TLP2366
7
12.
12.
12.
12. Test Circuits and Characteristics Curves
Test Circuits and Characteristics Curves
Test Circuits and Characteristics Curves
Test Circuits and Characteristics Curves
12.1.
12.1.
12.1.
12.1. Test Circuits
Test Circuits
Test Circuits
Test Circuits
Fig.
Fig.
Fig.
Fig. 12.1.1
12.1.1
12.1.1
12.1.1 V
V
V
V
OL
OL
OL
OL
Test Circuit
Test Circuit
Test Circuit
Test Circuit Fig.
Fig.
Fig.
Fig. 12.1.2
12.1.2
12.1.2
12.1.2 V
V
V
V
OH
OH
OH
OH
Test Circuit
Test Circuit
Test Circuit
Test Circuit
Fig.
Fig.
Fig.
Fig. 12.1.3
12.1.3
12.1.3
12.1.3 I
I
I
I
CCL
CCL
CCL
CCL
Test Circuit
Test Circuit
Test Circuit
Test Circuit Fig.
Fig.
Fig.
Fig. 12.1.4
12.1.4
12.1.4
12.1.4 I
I
I
I
CCH
CCH
CCH
CCH
Test Circuit
Test Circuit
Test Circuit
Test Circuit
Fig.
Fig.
Fig.
Fig. 12.1.5
12.1.5
12.1.5
12.1.5 Switching Time Test Circuit and Waveform
Switching Time Test Circuit and Waveform
Switching Time Test Circuit and Waveform
Switching Time Test Circuit and Waveform
Fig.
Fig.
Fig.
Fig. 12.1.6
12.1.6
12.1.6
12.1.6 Common-Mode Transient Immunity and Waveform
Common-Mode Transient Immunity and Waveform
Common-Mode Transient Immunity and Waveform
Common-Mode Transient Immunity and Waveform
2015-12-09
Rev.5.0
©2015 Toshiba Corporation