APM2T42P100016GAN-7TW

M.2 2242 Flash Drive
APM2T42P100xxxxAN-XTX
6
© 2015 Apacer Technology Inc. Rev. 1.2
3. Product Specifications
3.1 Capacity
Capacity specification of P100 is available as shown in Table 3-1. It lists the specific capacity and the
default numbers of heads, sectors and cylinders for each product line.
Table 3-1: Capacity specifications
Capacity
Total bytes*
Cylinders
Heads
Sectors
Max LBA
4 GB
4,011,614,208
15,525
16
63
7,835,184
8 GB
8,012,390,400
15,525
16
63
15,649,200
16 GB
16,013,942,784
16,383
16
63
31,277,232
32 GB
32,017,047,552
16,383
16
63
62,533,296
64 GB
64,023,257,088
16,383
16
63
125,045,424
*Display of total bytes varies from file systems, which means not all of the bytes can be used for storage.
**Notes: 1 GB = 1,000,000,000 bytes; 1 sector = 512 bytes.
LBA count addressed in the table above indicates total user storage capacity and will remain the same throughout the lifespan of the
device. However, the total usable capacity of the SSD is most likely to be less than the total physical capacity because a small portion
of the capacity is reserved for device maintenance usages.
3.2 Performance
Performances of P100 are listed below in table 3-2.
Table 3-2: Performance
Capacity
Performance
4 GB
8 GB
16 GB
32 GB
64 GB
Sustained read (MB/s)
30
285
500
500
500
Sustained write (MB/s)
25
85
145
150
150
Note: Results may differ from various flash configurations or host system setting
M.2 2242 Flash Drive
APM2T42P100xxxxAN-XTX
7
© 2015 Apacer Technology Inc. Rev. 1.2
3.3 Environmental Specifications
Environmental specification of P100 series follows MIL-STD-810, as shown in Table 3-3.
Table 3-3 P100 environmental specifications
Item
Specification
Temperature
C to 70°C (Operating) / -40°C to +85°C (Extended)
-40°C to 85°C (in storage)
Humidity
RH 90% under 40°C
Shock
1500G, 0.5ms
Vibration
20Hz~80Hz/1.52mm (frequency/displacement)
80Hz~2000Hz/20G (frequency/displacement)
X, Y, Z axis/60mins each
Drop
80cm free fall, 6 face of each
Bending
20N, hold 1min/5times
Torque
0.5N-m or 5deg, hold 5min/5times
ESD
Pass
3.4 Mean Time Between Failures (MTBF)
Mean Time Between Failures (MTBF) is predicted based on reliability data for the individual components
in P100. The prediction result for P100 is more than 2,000,000 hours.
Notes about the MTBF:
The MTBF is predicated and calculated based on Telcordia Technologies Special Report, SR-332, Issue
2 method.
3.5 Certification and Compliance
P100 complies with the following standards:
CE
FCC
RoHS Recast
MIL-STD-810
BSMI
M.2 2242 Flash Drive
APM2T42P100xxxxAN-XTX
8
© 2015 Apacer Technology Inc. Rev. 1.2
4. Flash Management
4.1 Error Correction/Detection
P100 implements a hardware ECC scheme, based on the BCH algorithm. It can detect and correct up to
72 bits error in 1K bytes.
4.2 Bad Block Management
Bad blocks are blocks that include one or more invalid bits, and their reliability is not guaranteed. Blocks
that are identified and marked as bad by the manufacturer are referred to as “Initial Bad Blocks”. Bad
blocks that are developed during the lifespan of the flash are named “Later Bad Blocks”. Apacer
implements an efficient bad block management algorithm to detect the factory-produced bad blocks and
manages any bad blocks that appear with use. This practice further prevents data being stored into bad
blocks and improves the data reliability.
4.3 Wear Leveling
NAND flash devices can only undergo a limited number of program/erase cycles, and in most cases, the
flash media are not used evenly. If some areas get updated more frequently than others, the lifetime of
the device would be reduced significantly. Thus, Wear Leveling is applied to extend the lifespan of NAND
flash by evenly distributing write and erase cycles across the media.
Apacer provides advanced Wear Leveling algorithm, which can efficiently spread out the flash usage
through the whole flash media area. Moreover, by implementing both dynamic and static Wear Leveling
algorithms, the life expectancy of the NAND flash is greatly improved.
4.4 Power Failure Management
Power Failure Management plays a crucial role when experiencing unstable power supply. Power
disruption may occur when users are storing data into the SSD. In this urgent situation, the controller
would run multiple write-to-flash cycles to store the metadata for later block rebuilding. This urgent
operation requires about several milliseconds to get it done. At the next power up, the firmware will
perform a status tracking to retrieve the mapping table and resume previously programmed NAND blocks
to check if there is any incompleteness of transmission.
4.5 ATA Secure Erase
ATA Secure Erase is a standard ATA command and will write all 0xFF” to fully wipe all the data on hard
drives and SSDs. When this command is issued, the SSD controller will empty its storage blocks and
return to its factory default settings.
4.6 TRIM
TRIM is a feature which helps improve the read/write performance and speed of solid-state drives (SSD).
Unlike hard disk drives (HDD), SSDs are not able to overwrite existing data, so the available space
gradually becomes smaller with each use. With the TRIM command, the operating system can inform the

APM2T42P100016GAN-7TW

Mfr. #:
Manufacturer:
Apacer
Description:
Solid State Drives - SSD M.2 (NGFF) 2242 P100 SLC E-TEMP 16GB
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union