MMA1213D

MMA1213D Motorola Sensor Device Data
4
PRINCIPLE OF OPERATION
The Motorola accelerometer is a surface-micromachined
integrated-circuit accelerometer.
The device consists of a surface micromachined capacitive
sensing cell (g-cell) and a CMOS signal conditioning ASIC
contained in a single integrated circuit package. The sensing
element is sealed hermetically at the wafer level using a bulk
micromachined “cap'' wafer.
The g-cell is a mechanical structure formed from
semiconductor materials (polysilicon) using semiconductor
processes (masking and etching). It can be modeled as two
stationary plates with a moveable plate in-between. The center
plate can be deflected from its rest position by subjecting the
system to an acceleration (Figure 2).
When the center plate deflects, the distance from it to one
fixed plate will increase by the same amount that the distance
to the other plate decreases. The change in distance is a
measure of acceleration.
The g-cell plates form two back-to-back capacitors
(Figure 3). As the center plate moves with acceleration, the
distance between the plates changes and each capacitor's
value will change, (C = Aε/D). Where A is the area of the plate,
ε is the dielectric constant, and D is the distance between the
plates.
The CMOS ASIC uses switched capacitor techniques to
measure the g-cell capacitors and extract the acceleration data
from the difference between the two capacitors. The ASIC also
signal conditions and filters (switched capacitor) the signal,
providing a high level output voltage that is ratiometric and
proportional to acceleration.
SPECIAL FEATURES
Filtering
The Motorola accelerometers contain an onboard 4-pole
switched capacitor filter. A Bessel implementation is used
because it provides a maximally flat delay response (linear
phase) thus preserving pulse shape integrity. Because the filter
is realized using switched capacitor techniques, there is no
requirement for external passive components (resistors and
capacitors) to set the cut-off frequency.
Self-Test
The sensor provides a self-test feature that allows the
verification of the mechanical and electrical integrity of the
accelerometer at any time before or after installation. This
feature is critical in applications such as automotive airbag
systems where system integrity must be ensured over the life of
the vehicle. A fourth “plate'' is used in the g-cell as a self-test
plate. When the user applies a logic high input to the self-test
pin, a calibrated potential is applied across the self-test plate
and the moveable plate. The resulting electrostatic force
(Fe =
1
/
2
AV
2
/d
2
) causes the center plate to deflect. The
resultant deflection is measured by the accelerometer's control
ASIC and a proportional output voltage results. This procedure
assures that both the mechanical (g-cell) and electronic
sections of the accelerometer are functioning.
Ratiometricity
Ratiometricity simply means that the output offset voltage
and sensitivity will scale linearly with applied supply voltage.
That is, as you increase supply voltage the sensitivity and offset
increase linearly; as supply voltage decreases, offset and
sensitivity decrease linearly. This is a key feature when
interfacing to a microcontroller or an A/D converter because it
provides system level cancellation of supply induced errors in
the analog to digital conversion process.
Status
Motorola accelerometers include fault detection circuitry and
a fault latch. The Status pin is an output from the fault latch,
OR'd with self-test, and is set high whenever one (or more) of
the following events occur:
Supply voltage falls below the Low Voltage Detect (LVD)
voltage threshold
Clock oscillator falls below the clock monitor
minimum frequency
Parity of the EPROM bits becomes odd in
number.
The fault latch can be reset by a rising edge on the self-test
input pin, unless one (or more) of the fault conditions continues
to exist.
Acceleration
Figure 2. Transducer
Physical Model
Figure 3. Equivalent
Circuit Model
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cale Semiconductor,
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Motorola Sensor Device Data MMA1213D
5
BASIC CONNECTIONS
Pinout Description
Figure 4. Accelerometer with Recommended
Connection Diagram
Figure 5. Recommended PCB Layout for Interfacing
Accelerometer to Microcontroller
NOTES:
Use a 0.1 µF capacitor on VDD to decouple the power
source.
Physical coupling distance of the accelerometer to the
microcontroller should be minimal.
Place a ground plane beneath the accelerometer to reduce
noise, the ground plane should be attached to all of the open
ended terminals shown in Figure 5.
Use an RC filter of 1 k and 0.01 µF on the output of the
accelerometer to minimize clock noise (from the switched
capacitor filter circuit).
PCB layout of power and ground should not couple power
supply noise.
Accelerometer and microcontroller should not be a high
current path.
A/D sampling rate and any external power supply switching
frequency should be selected such that they do not interfere
with the internal accelerometer sampling frequency. This
will prevent aliasing errors.
Pin No. Pin Name Description
1 thru 3 Leave unconnected.
4ST
Logic input pin used to initiate
self-test.
5V
OUT
Output voltage of the
accelerometer.
6STATUS
Logic output pin to indicate
fault.
7V
SS
The power supply ground.
8V
DD
The power supply input.
9 thru 13 Trim pins
Used for factory trim. Leave
unconnected.
14 thru 16
No internal connection. Leave
unconnected.
N/C
N/C
N/C
ST
V
OUT
STATUS
V
SS
V
DD
N/C
N/C
N/C
N/C
N/C
N/C
N/C
N/C
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
MMA1213D
ST
V
OUT
Output
Signal
R1
1 k
5
C2
0.01 µF
4
7
Logic
Input
V
DD
C1
0.1 µF
6
Status
8
V
DD
V
SS
P0
A/D In
V
RH
V
SS
V
DD
ST
V
OUT
V
SS
V
DD
0.01 µF1 k
0.1 µF
0.1 µF
Power Supply
0.1 µF
P1Status
Micorocontroller
Acce lerometer
C
RR
C
C
C
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cale Semiconductor,
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MMA1213D Motorola Sensor Device Data
6
Acceleration of the package in the
+Z direction (center plate moves
in the Z direction) will result in an
increase in the output.
* When positioned as shown, the Earth's gravity will result in a positive 1g output.
Dynamic Acceleration Sensing Direction
Direction of Earth's gravity field.*
+Z
Z
Side View
Side View
Static Acceleration Sensing Direction
Activation of Self test moves
the center plate in the Z
direction, resulting in an
increase in the output.
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cale Semiconductor,
I
Freescale Semiconductor, Inc.
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MMA1213D

Mfr. #:
Manufacturer:
NXP / Freescale
Description:
Accelerometers 4.75-5.25 VOLT
Lifecycle:
New from this manufacturer.
Delivery:
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