MT18VDDF12872HG-335F1

PDF: 09005aef80e4880c/Source: 09005aef80e487d7 Micron Technology, Inc., reserves the right to change products or specifications without notice.
DDF18C128x72H.fm - Rev. B 10/07 EN
7 ©2004 Micron Technology, Inc. All rights reserved.
1GB (x72, ECC, DR) 200-Pin DDR SDRAM SODIMM
Electrical Specifications
Electrical Specifications
Stresses greater than those listed in Table 6 may cause permanent damage to the
module. This is a stress rating only, and functional operation of the module at these or
any other conditions outside those indicated on the device data sheet is not implied.
Exposure to absolute maximum rating conditions for extended periods may adversely
affect reliability.
Notes: 1. For further information, refer to technical note TN-00-08: “Thermal Applications,” available
on Micron’s Web site.
Input Capacitance
Micron encourages designers to simulate the performance of the module to achieve
optimum values. Simulations are significantly more accurate and realistic than a gross
estimation of module capacitance when inductance and delay parameters associated
with trace lengths are used in simulations. JEDEC modules are currently designed using
simulations to close timing budgets.
Component AC Timing and Operating Conditions
Recommended AC operating conditions are given in the DDR component data sheets.
Component specifications are available on Microns Web site. Module speed grades
correlate with component speed grades, as shown in Table 7.
Table 6: Absolute Maximum Ratings
Symbol Parameter Min Max Units
V
DD
VDD supply voltage relative to VSS
–1.0 +3.6 V
V
IN, VOUT
Voltage on any pin relative to VSS
–0.5 +3.2 V
I
I
Input leakage current; Any input 0V VIN VDD;
V
REF input 0V VIN 1.35V (All other pins not under
test = 0V)
Address inputs
RAS#, CAS#, WE#, BA
–36 +36 µA
S#, CKE
–18 +18
CK, CK#
–12 +12
DM
–4 +4
I
OZ
Output leakage current; 0V VOUT VDDQ; DQ are
disabled
DQ, DQS
–10 +10 µA
T
A
DRAM ambient operating temperature
1
Commercial
0+70°C
Industrial
–40 +85 °C
Table 7: Module and Component Speed Grades
Module Speed Grade Component Speed Grade
-40B -5
-335 -6
-26A -75Z
-265 -75
PDF: 09005aef80e4880c/Source: 09005aef80e487d7 Micron Technology, Inc., reserves the right to change products or specifications without notice.
DDF18C128x72H.fm - Rev. B 10/07 EN
8 ©2004 Micron Technology, Inc. All rights reserved.
1GB (x72, ECC, DR) 200-Pin DDR SDRAM SODIMM
I
DD
Specifications
IDD Specifications
Notes: 1. Value calculated as one module rank in this operating condition; all other module ranks are
in I
DD2P (CKE LOW) mode.
2. Value calculated reflects all module ranks in this operating condition.
Table 8: IDD Specifications and Conditions – 1GB
Values are shown for the MT46V64M8 DDR SDRAM only and are computed from values specified in the
512Mb (64 Meg x 8) component data sheet
Parameter/Condition Symbol -40B -335
-26A/
-265 Units
Operating one bank active-precharge current:
One device
bank; Active-precharge;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); DQ,
DM, and DQS inputs changing once per clock cycle; Address
and control inputs changing once every two clock cycles
IDD0
1
1,440 1,215 1,080 mA
Operating one bank active-read-precharge current: One
device bank; Active-read precharge; BL = 4;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); IOUT = 0mA; Address and control inputs
changing once per clock cycle
IDD1
1
1,710 1,485 1,350 mA
Precharge power-down standby current: All device banks
idle; Power-down mode;
t
CK =
t
CK (MIN); CKE = (LOW)
IDD2P
2
90 90 90 mA
Idle standby current: CS# = HIGH; All device banks idle;
t
CK =
t
CK (MIN); CKE = HIGH; Address and other control
inputs
changing once per clock cycle; V
IN
= V
REF
for DQ, DQS,
and DM
IDD2F
2
990 810 720 mA
