Figure 4
Repetitive Peak Current Strikes
StaticGuard 0805 0.1J Product
PULSE DEGRADATION
Traditionally varistors have suffered degradation of electrical perfor-
mance with repeated high current pulses resulting in decreased
breakdown voltage and increased leakage current. It has been
suggested that irregular intergranular boundaries and bulk material
result in restricted current paths and other non-Schottky barrier
paralleled conduction paths in the ceramic. Repeated pulsing of
both 5.6 and 14V TransGuard
®
transient voltage suppressors with
150 Amp peak 8 x 20µS waveforms shows negligible degradation
in breakdown voltage and minimal increases in leakage current.
The plots of typical breakdown voltage vs number of 150A pulses
are shown below.
TYPICAL PERFORMANCE CURVES (0603, 0805, 1206 & 1210 CHIP SIZES)
TransGuard
®
Capacitance vs Frequency 0603 TransGuard
®
Capacitance vs Frequency 0805 TransGuard
®
Capacitance vs Frequency 1206