74LVC00A-Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 27 February 2013 6 of 14
NXP Semiconductors
74LVC00A-Q100
Quad 2-input NAND gate
10. Dynamic characteristics
[1] Typical values are measured at T
amb
=25C and V
CC
= 1.2 V, 1.8 V, 2.5 V, 2.7 V, and 3.3 V respectively.
[2] t
pd
is the same as t
PLH
and t
PHL
.
[3] Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.
[4] C
PD
is used to determine the dynamic power dissipation (P
D
in W).
P
D
=C
PD
V
CC
2
f
i
N+(C
L
V
CC
2
f
o
) where:
f
i
= input frequency in MHz; f
o
= output frequency in MHz
C
L
= output load capacitance in pF
V
CC
= supply voltage in Volts
N = number of inputs switching
(C
L
V
CC
2
f
o
) = sum of the outputs
11. Waveforms
Table 7. Dynamic characteristics
Voltages are referenced to GND (ground = 0 V). For test circuit see Figure 7.
Symbol Parameter Conditions 40 C to +85 C 40 C to +125 C Unit
Min Typ
[1]
Max Min Max
t
pd
propagation delay nA, nB to nY; see Figure 6
[2]
V
CC
=1.2V - 12 - - - ns
V
CC
= 1.65 V to 1.95 V 0.3 3.8 8.4 0.3 9.7 ns
V
CC
= 2.3 V to 2.7 V 1.0 2.2 4.8 1.0 5.7 ns
V
CC
= 2.7 V 1.0 2.3 5.1 1.0 5.9 ns
V
CC
= 3.0 V to 3.6 V 0.5 2.0 4.3 0.5 5.1 ns
t
sk(o)
output skew time V
CC
= 3.0 V to 3.6 V
[3]
- - 1.0 - 1.5 ns
C
PD
power dissipation
capacitance
per gate; V
I
=GNDtoV
CC
[4]
V
CC
= 1.65 V to 1.95 V - 5.6 - - - pF
V
CC
= 2.3 V to 2.7 V - 8.9 - - - pF
V
CC
= 3.0 V to 3.6 V - 11.8 - - - pF
V
M
= 1.5 V at V
CC
2.7 V.
V
M
=0.5 V
CC
at V
CC
<2.7V.
V
OL
and V
OH
are typical output voltage levels that occur with the output load.
Fig 6. The input (nA, nB) to output (nY) propagation delays
mna213
nA, nB input
nY output
t
PHL
t
PLH
V
M
V
M
V
OL
V
OH
GND
V
I
74LVC00A-Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 27 February 2013 7 of 14
NXP Semiconductors
74LVC00A-Q100
Quad 2-input NAND gate
Test data is given in Table 8. Definitions for test circuit:
R
L
= Load resistance
C
L
= Load capacitance including jig and probe capacitance
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator
Fig 7. Test circuit for measuring switching times
V
M
V
M
t
W
t
W
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
t
f
t
r
t
r
t
f
001aaf615
V
CC
V
I
V
O
DUT
C
L
R
T
R
L
PULSE
GENERATOR
Table 8. Test data
Supply voltage Input Load
V
I
t
r
, t
f
C
L
R
L
1.2 V V
CC
2 ns 30 pF 1 k
1.65 V to 1.95 V V
CC
2 ns 30 pF 1 k
2.3 V to 2.7 V V
CC
2 ns 30 pF 500
2.7V 2.7V 2.5 ns 50 pF 500
3.0Vto3.6V 2.7V 2.5 ns 50 pF 500
74LVC00A-Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 27 February 2013 8 of 14
NXP Semiconductors
74LVC00A-Q100
Quad 2-input NAND gate
12. Package outline
Fig 8. Package outline SOT108-1 (SO14)
UNIT
A
max.
A
1
A
2
A
3
b
p
cD
(1)
E
(1)
(1)
eH
E
LL
p
QZywv θ
REFERENCES
OUTLINE
VERSION
EUROPEAN
PROJECTION
ISSUE DATE
IEC JEDEC JEITA
mm
inches
1.75
0.25
0.10
1.45
1.25
0.25
0.49
0.36
0.25
0.19
8.75
8.55
4.0
3.8
1.27
6.2
5.8
0.7
0.6
0.7
0.3
8
0
o
o
0.25 0.1
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
Note
1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included.
1.0
0.4
SOT108-1
X
w M
θ
A
A
1
A
2
b
p
D
H
E
L
p
Q
detail X
E
Z
e
c
L
v M
A
(A )
3
A
7
8
1
14
y
076E06 MS-012
pin 1 index
0.069
0.010
0.004
0.057
0.049
0.01
0.019
0.014
0.0100
0.0075
0.35
0.34
0.16
0.15
0.05
1.05
0.041
0.244
0.228
0.028
0.024
0.028
0.012
0.01
0.25
0.01 0.004
0.039
0.016
99-12-27
03-02-19
0 2.5 5 mm
scale
SO14: plastic small outline package; 14 leads; body width 3.9 mm
SOT108-1

74LVC00AD-Q100J

Mfr. #:
Manufacturer:
Nexperia
Description:
Logic Gates 74LVC00AD-Q100/SO14/REEL 13" Q
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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