Active power-down standby current: One device bank
active; Power-down mode;
t
CK =
t
CK (MIN); CKE = LOW
IDD3P
2
810 630 540 mA
Active standby current: CS# = HIGH; CKE = HIGH; One
device bank; Active-precharge;
t
RC =
t
RAS (MAX);
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs changing twice per
clock cycle; Address and other control inputs changing once
per clock cycle
IDD3N
2
1,080 900 810 mA
Operating burst read current: BL = 2; Continuous burst
reads; One device bank active; Address and control inputs
changing once per clock cycle;
t
CK =
t
CK (MIN); IOUT = 0mA
IDD4R
1
1,755 1,530 1,350 mA
Operating burst write current: BL = 2; Continuous burst
writes; One device bank active; Address and control inputs
changing once per clock cycle;
t
CK =
t
CK (MIN); DQ, DM, and
DQS inputs changing twice per clock cycle
IDD4W
1
1,800 1,320 1,260 mA
Auto refresh current
t
REFC =
t
RFC (MIN)
IDD5
2
6,210 5,220 5,040 mA
t
REFC = 7.8125µs
IDD5A
2
198 180 180 mA
Self refresh current: CKE 0.2V
IDD6
2
90 90 90 mA
Operating bank interleave read current: Four device bank
interleaving reads; (BL = 4) with auto precharge;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); Address and control inputs
change only during active READ or WRITE commands
IDD7
1
4,095 3,690 3,195 mA
PDF: 09005aef80e4880c/Source: 09005aef80e487d7 Micron Technology, Inc., reserves the right to change products or specifications without notice.
DDF18C128x72H.fm - Rev. B 10/07 EN
9 ©2004 Micron Technology, Inc. All rights reserved.
1GB (x72, ECC, DR) 200-Pin DDR SDRAM SODIMM
Serial Presence-Detect
Serial Presence-Detect
Notes: 1. To avoid spurious start and stop conditions, a minimum delay is placed between SCL = 1 and
the falling or rising edge of SDA.
2. This parameter is sampled.
3. For a restart condition or following a WRITE cycle.
4. The SPD EEPROM WRITE cycle time (
t
WRC) is the time from a valid stop condition of a write
sequence to the end of the EEPROM internal ERASE/PROGRAM cycle. During the WRITE
cycle, the EEPROM bus interface circuit is disabled, SDA remains HIGH due to pull-up resis-
tance, and the EEPROM does not respond to its slave address.
Serial Presence-Detect Data
For the latest serial presence-detect data, refer to Microns SPD page:
www.micron.com/SPD.
Table 9: Serial Presence-Detect EEPROM DC Operating Conditions
Parameter/Condition Symbol Min Max Units
Supply voltage
V
DDSPD 2.3 3.6 V
Input high voltage: Logic 1; All inputs
V
IH VDDSPD × 0.7 VDDSPD + 0.5 V
Input low voltage: Logic 0; All inputs
V
IL –1.0 VDDSPD × 0.3 V
Output low voltage: I
OUT = 3mA
VOL –0.4V
Input leakage current: V
IN = GND to VDD
ILI –10µA
Output leakage current: V
OUT = GND to VDD
ILO –10µA
Standby current: SCL = SDA = V
DD - 0.3V; All other inputs = VSS or VDD
ISB –30µA
Power supply current: SCL clock frequency = 100 kHz
I
CC –2.0mA
Table 10: Serial Presence-Detect EEPROM AC Operating Conditions
Parameter/Condition Symbol Min Max Units Notes
SCL LOW to SDA data-out valid
t
AA 0.2 0.9 µs 1
Time the bus must be free before a new transition can start
t
BUF 1.3 µs
Data-out hold time
t
DH 200 ns
SDA and SCL fall time
t
F 300 ns 2
Data-in hold time
t
HD:DAT 0 µs
Start condition hold time
t
HD:STA 0.6 µs
Clock HIGH period
t
HIGH 0.6 µs
Noise suppression time constant at SCL, SDA inputs
t
I–50ns
Clock LOW period
t
LOW 1.3 µs
SDA and SCL rise time
t
R–0.3µs2
SCL clock frequency
f
SCL 400 kHz
Data-in setup time
t
SU:DAT 100 ns
Start condition setup time
t
SU:STA 0.6 µs 3
Stop condition setup time
t
SU:STO 0.6 µs
WRITE cycle time
t
WRC 10 ms 4

MT18VDDF12872HG-335F1

Mfr. #:
Manufacturer:
Micron
Description:
MODULE DDR SDRAM 1GB 200SODIMM
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New from this manufacturer.
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