preferred devices are recommended choices for future use
and best overall value.
Device Package Shipping
ORDERING INFORMATION
MLP1N06CL TO–220AB 50 Units/Rail
TO–220AB
CASE 221A
STYLE 5
1
2
3
4
http://onsemi.com
N–Channel
MARKING DIAGRAM
& PIN ASSIGNMENT
L1N06CL = Device Code
LL = Location Code
Y = Year
WW = Work Week
MLP1N06CL
http://onsemi.com
2
UNCLAMPED DRAIN–TO–SOURCE AVALANCHE CHARACTERISTICS
Rating Symbol Value Unit
Single Pulse Drain–to–Source Avalanche Energy
(Starting T
J
= 25°C, I
D
= 2.0 A, L = 40 mH) (Figure 6)
E
AS
80 mJ
ELECTRICAL CHARACTERISTICS (T
J
= 25°C unless otherwise noted)
Characteristic
Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Sustaining Voltage (Internally Clamped)
(I
D
= 20 mA, V
GS
= 0)
(I
D
= 20 mA, V
GS
= 0, T
J
= 150°C)
V
(BR)DSS
59
59
62
62
65
65
Vdc
Zero Gate Voltage Drain Current
(V
DS
= 45 V, V
GS
= 0)
(V
DS
= 45 V, V
GS
= 0, T
J
= 150°C)
I
DSS
0.6
6.0
5.0
20
µAdc
Gate–Body Leakage Current
(V
G
= 5.0 V, V
DS
= 0)
(V
G
= 5.0 V, V
DS
= 0, T
J
= 150°C)
I
GSS
0.5
1.0
5.0
20
µAdc
ON CHARACTERISTICS (Note 1.)
Gate Threshold Voltage
(I
D
= 250 µA, V
DS
= V
GS
)
(I
D
= 250 µA, V
DS
= V
GS
, T
J
= 150°C)
V
GS(th)
1.0
0.6
1.5
2.0
1.6
Vdc
Static Drain–to–Source On–Resistance
(I
D
= 1.0 A, V
GS
= 4.0 V)
(I
D
= 1.0 A, V
GS
= 5.0 V)
(I
D
= 1.0 A, V
GS
= 4.0 V, T
J
= 150°C)
(I
D
= 1.0 A, V
GS
= 5.0 V, T
J
= 150°C)
R
DS(on)
0.63
0.59
1.1
1.0
0.75
0.75
1.9
1.8
Ohms
Forward Transconductance (I
D
= 1.0 A, V
DS
= 10 V) g
FS
1.0 1.4 mhos
Static Source–to–Drain Diode Voltage (I
S
= 1.0 A, V
GS
= 0) V
SD
1.1 1.5 Vdc
Static Drain Current Limit
(V
GS
= 5.0 V, V
DS
= 10 V)
(V
GS
= 5.0 V, V
DS
= 10 V, T
J
= 150°C)
I
D(lim)
2.0
1.1
2.3
1.3
2.75
1.8
A
RESISTIVE SWITCHING CHARACTERISTICS (Note 1.)
Turn–On Delay Time
t
d(on)
1.2 2.0
µs
Rise Time
(V
DD
= 25 V, I
D
= 1.0 A,
t
r
4.0 6.0
Turn–Off Delay Time
(V
DD
25
V
,
I
D
1
.
0
A
,
V
GS
= 5.0 V, R
G
= 50 Ohms)
t
d(off)
4.0 6.0
Fall Time t
f
3.0 5.0
1. Indicates Pulse Test: Pulse Width 300 µs, Duty Cycle 2.0%.
MLP1N06CL
http://onsemi.com
3
Figure 1. Output Characteristics
24 68
4
1
0
3
2
V
DS
, DRAIN-TO-SOURCE VOLTAGE (VOLTS)
10 V
8 V
4 V
V
GS
= 3 V
0
, DRAIN CURRENT (AMPS)I
D
6 V
Figure 2. Transfer Function
-50°C
02468
4
1
0
3
2
V
GS
, GATE-TO-SOURCE VOLTAGE (VOLTS)
, DRAIN CURRENT (AMPS)I
D
25°C
V
DS
7.5 V
T
J
= 150°C
T
J
= 25°C
THE SMARTDISCRETES CONCEPT
From a standard power MOSFET process, several active
and passive elements can be obtained that provide on–chip
protection to the basic power device. Such elements require
only a small increase in silicon area and/or the addition of one
masking layer to the process. The resulting device exhibits
significant improvements in ruggedness and reliability as
well as system cost reduction. The SMARTDISCRETES
device functions can now provide an economical alternative
to smart power ICs for power applications requiring low
on–resistance, high voltage and high current.
These devices are designed for applications that require a
rugged power switching device with short circuit protection
that can be directly interfaced to a microcontroller unit
(MCU). Ideal applications include automotive fuel injector
driver, incandescent lamp driver or other applications where
a high in–rush current or a shorted load condition could occur.
OPERATION IN THE CURRENT LIMIT MODE
The amount of time that an unprotected device can
withstand the current stress resulting from a shorted load
before its maximum junction temperature is exceeded is
dependent upon a number of factors that include the amount
of heatsinking that is provided, the size or rating of the
device, its initial junction temperature, and the supply
voltage. Without some form of current limiting, a shorted
load can raise a device’s junction temperature beyond the
maximum rated operating temperature in only a few
milliseconds.
Even with no heatsink, the MLP1N06CL can withstand a
shorted load powered by an automotive battery (10 to 14
Volts) for almost a second if its initial operating temperature
is under 100°C. For longer periods of operation in the
current–limited mode, device heatsinking can extend
operation from several seconds to indefinitely depending on
the amount of heatsinking provided.
SHORT CIRCUIT PROTECTION AND THE EFFECT OF
TEMPERATURE
The on–chip circuitry of the MLP1N06CL offers an
integrated means of protecting the MOSFET component
from high in–rush current or a shorted load. As shown in the
schematic diagram, the current limiting feature is provided
by an NPN transistor and integral resistors R1 and R2. R2
senses the current through the MOSFET and forward biases
the NPN transistors base as the current increases. As the
NPN turns on, it begins to pull gate drive current through R1,
dropping the gate drive voltage across it, and thus lowering
the voltage across the gate–to–source of the power
MOSFET and limiting the current. The current limit is
temperature dependent as shown in Figure 3, and decreases
from about 2.3 Amps at 25°C to about 1.3 Amps at 150°C.
Since the MLP1N06CL continues to conduct current and
dissipate power during a shorted load condition, it is
important to provide sufficient heatsinking to limit the
device junction temperature to a maximum of 150°C.
The metal current sense resistor R2 adds about 0.4 ohms
to the power MOSFET’s on–resistance, but the effect of
temperature on the combination is less than on a standard
MOSFET due to the lower temperature coefficient of R2.
The on–resistance variation with temperature for gate
voltages of 4 and 5 Volts is shown in Figure 5.
Back–to–back polysilicon diodes between gate and
source provide ESD protection to greater than 2 kV, HBM.
This on–chip protection feature eliminates the need for an
external Zener diode for systems with potentially heavy line
transients.

MLP1N06CL

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
MOSFET 62V 1A N-Channel
Lifecycle:
New from this manufacturer.
Delivery:
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